title: Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures.
abstract: Multiple least squares fitting has been employed for long time in elemental electron energy-loss spectroscopy (EELS) analysis, in particular in biology, but with the hypothesis of a rather stable shape for the used core-loss signals. In the present case, we explore its use for identifying the variations in the edges' fine structures in complex boron nitride samples and in particular for mapping the bonding types of boron in such samples. Details about this improved procedure applied to data acquired in the spectrum-imaging mode are reported here.
authors.affiliation: Laboratoire d"etude des Microstructures, UMR CNRS 104, ONERA, 92322 Chatillon, France. raul.arenal@onera.fr
authors.forename: R
authors.initials: R
authors.lastname: Arenal
authors.forename: F
authors.initials: F
authors.lastname: de la Peña
authors.forename: O
authors.initials: O
authors.lastname: Stéphan
authors.forename: M
authors.initials: M
authors.lastname: Walls
authors.forename: M
authors.initials: M
authors.lastname: Tencé
authors.forename: A
authors.initials: A
authors.lastname: Loiseau
authors.forename: C
authors.initials: C
authors.lastname: Colliex