X-ray reflectivity measurements of layer-by-layer films at the solid/liquid interface.
In this Letter, we present a method for the decoration of layer-by-layer (LbL) structures by heavy metal ions, which allows X-ray reflectivity (XRR) measurements at the solid/water interface. The improved contrast has allowed us to obtain well-structured X-ray reflectivity curves from samples at the liquid/solid interface that can be used for the film structure modeling. The developed technique was also used to follow the formation of complexes between DNA and the LbL multilayer. The XRR data are confirmed by independent null-ellipsometric measurements at the solid/liquid interface on the very same architectures.
Erokhina
Svetlana
S
Department of Physics and Centro SOFT CNR-INFM, University of Parma, Viale Usberti 7 A, 43100 Parma, Italy. svetlana.erokhina@fis.unipr.it
Berzina
Tatiana
T
Cristofolini
Luigi
L
Erokhin
Victor
V
Folli
Claudia
C
Konovalov
Oleg
O
Marino
Iari-Gabriel
IG
Fontana
M P
MP
D004247:DNA / Q000737:chemistry; D019216:Metals, Heavy / Q000737:chemistry*; D014965:X-Rays
D019216:Metals, Heavy; D004247:DNA