title: Characterization of a distributed plasma ionization source (DPIS) for ion mobility spectrometry and mass spectrometry.
abstract: A recently developed atmospheric pressure ionization source, a distributed plasma ionization source (DPIS), was characterized and compared to commonly used atmospheric pressure ionization sources with both mass spectrometry (MS) and ion mobility spectrometry (IMS). The source consisted of two electrodes of different sizes separated by a thin dielectric. Application of a high RF voltage across the electrodes generated plasma in air yielding both positive and negative ions. These reactant ions subsequently ionized the analyte vapors. The reactant ions generated were similar to those created in a conventional point-to-plane corona discharge ion source. The positive reactant ions generated by the source were mass identified as being solvated protons of general formula (H(2)O)(n)H(+) with (H(2)O)(2)H(+) as the most abundant reactant ion. The negative reactant ions produced were mass identified primarily as CO(3)(-), NO(3)(-), NO(2)(-), O(3)(-) and O(2)(-) of various relative intensities. The predominant ion and relative ion ratios varied depending upon source construction and supporting gas flow rates. A few compounds including drugs, explosives and amines were selected to evaluate the new ionization source. The source was operated continuously for 3 months and although surface deterioration was observed visually, the source continued to produce ions at a rate similar that of the initial conditions.
authors.affiliation: Pacific Northwest National Laboratory, Richland, WA 99354, USA.
authors.forename: Melanie J
authors.initials: MJ
authors.lastname: Waltman
authors.forename: Prabha
authors.initials: P
authors.lastname: Dwivedi
authors.forename: Herbert H
authors.initials: HH
authors.lastname: Hill
authors.forename: William C
authors.initials: WC
authors.lastname: Blanchard
authors.forename: Robert G
authors.initials: RG
authors.lastname: Ewing
mesh_terms: D004583:Electrons; D007477:Ions / Q000737:chemistry; D008956:Models, Chemical; D013057:Spectrum Analysis / Q000295:instrumentation* / Q000379:methods*
chemical_list: D007477:Ions