title: X-ray reflectivity measurements of layer-by-layer films at the solid/liquid interface.
abstract: In this Letter, we present a method for the decoration of layer-by-layer (LbL) structures by heavy metal ions, which allows X-ray reflectivity (XRR) measurements at the solid/water interface. The improved contrast has allowed us to obtain well-structured X-ray reflectivity curves from samples at the liquid/solid interface that can be used for the film structure modeling. The developed technique was also used to follow the formation of complexes between DNA and the LbL multilayer. The XRR data are confirmed by independent null-ellipsometric measurements at the solid/liquid interface on the very same architectures.
authors.affiliation: Department of Physics and Centro SOFT CNR-INFM, University of Parma, Viale Usberti 7 A, 43100 Parma, Italy. svetlana.erokhina@fis.unipr.it
authors.forename: Svetlana
authors.initials: S
authors.lastname: Erokhina
authors.forename: Tatiana
authors.initials: T
authors.lastname: Berzina
authors.forename: Luigi
authors.initials: L
authors.lastname: Cristofolini
authors.forename: Victor
authors.initials: V
authors.lastname: Erokhin
authors.forename: Claudia
authors.initials: C
authors.lastname: Folli
authors.forename: Oleg
authors.initials: O
authors.lastname: Konovalov
authors.forename: Iari-Gabriel
authors.initials: IG
authors.lastname: Marino
authors.forename: M P
authors.initials: MP
authors.lastname: Fontana
mesh_terms: D004247:DNA / Q000737:chemistry; D019216:Metals, Heavy / Q000737:chemistry*; D014965:X-Rays
chemical_list: D019216:Metals, Heavy; D004247:DNA