Probing surface charge potentials of clay basal planes and edges by direct force measurements.
D000538:Aluminum Silicates; D000077215:Clay; D003102:Colloids / Q000737:chemistry*; D006863:Hydrogen-Ion Concentration; D017665:Hydroxyl Radical / Q000737:chemistry; D018625:Microscopy, Atomic Force; D008855:Microscopy, Electron, Scanning / Q000379:methods; D015233:Models, Statistical; D008968:Molecular Conformation; D016012:Poisson Distribution; D012822:Silicon Dioxide / Q000737:chemistry; D013314:Stress, Mechanical; D013499:Surface Properties; D014961:X-Ray Diffraction
D000538:Aluminum Silicates; D003102:Colloids; D017665:Hydroxyl Radical; D012822:Silicon Dioxide; D000077215:Clay; C011934:mica