title: Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates.
abstract: The feasibility of static secondary ion mass spectrometry (S-SIMS) for the detection of molecule specific information from complex materials, such as natural clay and soil samples, has been investigated. Ion trap (IT), as well as triple quadrupole (TQ) instruments, have been used for mass analysis. Secondary ion images have been acquired using time-of-flight (TOF) S-SIMS. The generation of molecular adduct ions from thin and thick layers on the mineral substrates has been investigated using KBr as a simple model system. Results show that molecular adducts of KBr can be indeed detected from the spiked materials. However, the concentrations of the spiking solutions have to be significantly larger than expected from the surface area measured by gas adsorption techniques. In addition imaging analysis has evidenced that the detection of adduct ions in the mass spectra directly relates to the presence of local micro-crystallites.
authors.affiliation: Department of Chemistry, University of Antwerp, Universiteitsplein 1, Antwerp, Belgium.
authors.forename: Rita
authors.initials: R
authors.lastname: Van Ham
authors.forename: Luc
authors.initials: L
authors.lastname: Van Vaeck
authors.forename: Annemie
authors.initials: A
authors.lastname: Adriaens
authors.forename: Freddy
authors.initials: F
authors.lastname: Adams
authors.forename: Brittany
authors.initials: B
authors.lastname: Hodges
authors.forename: Anita
authors.initials: A
authors.lastname: Gianotto
authors.forename: Recep
authors.initials: R
authors.lastname: Avci
authors.forename: Anthony
authors.initials: A
authors.lastname: Appelhans
authors.forename: Gary
authors.initials: G
authors.lastname: Groenewold