Dynamic coating ion-interaction chromatographic separation of some trace impurities in oxygen-free electronic copper (OFEC) by pre-column chelation with 4-(2-thiazolylazo)resorcinol.
Deleterious trace impurities like Mn, Fe, Co, Ni, Zn, Bi and Pb in oxygen-free electronic copper (OFEC) were separated and determined by dynamic coating ion-interaction chromatography (IIC) with spectrophotometric detection using pre-column reaction methods. 4-(2-Thiazolylazo)resorcinol (TAR) was used as pre-column chelating agent. The requirements for sample preparation and the conditions for pre-column chelation reaction are discussed. The optimum conditions for the sensitive detection of these trace metal ions after ion-chromatographic separation are set. The ph of the chelating medium and the eluent, the concentration of TAR and the composition of the eluent were investigated. The detection limits achieved were 2.0, 2.8, 0.6, 0.8, 1.2, 2.6 and 3.0 ng for Mn, Fe, Co, Ni, Zn, Bi and Pb, respectively. The results obtained by IIC methods compare well with those of graphite furnace atomic-absorption spectrometry and the certified values of Mur Bundy Hamil (MBH Analytical Ltd, U.K.).
Saraswati
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Instrumental Analysis Division, Defence Metallurgical Research Laboratory, Kanchanbagh P.O., Hyderabad, 500 258, India.
Rao
T H
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