Spark-source mass-spectrometric sensitivity factors for elements in a graphite matrix.
Relative sensitivity factors for determination of 41 elements by spark-source mass-spectrometry have been measured. The samples were pressed into graphite electrodes and ionized with a radiofrequency spark. The mass spectra were recorded on a photoplate and the resulting data processed by a computer. Indium was used as standard and the relative sensitivity factors for both singly- and doubly-charged ions were determined with reference to the singly-charged indium ion, with an overall error of 30%. The mean analysis precision was 16%.
Vanderborght
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Department of Chemistry, University of Antwerp (U.I.A.), B-2610 Wilrijk, Belgium.
Van Grieken
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