Determination of several trace elements in silicate rocks by an XRF method with background and matrix corrections.
An X-ray fluorescence method for determining trace elements in silicate rock samples was studied. The procedure focused on the application of the pertinent matrix corrections. Either the Compton peak or the reciprocal of the mass absorption coefficient of the sample was used as internal standard for this purpose. X-ray tubes with W or Cr anodes were employed, and the W Lbeta and Cr Kalpha Compton intensities scattered by the sample were measured. The mass absorption coefficients at both sides of the absorption edge for Fe (1.658 and 1.936 A) were calculated. The elements Zr, Y, Rb, Zn, Ni, Cr and V were determined in 15 international reference rocks covering wide ranges of concentration. Relative mean errors were in many cases less than 10%.
Pascual
J
J
Instituto de Edafología y Biología Vegetal, C.S.I.C. c/Serrano, 115 Dpdo, 28006 Madrid, Spain.