title: Ellipsometric studies related to surface-enhanced infrared absorption.
abstract: Infrared ellipsometry has been applied to determine the refractive index n and the absorption index k as well as the thickness of metal island films causing surface enhanced infrared absorption (SEIRA). The results from numerous films prepared in several campaigns are presented. For films of a nominal thickness of 6 nm, k is found to range from 0 to 3, while n ranges from 5 to 8. Among these two optical constants a close correlation is observed. Layers suitable for SEIRA exhibit an unusual spectral feature whose origin is explained.
authors.affiliation: Institut für Spektrochemie und angewandte Spektroskopie (ISAS), Institutsteil Berlin, Albert-Einstein-Strasse 9, 12489 Berlin-Adlershof, Germany.
authors.forename: E H
authors.initials: EH
authors.lastname: Korte
authors.forename: A
authors.initials: A
authors.lastname: Röseler
authors.forename: M
authors.initials: M
authors.lastname: Buskühl