Trace element analysis by particle and photon-induced X-ray emission spectroscopy.
The analytical use of particle- and photon-induced X-ray emission spectroscopy has become an important tool in trace element analysis, especially when only small amounts of sample material are available. The physical basis, experimental procedure and typical examples are reviewed.
Gonsior
B
B
Institut für Experimentalphysik, Ruhr-Universität Bochum, Postfach 102148, D-4630 Bochum, F.R.G.
Roth
M
M