title: Assessment of Pb, Cd, Cr and Ag leaching from electronics waste using four extraction methods.
abstract: Heavy metals present in electronic components may leach upon disposal and therefore pose significant environmental hazards. The potential leaching of Pb, Cd, Cr and Ag from PC cathode ray tubes, printed circuit boards (PCBs), PC mice, TV remote controls, and mobile phones was assessed. After controlled crushing, each component was extracted using the Toxicity Characteristic Leaching Procedure (TCLP), EPA Method 1312 (SPLP), NEN 7371 (Dutch Environmental Agency), and DIN S4 (Germany). The TCLP consistently leached the greatest amounts of Pb from all components. The SPLP, NEN 7371 and DIN S4 extracted relatively small amounts of metals compared with the TCLP and were not considered effective as leaching tests for e-waste. The smallest size fraction (< 2 mm) of CRT glass and PCBs leached significantly (p < 0.05) highest Pb via the TCLP. A modified TCLP removed 50.9% more extractable Pb compared with the conventional procedure.
authors.affiliation: Natural Resources and Environmental Management, Ball State University, Muncie, Indiana 47306, USA.
authors.forename: Ashley
authors.initials: A
authors.lastname: Keith
authors.forename: Kara
authors.initials: K
authors.lastname: Keesling
authors.forename: Kendra K
authors.initials: KK
authors.lastname: Fitzwater
authors.forename: John
authors.initials: J
authors.lastname: Pichtel
authors.forename: Denise
authors.initials: D
authors.lastname: Houy
mesh_terms: D002104:Cadmium / Q000032:analysis*; D002857:Chromium / Q000032:analysis*; D004581:Electronics; D006046:Gold / Q000032:analysis*; D007854:Lead / Q000032:analysis*; D010316:Particle Size; D013054:Spectrophotometry, Atomic
chemical_list: D002104:Cadmium; D002857:Chromium; D007854:Lead; D006046:Gold