Spectrographic analysis of high-purity nickel oxide for twenty-one trace impurities, with use of a new buffer.
A spectrographic method for the determination of twenty-one trace impurities in high-purity nickel oxide by the d.c. arc technique has been developed. A mixture of graphite and indium oxide in the ratio 2:1 is used as buffer. The lowest determination limits for various elements lie between 1 and 10 ppm with an average relative standard deviation of +/- 12%.
Karanjikar
N P
NP
Spectroscopy Division Bhabha Atomic Research Centre Trombay, Bombay 400 085, India.
Saksena
M D
MD