Determination of the rare-earth elements in geological materials by thin-film X-ray fluorescence and inductively-coupled plasma atomic-emission spectrometry.
Thin-film XRF and ICP-AES analytical procedures for the determination of the rare-earth elements (REE) in rocks, involving preconcentration by ion-exchange and co-precipitation with Fe(OH)(3) for thin-film preparation, and matrix modification, are described. The REE in five international reference rocks have been determined, with correction for spectral line overlap whenever necessary. The results obtained by using X-ray fluorescence spectrometry compare well with those of inductively-coupled plasma atomic-emission spectrometry, and with other values reported in the literature.
Qing-Lie
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Department of Geology, School of Earth Sciences, University of Melbourne, Parkville, Victoria 3052, Australia.
Hughes
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TC
Haukka
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Hannaker
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