title: Image matching between experimental and simulated high-resolution electron micrographs of sapphire on the [0110] orientation.
abstract: The effects of imaging parameters have been studied on their roles of the severe mismatches between experimental and simulated high-resolution transmission electron micrographs of sapphire along the direction. Image simulation and convergent-beam electron diffraction techniques have been performed on misalignments of the electron beam and the crystal specimen. Based on this study, we have introduced an approach to achieve reliable simulation for experimental images of sapphire on the projection by the use of iterative digital image matching.
authors.affiliation: Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, 110016 Shenyang, China. kuidu@imr.ac.cn
authors.forename: K
authors.initials: K
authors.lastname: Du
authors.forename: M
authors.initials: M
authors.lastname: Rühle