title: Sub-100-nanometre resolution in total internal reflection fluorescence microscopy.
abstract: Combining total internal reflection fluorescence microscopy with structured illumination allows optical wide-field imaging with sub-100-nanometre resolution. We present a novel objective-launch set-up for standing wave illumination that takes advantage of a tunable transmission diffraction grating and transparent phase shifters actuated by electro-active polymers to control the excitation pattern in three dimensions. Image acquisition is completed in less than 1 s. To reconstruct the extended image spectrum, we apply a new apodization function that results in a lateral resolution of 89 nm for green emission wavelength.
authors.affiliation: Nanotechnology Group, Department of Mechanical and Process Engineering, ETH Zurich, Tannenstrasse 3, 8092 Zurich, Switzerland.
authors.forename: M
authors.initials: M
authors.lastname: Beck
authors.forename: M
authors.initials: M
authors.lastname: Aschwanden
authors.forename: A
authors.initials: A
authors.lastname: Stemmer