title: Tilted fiber Bragg grating sensor interrogation system using a high-resolution silicon-on-insulator arrayed waveguide grating.
abstract: We report a compact high-resolution arrayed waveguide grating (AWG) interrogator system designed to measure the relative wavelength spacing between two individual resonances of a tilted fiber Bragg grating (TFBG) refractometer. The TFBG refractometer benefits from an internal wavelength and power reference provided by the core mode reflection resonance that can be used to determine cladding mode perturbations with high accuracy. The AWG interrogator is a planar waveguide device fabricated on a silicon-on-insulator platform, having 50 channels with a 0.18 nm wavelength separation and a footprint of 8 mmx8 mm. By overlaying two adjacent interference orders of the AWG we demonstrate simultaneous monitoring of two widely separated resonances in real time with high wavelength resolution. The standard deviation of the measured wavelength shifts is 1.2 pm, and it is limited by the resolution of the optical spectrum analyzer used for the interrogator calibration measurements.
authors.affiliation: Institute for Microstructural Sciences, National Research Council Canada, Ottawa, Ontario, Canada. pavel.cheben@nrc.ca
authors.forename: Pavel
authors.initials: P
authors.lastname: Cheben
authors.forename: Edith
authors.initials: E
authors.lastname: Post
authors.forename: Siegfried
authors.initials: S
authors.lastname: Janz
authors.forename: Jacques
authors.initials: J
authors.lastname: Albert
authors.forename: Albane
authors.initials: A
authors.lastname: Laronche
authors.forename: Jens H
authors.initials: JH
authors.lastname: Schmid
authors.forename: Dan-Xia
authors.initials: DX
authors.lastname: Xu
authors.forename: Boris
authors.initials: B
authors.lastname: Lamontagne
authors.forename: Jean
authors.initials: J
authors.lastname: Lapointe
authors.forename: André
authors.initials: A
authors.lastname: Delâge
authors.forename: Adam
authors.initials: A
authors.lastname: Densmore
mesh_terms: D004553:Electric Conductivity; D004867:Equipment Design; D019544:Equipment Failure Analysis; D055100:Optical Fibers; D012031:Refractometry / Q000295:instrumentation*; D012680:Sensitivity and Specificity; D012825:Silicon / Q000737:chemistry*; D014159:Transducers
chemical_list: D012825:Silicon