title: Application of channel electron multipliers in an electron detector for low-voltage scanning electron microscopy.
abstract: An electron detector containing channel electron multipliers was built and tested in the range of low-voltage scanning electron microscopy as a detector of topographic contrast. The detector can detect backscattered electrons or the sum of backscattered electrons and secondary electrons, with different amount of secondary electrons. As a backscattered electron detector it collects backscattered electrons emitted in a specific range of take-off angles and in a large range of azimuth angles enabling to obtain large solid collection angle and high collection efficiency. Two arrangements with different channel electron multipliers were studied theoretically with the use of the Monte Carlo method and one of them was built and tested experimentally. To shorten breaks in operation, a vacuum box preventing channel electron multipliers from an exposure to air during specimen exchanges was built and placed in the microscope chamber. The box is opened during microscope observations and is moved to the side of the scanning electron microscope chamber and closed during air admission and evacuation cycles enabling storing channel electron multipliers under vacuum for the whole time. Experimental tests of the detector included assessment of the type of detected electrons (secondary or backscattered), checking the tilt contrast, imaging the spatial collection efficiency, measuring the noise coefficient and recording images of different specimens.
authors.affiliation: Institute of Material Science and Applied Mechanics, Wrocław University of Technology, Smoluchowskiego 25, 50-370 Wrocław, Poland. jan.hejna@pwr.wroc.pl
authors.forename: J
authors.initials: J
authors.lastname: Hejna