Nondestructive characterization of nanoscale layered samples.
Multilayered samples consisting of Al, Co and Ni nanolayers were produced by MBE and characterized nondestructively by means of SRXRF, mu-XRF, WDXRF, RBS, XRR, and destructively with SIMS. The main aims were to identify the elements, to determine their purity and their sequence, and also to examine the roughness, density, homogeneity and thickness of each layer. Most of these important properties could be determined by XRF methods, e.g., on commercial devices. For the thickness, it was found that all of the results obtained via XRR, RBS, SIMS and various XRF methods (SRXRF, mu-XRF, WDXRF) agreed with each other within the limits of uncertainty, and a constant deviation from the presets used in the MBE production method was observed. Some serious preliminary discrepancies in the results from the XRF methods were examined, but all deviations could be explained by introducing various corrections into the evaluation methods and/or redetermining some fundamental parameters.
Baake
Olaf
O
Materials Science Institute, Technische Universität Darmstadt, Petersenstr. 23, 64287, Darmstadt, Germany.
Hoffmann
Peter S
PS
Flege
Stefan
S
Ortner
Hugo M
HM
Gottschalk
Sebastian
S
Berky
Wolfram
W
Balogh
Adam G
AG
Ensinger
Wolfgang
W
Beckhoff
Burkhard
B
Kolbe
Michael
M
Gerlach
Martin
M
Pollakowski
Beatrix
B
Weser
Jan
J
Ulm
Gerhard
G
Haschke
Michael
M
Blokhina
Elena
E
Peter
Markus
M
Porta
Dominique
D
Heck
Martin
M
D000535:Aluminum / Q000032:analysis*; D003035:Cobalt / Q000032:analysis*; D003300:Copper / Q000032:analysis*; D049329:Nanostructures / Q000032:analysis; D036103:Nanotechnology; D009532:Nickel / Q000032:analysis*; D010316:Particle Size; D012680:Sensitivity and Specificity; D013052:Spectrometry, X-Ray Emission; D013499:Surface Properties
D003035:Cobalt; D003300:Copper; D009532:Nickel; D000535:Aluminum