Scanning picosecond tunable laser system for simulating MeV heavy ion-induced charge collection events as a function of temperature.
A new methodology for using scanning picosecond laser microscopy to simulate cosmic ray induced radiation effects as a function of temperature is described in detail. The built system is centered on diffraction-limited focusing of the output from a broadband (690-960 nm) ultrafast Ti:sapphire Tsunami laser pumped by a 532 nm Millennia laser. An acousto-optic modulator is used to provide pulse picking down to event rates necessary for the technologies and effects under study. The temperature dependence of the charge generation process for ions and photons is briefly reviewed and the need for wavelength tunability is discussed. An appropriate wavelength selection is critical for proper emulation of ion events over a wide temperature range. The system developed is detailed and illustrated by way of example on a deep-submicron complementary metal-oxide semiconductor test structure.
Laird
Jamie Stuart
JS
Jet Propulsion Laboratory (JPL), California Institute of Technology, NASA, 4800 Oak Grove Drive, Pasadena, California 91109, USA.
Chen
Yuan
Y
Scheick
Leif
L
Vo
Tuan
T
Johnston
Allan
A