Optical lever calibration in atomic force microscope with a mechanical lever.
A novel method that uses a small mechanical lever has been developed to directly calibrate the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The mechanical lever can convert the translation into a nanoscale rotation angle with a flexible hinge that provides an accurate conversion between the photodiode voltage output and torsional angle of a cantilever. During the calibration, the cantilever is mounted on a holder attached on the lever, which brings the torsional axis of the cantilever and rotation axis of the lever into line. By making use of its nanomotion on the Z-axis and using an external motion on the barrier, this device can complete the local and full-range lateral sensitivity calibrations of the optical lever without modifying the actual AFM or the cantilevers.
Xie
Hui
H
Institut des Systèmes Intelligents et Robotique (ISIR), Université Pierre et Marie Curie-Paris, 6/CNRS 18Route du Panorama-BP 61, 92265 Fontenay-Aux-Roses, France.
Vitard
Julien
J
Haliyo
Sinan
S
Régnier
Stéphane
S