title: Effect of solvent and dopant on poly(3,4-ethylenedioxythiophene) thin films by atomic force microscope lithography.
abstract: AMF anodization lithography was performed on organic thin films with conducting polymers which is poly(3,4-ethylenedioxythiophene). The conductivity of PEDOT thin films was changed by different dopants and organic solvents. Two different dopants are poly(4-styrenesulfonate) and di(2-ethylhexyl)-sulfosuccinate. Also, DMF and IPA were used to prepare the PEDOT thin films doped with PSS and DEHS on silicon surface. The conductivities of these PEDOT variants were compared by obtaining their I-V curves between tip and thin films using AFM. Silicon oxide nanopatterns with higher aspect ratios can be obtained from the films with higher conductivity.
authors.affiliation: Department of Nanostructure Semiconductor Engineering, Hanyang University, Seoul 133-791, Korea.
authors.forename: Yong-il
authors.initials: YI
authors.lastname: Kim
authors.forename: Hyunsook
authors.initials: H
authors.lastname: Kim
authors.forename: Haiwon
authors.initials: H
authors.lastname: Lee