title: Polarization information for terahertz imaging.
abstract: A method to analyze the change in the polarization state of a terahertz (THz) wave by using a typical electro-optic sampling setup with a ?110? zinc-blende crystal as a sensor is presented. To illustrate knowledge of the polarization of the THz pulse, the THz detection function in a ZnTe crystal is presented. Two kinds of Jones matrix for the birefringence device and the polarizer device are used to analyze the polarization change in the THz electric field caused by the sample. It is found that THz polarization imaging is sensitive to the edge of the sample.
authors.affiliation: Beijing Key Lab for THz Spectroscopy and Imaging, Key Laboratory of THz Optoelectronics, Ministry of Education, Department of Physics, Capital Normal University, Beijing, 100037 China.
authors.forename: Ranxi
authors.initials: R
authors.lastname: Zhang
authors.forename: Ye
authors.initials: Y
authors.lastname: Cui
authors.forename: Wenfeng
authors.initials: W
authors.lastname: Sun
authors.forename: Yan
authors.initials: Y
authors.lastname: Zhang