Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy.
We demonstrate local crystal structure analysis based on annular dark-field (ADF) imaging in scanning transmission electron microscopy (STEM). Using a stabilized STEM instrument and customized software, we first realize high accuracy of elemental discrimination and atom-position determination with a 10-pm-order accuracy, which can reveal major cation displacements associated with a variety of material properties, e.g. ferroelectricity and colossal magnetoresistivity. A-site ordered/disordered perovskite manganites Tb(0.5)Ba(0.5)MnO(3) are analysed; A-site ordering and a Mn-site displacement of 12 pm are detected in each specific atomic column. This method can be applied to practical and advanced materials, e.g. strongly correlated electron materials.
Saito
Mitsuhiro
M
Advanced Nano Characterization Center, National Institute for Materials Science, Tsukuba, Ibaraki, Japan.
Kimoto
Koji
K
Nagai
Takuro
T
Fukushima
Shun
S
Akahoshi
Daisuke
D
Kuwahara
Hideki
H
Matsui
Yoshio
Y
Ishizuka
Kazuo
K