title: An advanced magnetic reflectometer.
abstract: A new experimental setup dedicated to the measurement of soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR) is presented. XRMR is the combination of standard x-ray reflectometry with x-ray magnetic circular dichroism which provides chemical and magnetic depth profiles of layered thin-film samples. This new diffractometer is optimized for a broad variety of sample systems. Therefore a balanced design focusing on high magnetic fields, low temperatures, and full freedom of rotation has been realized in UHV. First experimental results obtained on a NiCoO/Co bilayer sample are presented showing the potential of the setup.
authors.affiliation: Max Planck Institute for Metals Research, Heisenbergstr. 3, D-70569 Stuttgart, Germany.
authors.forename: Sebastian
authors.initials: S
authors.lastname: Brück
authors.forename: Steffen
authors.initials: S
authors.lastname: Bauknecht
authors.forename: Bernd
authors.initials: B
authors.lastname: Ludescher
authors.forename: Eberhard
authors.initials: E
authors.lastname: Goering
authors.forename: Gisela
authors.initials: G
authors.lastname: Schütz