title: Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy.
abstract: We demonstrate local crystal structure analysis based on annular dark-field (ADF) imaging in scanning transmission electron microscopy (STEM). Using a stabilized STEM instrument and customized software, we first realize high accuracy of elemental discrimination and atom-position determination with a 10-pm-order accuracy, which can reveal major cation displacements associated with a variety of material properties, e.g. ferroelectricity and colossal magnetoresistivity. A-site ordered/disordered perovskite manganites Tb(0.5)Ba(0.5)MnO(3) are analysed; A-site ordering and a Mn-site displacement of 12 pm are detected in each specific atomic column. This method can be applied to practical and advanced materials, e.g. strongly correlated electron materials.
authors.affiliation: Advanced Nano Characterization Center, National Institute for Materials Science, Tsukuba, Ibaraki, Japan.
authors.forename: Mitsuhiro
authors.initials: M
authors.lastname: Saito
authors.forename: Koji
authors.initials: K
authors.lastname: Kimoto
authors.forename: Takuro
authors.initials: T
authors.lastname: Nagai
authors.forename: Shun
authors.initials: S
authors.lastname: Fukushima
authors.forename: Daisuke
authors.initials: D
authors.lastname: Akahoshi
authors.forename: Hideki
authors.initials: H
authors.lastname: Kuwahara
authors.forename: Yoshio
authors.initials: Y
authors.lastname: Matsui
authors.forename: Kazuo
authors.initials: K
authors.lastname: Ishizuka