Quantitative characterization of nanoadhesion by dynamic force spectroscopy.
We present a method for the characterization of adhesive bonds formed in nanocontacts. Using a modified atomic force microscope, the nanoadhesion between a silicon nitride tip and a self-assembled monolayer of 1-nonanethiol on gold(111) was measured at different loading rates. Adhesion force-versus-loading rate curves could be fitted with two logarithmic terms, indicating a two step (two energy barrier) process. The application of the Bell-Evans model and classical contact mechanics allows the extraction of quantitative information about the effective adhesion potential and characterization of the different components contributing to nanoadhesion.
Ptak
Arkadiusz
A
Institute of Physics, Poznan University of Technology, Nieszawska 13A, PL-60965 Poznan, Poland. arkadiusz.ptak@put.poznan.pl
Kappl
Michael
M
Moreno-Flores
Susana
S
Gojzewski
Hubert
H
Butt
Hans-Jürgen
HJ
D018625:Microscopy, Atomic Force; D008962:Models, Theoretical; D036103:Nanotechnology; D013057:Spectrum Analysis / Q000379:methods*; D013499:Surface Properties