title: High resolution hard x-ray microscope on a second generation synchrotron source.
abstract: A full-field, transmission x-ray microscope (TXM) operating in the energy range of 7-11 keV has been installed at the U7A beamline at the National Synchrotron Radiation Laboratory, a second generation synchrotron source operating at 0.8 GeV. Although the photon flux at sample position in the operating energy range is significantly low due to its relatively large emittance, the TXM can get high quality x-ray images with a spatial resolution down to 50 nm with acceptable exposure time. This TXM operates in either absorption or Zernike phase contrast mode with similar resolution. This TXM is a powerful analytical tool for a wide range of scientific areas, especially studies on nanoscale phenomena and structural imaging in biology, materials science, and environmental science. We present here the property of the x-ray source, beamline design, and the operation and key optical components of the x-ray TXM. Plans to improve the throughput of the TXM will be discussed.
authors.affiliation: National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei Anhui 230029, People's Republic of China. ychtian@ustc.edu.cn
authors.forename: Yangchao
authors.initials: Y
authors.lastname: Tian
authors.forename: Wenjie
authors.initials: W
authors.lastname: Li
authors.forename: Jie
authors.initials: J
authors.lastname: Chen
authors.forename: Longhua
authors.initials: L
authors.lastname: Liu
authors.forename: Gang
authors.initials: G
authors.lastname: Liu
authors.forename: Andrei
authors.initials: A
authors.lastname: Tkachuk
authors.forename: Jinping
authors.initials: J
authors.lastname: Tian
authors.forename: Ying
authors.initials: Y
authors.lastname: Xiong
authors.forename: Jeff
authors.initials: J
authors.lastname: Gelb
authors.forename: George
authors.initials: G
authors.lastname: Hsu
authors.forename: Wenbing
authors.initials: W
authors.lastname: Yun