title: Optical lever calibration in atomic force microscope with a mechanical lever.
abstract: A novel method that uses a small mechanical lever has been developed to directly calibrate the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The mechanical lever can convert the translation into a nanoscale rotation angle with a flexible hinge that provides an accurate conversion between the photodiode voltage output and torsional angle of a cantilever. During the calibration, the cantilever is mounted on a holder attached on the lever, which brings the torsional axis of the cantilever and rotation axis of the lever into line. By making use of its nanomotion on the Z-axis and using an external motion on the barrier, this device can complete the local and full-range lateral sensitivity calibrations of the optical lever without modifying the actual AFM or the cantilevers.
authors.affiliation: Institut des Systèmes Intelligents et Robotique (ISIR), Université Pierre et Marie Curie-Paris, 6/CNRS 18Route du Panorama-BP 61, 92265 Fontenay-Aux-Roses, France.
authors.forename: Hui
authors.initials: H
authors.lastname: Xie
authors.forename: Julien
authors.initials: J
authors.lastname: Vitard
authors.forename: Sinan
authors.initials: S
authors.lastname: Haliyo
authors.forename: Stéphane
authors.initials: S
authors.lastname: Régnier