title: Friction measurements of InAs nanowires on silicon nitride by AFM manipulation.
authors.affiliation: Center for Applied Mathematics and Physics, Halmstad University, Halmstad, Sweden. gabriela.conache@ftf.lth.se
authors.forename: Gabriela
authors.initials: G
authors.lastname: Conache
authors.forename: Struan M
authors.initials: SM
authors.lastname: Gray
authors.forename: Aline
authors.initials: A
authors.lastname: Ribayrol
authors.forename: Linus E
authors.initials: LE
authors.lastname: Fröberg
authors.forename: Lars
authors.initials: L
authors.lastname: Samuelson
authors.forename: Håkan
authors.initials: H
authors.lastname: Pettersson
authors.forename: Lars
authors.initials: L
authors.lastname: Montelius
mesh_terms: D001152:Arsenicals / Q000737:chemistry*; D017276:Friction; D007204:Indium / Q000737:chemistry*; D008422:Materials Testing; D053768:Metal Nanoparticles / Q000737:chemistry*; D018625:Microscopy, Atomic Force / Q000379:methods*; D008855:Microscopy, Electron, Scanning / Q000379:methods; D053758:Nanoparticles / Q000737:chemistry; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D053770:Nanowires / Q000737:chemistry; D017655:Silicon Compounds / Q000737:chemistry*; D013499:Surface Properties; D013696:Temperature
chemical_list: D001152:Arsenicals; D017655:Silicon Compounds; D007204:Indium; C076773:indium arsenide; C032734:silicon nitride