title: Origin of phase shift in atomic force microscopic investigation of the surface morphology of NR/NBR blend film.
abstract: Atomic force microscopy (AFM) was used to study the morphology and surface properties of NR/NBR blend. Blends at 1/3, 1/1 and 3/1 weight ratios were prepared in benzene and formed film by casting. AFM phase images of these blends in tapping mode displayed islands in the sea morphology or matrix-dispersed structures. For blend 1/3, NR formed dispersed phase while in blends 1/1 and 3/1 phase inversion was observed. NR showed higher phase shift angle in AFM phase imaging for all blends. This circumstance was governed by adhesion energy hysteresis between the device tip and the rubber surface rather than surface stiffness of the materials, as proved by force distance measurements in the AFM contact mode.
authors.affiliation: Institute of Science and Technology for Research and Development, Mahidol University, Salaya, Nakhon Pathom 73170, Thailand. ststw@mahidol.ac.th
authors.forename: S
authors.initials: S
authors.lastname: Thanawan
authors.forename: S
authors.initials: S
authors.lastname: Radabutra
authors.forename: P
authors.initials: P
authors.lastname: Thamasirianunt
authors.forename: T
authors.initials: T
authors.lastname: Amornsakchai
authors.forename: K
authors.initials: K
authors.lastname: Suchiva