Column-by-column compositional mapping by Z-contrast imaging.
A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAs(x)P(1-x) alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(001) substrates.
Molina
S I
SI
Departamento de Ciencia de los Materiales e IM y QI, Facultad de Ciencias, Universidad de Cádiz, Puerto Real, Cádiz, Spain. sergio.molina@uca.es
Sales
D L
DL
Galindo
P L
PL
Fuster
D
D
González
Y
Y
Alén
B
B
González
L
L
Varela
M
M
Pennycook
S J
SJ