title: Redshift of edge emission from AlGaInP light-emitting diodes and correlation with electron-hole recombination lifetime.
abstract: The edge emission from AlGaInP light-emitting diodes showed a red-shifted peak in addition to the peak of surface emission. This shift resulted from the quantum-well absorption of the guided wave. Although the shift degrades the color quality and the extraction efficiency of the device, it helps elucidate many important optical properties of the material and the dynamics of carrier recombination, including the electron-hole recombination lifetime, the optical joint density of state, the spontaneous emission spectrum and the absorption spectrum. A simple concept of the bimolecular recombination is established. The corresponding coefficient can be expressed by a simple formula and was therefore determined.
authors.affiliation: Institute of Electro-Optical Engineering, Department of Electronic Engineering, Chang Gung University, Taoyuan, Taiwan, Republic of China. ncchen001@mail.cgu.edu.tw
authors.forename: N C
authors.initials: NC
authors.lastname: Chen
authors.forename: C M
authors.initials: CM
authors.lastname: Lin
authors.forename: C
authors.initials: C
authors.lastname: Shen
authors.forename: W C
authors.initials: WC
authors.lastname: Lien
authors.forename: T Y
authors.initials: TY
authors.lastname: Lin
mesh_terms: D017607:Aluminum Compounds / Q000737:chemistry; D003198:Computer Simulation; D017076:Computer-Aided Design; D004583:Electrons; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008029:Lighting / Q000295:instrumentation*; D008962:Models, Theoretical; D045663:Quantum Dots; D012542:Scattering, Radiation; D012666:Semiconductors
chemical_list: D017607:Aluminum Compounds