title: Column-by-column compositional mapping by Z-contrast imaging.
abstract: A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAs(x)P(1-x) alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(001) substrates.
authors.affiliation: Departamento de Ciencia de los Materiales e IM y QI, Facultad de Ciencias, Universidad de Cádiz, Puerto Real, Cádiz, Spain. sergio.molina@uca.es
authors.forename: S I
authors.initials: SI
authors.lastname: Molina
authors.forename: D L
authors.initials: DL
authors.lastname: Sales
authors.forename: P L
authors.initials: PL
authors.lastname: Galindo
authors.forename: D
authors.initials: D
authors.lastname: Fuster
authors.forename: Y
authors.initials: Y
authors.lastname: González
authors.forename: B
authors.initials: B
authors.lastname: Alén
authors.forename: L
authors.initials: L
authors.lastname: González
authors.forename: M
authors.initials: M
authors.lastname: Varela
authors.forename: S J
authors.initials: SJ
authors.lastname: Pennycook