title: Executive control processes of working memory predict attentional blink magnitude over and above storage capacity.
abstract: When two masked, to-be-attended targets are presented within approximately half a second of each other, performance on the second target (T2) suffers, relative to when the targets are presented further apart in time or when the first target (T1) can be ignored. This phenomenon is known as the attentional blink (AB). Colzato et al. (Psychon Bull Rev 14:1051-1057, 2007) used an individual differences approach to examine whether individual AB magnitude was predicted by individual differences in working memory (WM), using the operation span paradigm (OSPAN). They found that OSPAN score was inversely related to AB magnitude even when a fluid intelligence measure (Raven's SPM) was partialled out. However, it is not clear from this study whether it was the executive control aspect of working memory, the capacity aspect of short-term memory, (or both), that related to AB magnitude. In the present study we used a variety of WM measures that required varying degrees of executive control. OSPAN was negatively related to AB magnitude with Raven's SPM, reading comprehension, reading rate, and digit forward and backward partialled out. Backward and forward digit span did not predict AB magnitude. These results support the conclusion that a "working" executive component of WM predicts temporal limitations of selective attention beyond static STM capacity and general cognitive ability.
authors.affiliation: Department of Psychology, Brock University, St Catharines, ON, L2S 3A1, Canada. karnell@brocku.ca
authors.forename: Karen M
authors.initials: KM
authors.lastname: Arnell
authors.forename: Kirk A
authors.initials: KA
authors.lastname: Stokes
authors.forename: Mary H
authors.initials: MH
authors.lastname: MacLean
authors.forename: Carleen
authors.initials: C
authors.lastname: Gicante
mesh_terms: D000293:Adolescent; D000328:Adult; D054518:Attentional Blink; D056344:Executive Function; D006801:Humans; D008570:Memory, Short-Term; D011581:Psychological Tests; D011930:Reaction Time; D011932:Reading; D012691:Serial Learning; D055815:Young Adult