Friction measurements of InAs nanowires on silicon nitride by AFM manipulation.
Conache
Gabriela
G
Center for Applied Mathematics and Physics, Halmstad University, Halmstad, Sweden. gabriela.conache@ftf.lth.se
Gray
Struan M
SM
Ribayrol
Aline
A
Fröberg
Linus E
LE
Samuelson
Lars
L
Pettersson
Håkan
H
Montelius
Lars
L
D001152:Arsenicals / Q000737:chemistry*; D017276:Friction; D007204:Indium / Q000737:chemistry*; D008422:Materials Testing; D053768:Metal Nanoparticles / Q000737:chemistry*; D018625:Microscopy, Atomic Force / Q000379:methods*; D008855:Microscopy, Electron, Scanning / Q000379:methods; D053758:Nanoparticles / Q000737:chemistry; D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D053770:Nanowires / Q000737:chemistry; D017655:Silicon Compounds / Q000737:chemistry*; D013499:Surface Properties; D013696:Temperature
D001152:Arsenicals; D017655:Silicon Compounds; D007204:Indium; C076773:indium arsenide; C032734:silicon nitride