title: ToF-SIMS application in the visualization and analysis of fingerprints after contact with amphetamine drugs.
abstract: Time-of-flight secondary ion mass spectrometry was applied in forensic research for characterization, visualization and analysis of fingerprints left after the fingers were contaminated by traces of drugs: amphetamine (AF), methamphetamine (MA) and methylenedioxymethamphetamine (MDMA; ecstasy). Experimental work was carried out using four kinds of bases (steel, aluminium, brass and glass) on which fingerprints were imprinted. The results of our preliminary studies have demonstrated that the ToF-SIMS technique can be a powerful tool in chemical investigations of fingerprints and detection of traces of substances, which do not exist in natural skin extraction, but can be found at the crime scene.
authors.affiliation: Institute of General and Ecological Chemistry, Technical University of Lodz, Zeromskiego 116, 90-924 Lodz, Poland. miszynk@p.lodz.p
authors.forename: M I
authors.initials: MI
authors.lastname: Szynkowska
authors.forename: K
authors.initials: K
authors.lastname: Czerski
authors.forename: J
authors.initials: J
authors.lastname: Rogowski
authors.forename: T
authors.initials: T
authors.lastname: Paryjczak
authors.forename: A
authors.initials: A
authors.lastname: Parczewski
mesh_terms: D000535:Aluminum; D000662:Amphetamines / Q000737:chemistry*; D000697:Central Nervous System Stimulants / Q000737:chemistry*; D003300:Copper; D003878:Dermatoglyphics; D005898:Glass; D006801:Humans; D013058:Mass Spectrometry / Q000379:methods*; D013232:Steel; D013499:Surface Properties; D015032:Zinc
chemical_list: D000662:Amphetamines; D000697:Central Nervous System Stimulants; D013232:Steel; C048399:brass; D003300:Copper; D000535:Aluminum; D015032:Zinc