title: Mechanical modulation method for ultrasensitive phase measurements in photonics biosensing.
abstract: A novel polarimetry methodology for phase-sensitive measurements in single reflection geometry is proposed for applications in optical transduction-based biological sensing. The methodology uses altering step-like chopper-based mechanical phase modulation for orthogonal s- and p- polarizations of light reflected from the sensing interface and the extraction of phase information at different harmonics of the modulation. We show that even under a relatively simple experimental arrangement, the methodology provides the resolution of phase measurements as low as 0.007 deg. We also examine the proposed approach using Total Internal Reflection (TIR) and Surface Plasmon Resonance (SPR) geometries. For TIR geometry, the response appears to be strongly dependent on the prism material with the best values for high refractive index Si. The detection limit for Si-based TIR is estimated as 10(-5) in terms Refractive Index Units (RIU) change. SPR geometry offers much stronger phase response due to a much sharper phase characteristics. With the detection limit of 3.2*10(-7) RIU, the proposed methodology provides one of best sensitivities for phase-sensitive SPR devices. Advantages of the proposed method include high sensitivity, simplicity of experimental setup and noise immunity as a result of a high stability modulation.
authors.affiliation: Engineering Physics Department, Ecole Polytechnique de Montréal, C. P. 6079, succ. Centre-Ville, Montréal, Québec, Canada, H3C 3A7.
authors.forename: S
authors.initials: S
authors.lastname: Patskovsky
authors.forename: M
authors.initials: M
authors.lastname: Maisonneuve
authors.forename: M
authors.initials: M
authors.lastname: Meunier
authors.forename: A V
authors.initials: AV
authors.lastname: Kabashin
mesh_terms: D000465:Algorithms; D055592:Biophysical Phenomena; D015374:Biosensing Techniques / Q000295:instrumentation* / Q000379:methods; D003198:Computer Simulation; D004867:Equipment Design; D015233:Models, Statistical; D008962:Models, Theoretical; D055095:Optics and Photonics; D017785:Photons; D012031:Refractometry; D012825:Silicon / Q000737:chemistry*; D020349:Surface Plasmon Resonance / Q000379:methods
chemical_list: D012825:Silicon