title: Multiple reflection Michelson interferometer with picometer resolution.
abstract: A Michelson interferometer based on an optical set-up allowing multiple reflection between two plane mirrors performs the multiplication of the optical path by a factor N, proportionally increasing the resolution of the measurement. A multiplication factor of almost two orders of magnitude has been demonstrated with a simple set-up. The technique can be applied to any interferometric measurement where the classical interferometer limits due to fringe nonlinearities and quantum noise are an issue. Applications in precision engineering, vibration analysis, nanometrology, and spectroscopy are foreseen.
authors.affiliation: Istituto Nazionale di Ricerca Metrologica, INRiM, Strada delle Cacce, 73, 10135 Torino, Italy. m.pisani@inrim.it
authors.forename: Marco
authors.initials: M
authors.lastname: Pisani
mesh_terms: D000465:Algorithms; D016477:Artifacts; D004867:Equipment Design / Q000379:methods; D007090:Image Interpretation, Computer-Assisted / Q000379:methods; D007368:Interferometry / Q000295:instrumentation* / Q000379:methods*; D055095:Optics and Photonics; D012031:Refractometry / Q000379:methods; D015203:Reproducibility of Results