title: Effect of amorphous layers on the interpretation of restored exit waves.
abstract: The effects of amorphous layers on the quality of exit wave restorations have been investigated. Two independently developed software implementations for exit wave restoration have been used to simulated focal series of images of <001> SrTiO3 with amorphous carbon layers incorporated. The restored exit waves have been compared both qualitatively and quantitatively. We have shown that amorphous layers have a strong impact on the quantitative measurements of atomic column positions, however, the error in the position measurements is still in the picometer range.
authors.affiliation: Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
authors.forename: S
authors.initials: S
authors.lastname: Van Aert
authors.forename: L Y
authors.initials: LY
authors.lastname: Chang
authors.forename: S
authors.initials: S
authors.lastname: Bals
authors.forename: A I
authors.initials: AI
authors.lastname: Kirkland
authors.forename: G
authors.initials: G
authors.lastname: Van Tendeloo