Optical arbitrary waveform characterization via dual-quadrature spectral interferometry.
We introduce the use of dual-quadrature spectral interferometry for amplitude and phase characterization of 100% duty factor optical arbitrary waveforms generated via spectral line-by-line pulse shaping. We demonstrate this technique for measurement of optical arbitrary waveforms composed of approximately 30 spectral lines from a 10 GHz frequency comb with 1.4 micros data acquisition time at an average power level of 10 microwatts. We then demonstrate coherent spectral phase measurements of pulses strongly dispersed by propagation over 50 km of optical fiber.
Supradeepa
V R
VR
School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA. venkatas@purdue.edu
Leaird
Daniel E
DE
Weiner
Andrew M
AM
D000465:Algorithms; D005336:Fiber Optic Technology; D005583:Fourier Analysis; D007090:Image Interpretation, Computer-Assisted; D007368:Interferometry / Q000379:methods*; D008433:Mathematics; D012542:Scattering, Radiation; D012815:Signal Processing, Computer-Assisted; D015398:Signal Transduction; D013057:Spectrum Analysis; D014054:Tomography