title: Electron beam coherence measurements using diffracted beam interferometry/holography.
abstract: The intensity and coherence of elastically and inelastically scattered electrons have been studied by the interference of electron-diffracted beams using a method of diffracted beam interferometry/holography (DBI/H). In the interferograms produced, fringes were found to exist from low to high scattering angles. The intensity and coherence of the fringes are useful for understanding the contrast mismatch between experimental and simulated images found in atomic resolution images of crystals produced by transmission electron microscopy (TEM) and annular dark-field (ADF) scanning transmission electron microscopy (STEM). The fringes disappear when the interfering beams are separated from an exact overlay position, which produces a measurement of the beam's lateral coherence and holds promise for measuring the coherence of the respective quasi-particles associated with the energy loss electrons.
authors.affiliation: Center for Advanced Materials and Related Technology, Department of Mechanical Engineering, University of Victoria, Victoria, British Columbia, Canada. rherring@uvic.ca
authors.forename: Rodney A
authors.initials: RA
authors.lastname: Herring