title: Artifacts in Fourier transform mass spectrometry.
abstract: Recent work on a new, higher sensitivity preamplifier design for Fourier transform ion cyclotron resonance mass spectrometry (FTICRMS) revealed a number of artifact peaks (spectral features) which do not contain useful chemical information. In order to determine the cause of these artifacts and eliminate them, these severely distorted spectra were compared with similarly distorted signal models. The source of several common signal processing artifacts was thereby determined and correlated to radio-frequency interference (RFI) noise and saturation of the amplifier and/or the digitizer. Under such conditions, the fast Fourier transform (FFT) generates spectral artifact peaks corresponding to harmonics and mixing frequencies of the real signal peaks and RFI frequencies. While this study was done using FTICRMS data, it is important to stress that these artifacts are inherent to the digitization and FFT process and thus are relevant to any FT-based MS instrument, including the orbitrap and FT ion trap.
authors.affiliation: Department of Electrical and Computer Engineering, 8 St. Mary's St., Boston University, Boston, MA 02215, USA.
authors.forename: Raman
authors.initials: R
authors.lastname: Mathur
authors.forename: Peter B
authors.initials: PB
authors.lastname: O'Connor
mesh_terms: D000465:Algorithms; D016477:Artifacts; D004581:Electronics / Q000295:instrumentation*; D004868:Equipment Failure; D019544:Equipment Failure Analysis; D005583:Fourier Analysis; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D021241:Spectrometry, Mass, Electrospray Ionization / Q000295:instrumentation* / Q000379:methods; D019032:Spectrometry, Mass, Matrix-Assisted Laser Desorption-Ionization / Q000295:instrumentation* / Q000379:methods