title: A short working distance multiple crystal x-ray spectrometer.
abstract: For x-ray spot sizes of a few tens of microns or smaller, a millimeter-sized flat analyzer crystal placed approximately 1 cm from the sample will exhibit high energy resolution while subtending a collection solid angle comparable to that of a typical spherically bent crystal analyzer (SBCA) at much larger working distances. Based on this observation and a nonfocusing geometry for the analyzer optic, we have constructed and tested a short working distance (SWD) multicrystal x-ray spectrometer. This prototype instrument has a maximum effective collection solid angle of 0.14 sr, comparable to that of 17 SBCA at 1 m working distance. We find good agreement with prior work for measurements of the Mn Kbeta x-ray emission and resonant inelastic x-ray scattering for MnO, and also for measurements of the x-ray absorption near-edge structure for Dy metal using Lalpha(2) partial-fluorescence yield detection. We discuss future applications at third- and fourth-generation light sources. For concentrated samples, the extremely large collection angle of SWD spectrometers will permit collection of high-resolution x-ray emission spectra with a single pulse of the Linac Coherent Light Source. The range of applications of SWD spectrometers and traditional multi-SBCA instruments has some overlap, but also is significantly complementary.
authors.affiliation: Department of Physics, University of Washington, Seattle, Washington 98195, USA.
authors.forename: B
authors.initials: B
authors.lastname: Dickinson
authors.forename: G T
authors.initials: GT
authors.lastname: Seidler
authors.forename: Z W
authors.initials: ZW
authors.lastname: Webb
authors.forename: J A
authors.initials: JA
authors.lastname: Bradley
authors.forename: K P
authors.initials: KP
authors.lastname: Nagle
authors.forename: S M
authors.initials: SM
authors.lastname: Heald
authors.forename: R A
authors.initials: RA
authors.lastname: Gordon
authors.forename: I M
authors.initials: IM
authors.lastname: Chou
mesh_terms: D002138:Calibration; D003460:Crystallization; D004867:Equipment Design; D007834:Lasers; D017895:Manganese Compounds / Q000737:chemistry; D008422:Materials Testing; D008962:Models, Theoretical; D055095:Optics and Photonics; D010087:Oxides / Q000737:chemistry; D012542:Scattering, Radiation; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods; D014965:X-Rays
chemical_list: D017895:Manganese Compounds; D010087:Oxides; C027424:manganese oxide