title: Simulation and analysis of solenoidal ion sources.
abstract: We present a detailed analysis and simulation of solenoidal, magnetically confined electron bombardment ion sources, aimed at molecular beam detection. The aim is to achieve high efficiency for singly ionized species while minimizing multiple ionization. Electron space charge plays a major role and we apply combined ray tracing and finite element simulations to determine the properties of a realistic geometry. The factors controlling electron injection and ion extraction are discussed. The results from simulations are benchmarked against experimental measurements on a prototype source.
authors.affiliation: Cavendish Laboratory, University of Cambridge, JJ Thomson Avenue, Cambridge CB3 0HE, United Kingdom.
authors.forename: A R
authors.initials: AR
authors.lastname: Alderwick
authors.forename: A P
authors.initials: AP
authors.lastname: Jardine
authors.forename: H
authors.initials: H
authors.lastname: Hedgeland
authors.forename: D A
authors.initials: DA
authors.lastname: MacLaren
authors.forename: W
authors.initials: W
authors.lastname: Allison
authors.forename: J
authors.initials: J
authors.lastname: Ellis
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D004583:Electrons; D004867:Equipment Design; D020342:Finite Element Analysis; D007477:Ions; D008280:Magnetics; D008962:Models, Theoretical; D055095:Optics and Photonics; D009991:Oscillometry / Q000379:methods; D010315:Particle Accelerators; D012542:Scattering, Radiation
chemical_list: D007477:Ions