title: Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface.
abstract: Scanning probe imaging in a shear force mode allows for the characterization of in-plane surface properties. In a standard AFM, shear force imaging can be realized by the torsional resonance mode. In order to investigate the imaging conditions on mineral surfaces, a torsional resonance mode atomic force microscope was operated in amplitude (AM) and frequency modulation (FM) feedback. Freshly cleaved chlorite was investigated, which showed brucite-like and talc-like surface areas. In constant amplitude FM mode, a slight variation in energy dissipation was observed between both surfaces. Amplitude and frequency vs. distance curves revealed that the tip was in repulsive contact with the specimen during imaging.
authors.affiliation: Department of Earth and Environmental Sciences and Center for NanoScience, Ludwig-Maximilians-Universität München, Theresienstr. 41, 80333 Munich, Germany.
authors.forename: Ayhan
authors.initials: A
authors.lastname: Yurtsever
authors.forename: Alexander M
authors.initials: AM
authors.lastname: Gigler
authors.forename: Robert W
authors.initials: RW
authors.lastname: Stark