title: Determination of soluble ions and elements in ambient air suspended particulate matter: Inter-technique comparison of XRF, IC and ICP for sample-by-sample quality control.
abstract: In this paper, we describe a validation procedure for chemical fractionation analysis of elements (Al, As, Ba, Ca, Cd, Cr, Cu, Fe, K, Mg, Mn, Na, Ni, Pb, S, Sb, Si, Sr, Ti and V) and soluble ions (Cl(-), NO(3)(-), SO(4)(2-), Na(+), NH(4)(+), Mg(2+), Ca(2+)) in suspended particulate matter (PM). The procedure applies three distinct measurement techniques (XRF, IC and ICP-OES) to the analysis of individual samples. The techniques used generate different outputs at different stages in the procedure. This makes it possible to identify the contributions of specific parameters to measurement uncertainty. On this basis, we propose a scheme for controlling the analytical quality of data from individual samples in which inter-technique comparisons is used in the same way many analytical methods use surrogates. We apply this scheme to about 310 samples of PM(10) and PM(2.5) identifying and assessing the main factors contributing to measurement uncertainty. This procedure successfully resolved a number of difficulties frequently encountered during the analysis of PM, including lack of appropriate reference materials and the low reliability of alternative techniques of quality control. The results demonstrate the critical importance of sample treatment prior to destructive analysis by IC and ICP.
authors.affiliation: Chemistry Department, University of Rome "La Sapienza", P.le Aldo Moro, 5, 00185 Rome, Italy.
authors.forename: S
authors.initials: S
authors.lastname: Canepari
authors.forename: C
authors.initials: C
authors.lastname: Perrino
authors.forename: M L
authors.initials: ML
authors.lastname: Astolfi
authors.forename: M
authors.initials: M
authors.lastname: Catrambone
authors.forename: D
authors.initials: D
authors.lastname: Perret
mesh_terms: D002623:Chemistry Techniques, Analytical / Q000379:methods*; D007477:Ions / Q000032:analysis*; D008670:Metals / Q000032:analysis*; D052638:Particulate Matter / Q000032:analysis*; D011786:Quality Control
chemical_list: D007477:Ions; D008670:Metals; D052638:Particulate Matter