A novel dual-stage classifier for automatic detection of epileptic seizures.
In long-term monitoring of electroencephalogram (EEG) for epilepsy, it is crucial for the seizure detection systems to have high sensitivity and low false detections to reduce uninteresting and redundant data that may be stored for review by the medical experts. However, a large number of features and the complex decision boundaries for classification of seizures eventually lead to a trade-off between sensitivity and false detection rate (FDR). Thus, no single classifier can fulfill the requirements of high sensitivity with a low FDR and at the same time be a computationally efficient system suitable for real-time application. We present a novel, simple, computationally efficient seizure detection system to enhance the sensitivity with a low FDR by proposing a dual-stage classifier. This overall system consists of a pre-processing unit, a feature extraction unit and a novel dual-stage classifier. The first stage of the proposed classifier detects all true seizures, but also many false patterns, whereas the second stage of the proposed classifier minimizes false detections by rejecting patterns that may be artifacts. The performance of the novel seizure detection system has been evaluated on 300 hours of single-channel depth electroencephalogram (SEEG) recordings obtained from fifteen patients. An overall improvement has been observed in terms of sensitivity, specificity and FDR.
Yadav
Rajeev
R
Center for Signal Processing and Communications, Department of Electrical and Computer Engineering, Concordia University, 1455 De Maisonneuve Blvd. West, Montreal, QC H3G1M8, Canada. r_yadav@ece.concordia.ca
Agarwal
Rajeev
R
Swamy
M N S
MN
D000465:Algorithms; D001185:Artificial Intelligence; D003936:Diagnosis, Computer-Assisted / Q000379:methods*; D004569:Electroencephalography / Q000379:methods*; D006801:Humans; D010363:Pattern Recognition, Automated / Q000379:methods*; D015203:Reproducibility of Results; D012640:Seizures / Q000175:diagnosis*; D012680:Sensitivity and Specificity