title: Phase-shift estimation in sinusoidally illuminated images for lateral superresolution.
abstract: Sinusoidally patterned illumination has been used to obtain lateral superresolution and axial sectioning in images. In both of these techniques multiple images are taken with the object illuminated by a sinusoidal pattern, the phase of the sinusoidal illumination being shifted differently in each image. The knowledge of these phase shifts is critical for image reconstruction. We discuss a method to estimate this phase shift with no prior knowledge of the shifts. In postprocessing we estimate randomly introduced, unknown phase shifts and process the images to obtain a superresolved image. Results of computer simulations are shown.
authors.affiliation: Electrical and Computer Engineering, University of Rochester, Rochester, New York 14627, USA. sapna@optics.rochester.edu
authors.forename: Sapna A
authors.initials: SA
authors.lastname: Shroff
authors.forename: James R
authors.initials: JR
authors.lastname: Fienup
authors.forename: David R
authors.initials: DR
authors.lastname: Williams