title: Partially coherent illumination in full-field interferometric synthetic aperture microscopy.
abstract: A model is developed for optical coherence tomography and interferometric synthetic aperture microscopy (ISAM) systems employing full-field frequency-scanned illumination with partial spatial coherence. This model is used to derive efficient ISAM inverse scattering algorithms that give diffraction-limited resolution in regions typically regarded as out of focus. Partial spatial coherence of the source is shown to have the advantage of mitigating multiple-scattering effects that can otherwise produce significant artifacts in full-field coherent imaging.
authors.affiliation: Beckman Institute for Advanced Science and Technology and the Department of Electrical and ComputerEngineering, University of Illinois at Urbana-Champaign, 405 North Mathews, Urbana, Illinois 61801, USA.
authors.forename: Daniel L
authors.initials: DL
authors.lastname: Marks
authors.forename: Brynmor J
authors.initials: BJ
authors.lastname: Davis
authors.forename: Stephen A
authors.initials: SA
authors.lastname: Boppart
authors.forename: P
authors.initials: P
authors.lastname: Scott Carney
mesh_terms: D003198:Computer Simulation; D008962:Models, Theoretical; D055095:Optics and Photonics; D041623:Tomography, Optical Coherence / Q000295:instrumentation*