title: The advanced ion-milling method for preparation of thin film using ion slicer: application to a sample recovered from diamond-anvil cell.
abstract: The advanced argon ion-milling technique using a new instrument called ion slicer was newly developed for preparation of thin foil. Compared to the conventional ion-milling methods, this technique facilitates very wide area to be homogeneously thinned by rocking the ion beam source with low angle and the specimen during milling. Here we applied this technique to a sample recovered from a laser-heated diamond-anvil cell (DAC). We obtained the thin film of almost entire cross section of the DAC sample along the compression axis, which possesses of approximately (10x50) microm(2). The laser-heated sample is often heterogeneous due to a large temperature gradient. However the chemical analyses are obtained from the whole hot spot under the transmission electron microscope by preparing the thin foil using the ion slicer.
authors.affiliation: Department of Earth and Planetary Sciences, Tokyo Institute of Technology, Meguro, Tokyo 152-8551, Japan. tateno.s.aa@m.titech.ac.jp
authors.forename: Shigehiko
authors.initials: S
authors.lastname: Tateno
authors.forename: Ryosuke
authors.initials: R
authors.lastname: Sinmyo
authors.forename: Kei
authors.initials: K
authors.lastname: Hirose
authors.forename: Hideo
authors.initials: H
authors.lastname: Nishioka