title: Polyoxometalate-based layered structures for charge transport control in molecular devices.
abstract: Hybrid organic-inorganic films consisted of molecular layers of a Keggin-structure polyoxometalate (POM: 12-tungstophosphoric acid, H(3)PW(12)O(40)) and 1,12-diaminododecane (DD) on 3-aminopropyl triethoxysilane (APTES)-modified silicon surface, fabricated via the layer-by-layer (LBL) self-assembly method are evaluated as molecular materials for electronic devices. The effect of the fabrication process parameters, including primarily compositions of deposition solutions, on the structural characteristics of the POM-based multilayers was studied extensively with a combination of spectroscopic methods (UV, FTIR, and XPS). Well-characterized POM-based films (both single-layers and multilayers) in a controlled and reproducible way were obtained. The conduction mechanisms in single-layered and multilayered structures were elucidated by the electrical characterization of the produced films supported by the appropriate theoretical analysis. Fowler-Nordheim (FN) tunneling and percolation mechanisms were encountered in good correlation with the structural characteristics of the films encouraging further investigation on the use of these materials in electronic and, in particular, in memory devices.
authors.affiliation: Institute of Microelectronics, National Center of Scientific Research "Demokritos", 15310 Aghia Paraskevi, Athens, Greece.
authors.forename: Antonios M
authors.initials: AM
authors.lastname: Douvas
authors.forename: Eleni
authors.initials: E
authors.lastname: Makarona
authors.forename: Nikos
authors.initials: N
authors.lastname: Glezos
authors.forename: Panagiotis
authors.initials: P
authors.lastname: Argitis
authors.forename: Jerzy A
authors.initials: JA
authors.lastname: Mielczarski
authors.forename: Ela
authors.initials: E
authors.lastname: Mielczarski
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D003460:Crystallization / Q000379:methods; D004579:Electron Transport; D004581:Electronics / Q000295:instrumentation*; D004867:Equipment Design; D019544:Equipment Failure Analysis; D046911:Macromolecular Substances / Q000737:chemistry; D008422:Materials Testing; D008956:Models, Chemical; D008968:Molecular Conformation; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D010316:Particle Size; D055672:Static Electricity; D013499:Surface Properties; D017973:Tungsten Compounds / Q000737:chemistry*; D000099294:Polyoxometalates
chemical_list: D046911:Macromolecular Substances; D017973:Tungsten Compounds; C102296:polyoxometalate I; D000099294:Polyoxometalates