title: Model-free iterative control of repetitive dynamics for high-speed scanning in atomic force microscopy.
abstract: We introduce an algorithm for calculating, offline or in real time and with no explicit system characterization, the feedforward input required for repetitive motions of a system. The algorithm is based on the secant method of numerical analysis and gives accurate motion at frequencies limited only by the signal-to-noise ratio and the actuator power and range. We illustrate the secant-solver algorithm on a stage used for atomic force microscopy.
authors.affiliation: Department of Physics, Simon Fraser University, Burnaby, British Columbia V5A 1S6, Canada.
authors.forename: Yang
authors.initials: Y
authors.lastname: Li
authors.forename: John
authors.initials: J
authors.lastname: Bechhoefer