Model-free iterative control of repetitive dynamics for high-speed scanning in atomic force microscopy.
We introduce an algorithm for calculating, offline or in real time and with no explicit system characterization, the feedforward input required for repetitive motions of a system. The algorithm is based on the secant method of numerical analysis and gives accurate motion at frequencies limited only by the signal-to-noise ratio and the actuator power and range. We illustrate the secant-solver algorithm on a stage used for atomic force microscopy.
Li
Yang
Y
Department of Physics, Simon Fraser University, Burnaby, British Columbia V5A 1S6, Canada.
Bechhoefer
John
J