Real versus measured surface potentials in scanning Kelvin probe microscopy.
Noncontact potentiometry or scanning Kelvin probe microscopy (SKPM) is a widely used technique to study charge injection and transport in (in)organic devices by measuring a laterally resolved local potential. This technique suffers from the significant drawback that experimentally obtained curves do not generally reflect the true potential profile in the device due to nonlocal coupling between the probing tip and the device. In this work, we quantitatively explain the experimental SKPM response and by doing so directly link theoretical device models to real observables. In particular, the model quantitatively explains the effects of the tip-sample distance and the dependence on the orientation of the probing tip with respect to the device.
Charrier
Dimitri S H
DS
Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB, Eindhoven, The Netherlands. d.charrier@tue.nl
Kemerink
Martijn
M
Smalbrugge
Barry E
BE
de Vries
Tjibbe
T
Janssen
René A J
RA
D016477:Artifacts; D004574:Electromagnetic Fields; D046911:Macromolecular Substances / Q000737:chemistry; D008422:Materials Testing / Q000379:methods*; D020527:Microscopy, Scanning Probe / Q000379:methods*; D008968:Molecular Conformation; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D036103:Nanotechnology / Q000379:methods*; D010316:Particle Size; D013499:Surface Properties
D046911:Macromolecular Substances