Stress-induced frequency shifts in langasite thickness-mode resonators.
In this paper, we report on our study of stress-induced effects on thickness vibrations of a langasite plate. The plate is assumed to be doubly rotated, specified by angles phi and theta. The stresses are assumed to be uniform and planar. The first-order perturbation integral as developed by Tiersten for frequency shifts in resonators is used. The dependence of frequency shifts on phi and theta is calculated and examined, and loci of stress-compensation are determined.
Kosinski
John A
JA
US Army Communication and Electronics Command, Fort Monmouth, NJ, USA.
Pastore
Robert R
RR
Yang
Xiaomeng
X
Yang
Jiashi
J
Turner
Joseph A
JA