title: A curved image-plate detector system for high-resolution synchrotron X-ray diffraction.
abstract: The developed curved image plate (CIP) is a one-dimensional detector which simultaneously records high-resolution X-ray diffraction (XRD) patterns over a 38.7 degrees 2theta range. In addition, an on-site reader enables rapid extraction, transfer and storage of X-ray intensity information in </=30 s, and further qualifies this detector to study kinetic processes in materials science. The CIP detector can detect and store X-ray intensity information linearly proportional to the incident photon flux over a dynamical range of about five orders of magnitude. The linearity and uniformity of the CIP detector response is not compromised in the unsaturated regions of the image plate, regardless of saturation in another region. The speed of XRD data acquisition together with excellent resolution afforded by the CIP detector is unique and opens up wide possibilities in materials research accessible through X-ray diffraction. This article presents details of the basic features, operation and performance of the CIP detector along with some examples of applications, including high-temperature XRD.
authors.affiliation: Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, IL 61801, USA.
authors.forename: P
authors.initials: P
authors.lastname: Sarin
authors.forename: R P
authors.initials: RP
authors.lastname: Haggerty
authors.forename: W
authors.initials: W
authors.lastname: Yoon
authors.forename: M
authors.initials: M
authors.lastname: Knapp
authors.forename: A
authors.initials: A
authors.lastname: Berghaeuser
authors.forename: P
authors.initials: P
authors.lastname: Zschack
authors.forename: E
authors.initials: E
authors.lastname: Karapetrova
authors.forename: N
authors.initials: N
authors.lastname: Yang
authors.forename: W M
authors.initials: WM
authors.lastname: Kriven
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D017356:Synchrotrons / Q000295:instrumentation*; D014159:Transducers; D014961:X-Ray Diffraction / Q000295:instrumentation*