title: High-resolution spectroscopy on an X-ray absorption beamline.
abstract: A bent-crystal spectrometer based on the Rowland circle geometry has been installed and tested on the BM30b/FAME beamline at the European Synchrotron Radiation Facility to improve its performances. The energy resolution of the spectrometer allows different kinds of measurements to be performed, including X-ray absorption spectroscopy, resonant inelastic X-ray scattering and X-ray Raman scattering experiments. The simplicity of the experimental device makes it easily implemented on a classical X-ray absorption beamline. This improvement in the fluorescence detection is of particular importance when the probed element is embedded in a complex and/or heavy matrix, for example in environmental sciences.
authors.affiliation: Institut Néel, CNRS, 25 avenue des Martyrs, 38042 Grenoble Cedex 9, France. jean-louis.hazemann@grenoble.cnrs.fr
authors.forename: Jean Louis
authors.initials: JL
authors.lastname: Hazemann
authors.forename: Olivier
authors.initials: O
authors.lastname: Proux
authors.forename: Vivian
authors.initials: V
authors.lastname: Nassif
authors.forename: Hervé
authors.initials: H
authors.lastname: Palancher
authors.forename: Eric
authors.initials: E
authors.lastname: Lahera
authors.forename: Cécile
authors.initials: C
authors.lastname: Da Silva
authors.forename: Aurélien
authors.initials: A
authors.lastname: Braillard
authors.forename: Denis
authors.initials: D
authors.lastname: Testemale
authors.forename: Marie Ange
authors.initials: MA
authors.lastname: Diot
authors.forename: Isabelle
authors.initials: I
authors.lastname: Alliot
authors.forename: William
authors.initials: W
authors.lastname: Del Net
authors.forename: Alain
authors.initials: A
authors.lastname: Manceau
authors.forename: Frédéric
authors.initials: F
authors.lastname: Gélébart
authors.forename: Marc
authors.initials: M
authors.lastname: Morand
authors.forename: Quentin
authors.initials: Q
authors.lastname: Dermigny
authors.forename: Abhay
authors.initials: A
authors.lastname: Shukla
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation* / Q000379:methods*; D014159:Transducers