title: Physical characterization and performance comparison of active- and passive-pixel CMOS detectors for mammography.
abstract: We investigated the physical characteristics of two complementary metal oxide semiconductor (CMOS) mammography detectors. The detectors featured 14-bit image acquisition, 50 microm detector element (del) size and an active area of 5 cm x 5 cm. One detector was a passive-pixel sensor (PPS) with signal amplification performed by an array of amplifiers connected to dels via data lines. The other detector was an active-pixel sensor (APS) with signal amplification performed at each del. Passive-pixel designs have higher read noise due to data line capacitance, and the APS represents an attempt to improve the noise performance of this technology. We evaluated the detectors' resolution by measuring the modulation transfer function (MTF) using a tilted edge. We measured the noise power spectra (NPS) and detective quantum efficiencies (DQE) using mammographic beam conditions specified by the IEC 62220-1-2 standard. Our measurements showed the APS to have much higher gain, slightly higher MTF, and higher NPS. The MTF of both sensors approached 10% near the Nyquist limit. DQE values near dc frequency were in the range of 55-67%, with the APS sensor DQE lower than the PPS DQE for all frequencies. Our results show that lower read noise specifications in this case do not translate into gains in the imaging performance of the sensor. We postulate that the lower fill factor of the APS is a possible cause for this result.
authors.affiliation: CancerCare Manitoba, Winnipeg, MB, Canada. Idris.Elbakri@cancercare.mb.ca
authors.forename: I A
authors.initials: IA
authors.lastname: Elbakri
authors.forename: B J
authors.initials: BJ
authors.lastname: McIntosh
authors.forename: D W
authors.initials: DW
authors.lastname: Rickey
mesh_terms: D016014:Linear Models; D008327:Mammography / Q000295:instrumentation*; D008670:Metals / Q000737:chemistry*; D010087:Oxides / Q000737:chemistry*; D012666:Semiconductors / Q000295:instrumentation*
chemical_list: D008670:Metals; D010087:Oxides