title: Effect of sample structure on reconstruction quality in computed tomography.
abstract: We have investigated the effect of a sample structure on reconstruction quality in computed tomography (CT). A power spectrum with respect to a projection angle is used to represent the sample structure. The condition for high quality reconstruction is then analyzed with the simulation and the electron tomography experiment based on an ultrahigh voltage electron microscope. The truncated terms in the power spectrum are suggested to be less than 10(-3) for high quality reconstruction. The effect of the sample structure is believed to be an important factor for high quality reconstruction of complex samples in various CT techniques.
authors.affiliation: Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an 710049, People's Republic of China.
authors.forename: Meng
authors.initials: M
authors.lastname: Cao
authors.forename: Hai-Bo
authors.initials: HB
authors.lastname: Zhang
authors.forename: Chao
authors.initials: C
authors.lastname: Li
authors.forename: Ryuji
authors.initials: R
authors.lastname: Nishi
mesh_terms: D000465:Algorithms; D000818:Animals; D003198:Computer Simulation; D006801:Humans; D021621:Imaging, Three-Dimensional / Q000379:methods*; D008954:Models, Biological; D011856:Radiographic Image Enhancement / Q000379:methods*; D011857:Radiographic Image Interpretation, Computer-Assisted / Q000379:methods*; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D014057:Tomography, X-Ray Computed / Q000379:methods*; D014965:X-Rays