Optical differential reflectance spectroscopy of ultrathin epitaxial organic films.
This Perspective does not have the ambition to entirely review the subject of optical spectroscopy on thin organic films. What we will try to achieve instead is to give an overview on optical reflectance spectroscopy of highly ordered organic thin films in the thickness range from submonolayers to several monolayers, as a tool to study the absorption behavior of such films. By doing so, we will emphasize the relations between the physical layer structure and the resulting optical properties. More specifically, we intend to show on the basis of particular examples what physical effects can be favorably examined by means of real-time optical spectroscopy, i.e., applied during the actual film growth, especially differential reflectance spectroscopy (DRS). Epitaxial organic films on inorganic substrates (insulators and conductors) will be in focus, and also the perspectives of investigating organic-organic heteroepitaxial layers will be addressed.
Forker
Roman
R
Institut für Angewandte Photophysik, Technische Universität Dresden, 01062 Dresden, Germany.
Fritz
Torsten
T