title: Measurement of the x-ray tube anodes' surface profile and its effects on the x-ray spectra.
abstract: An experimental study--involving measurements with an optical microscope, a profilometer, and a scanning electron microscope--for determination of the surface profile of x-ray tube anodes is presented. The islands on the "mud-flatting" surface are separated by approximately 8 microm deep cracks. The surface roughness on the island is typically below 1 microm, and the area ratio of cracks to the total surface is higher on the more extensively used regions (anode aging). A simple model was proposed to calculate the spectrum modification introduced by the rough surface. Loss of x-ray intensity of 4% was predicted using the roughest surface at a small emission angle.
authors.affiliation: Department of Optics and Quantum Electronics, University of Szeged, 6720 Szeged, Dóm tér 9, Hungary. erdelyi@titan.physx.u-szeged.hu
authors.forename: M
authors.initials: M
authors.lastname: Erdélyi
authors.forename: M
authors.initials: M
authors.lastname: Lajkó
authors.forename: R
authors.initials: R
authors.lastname: Kákonyi
authors.forename: G
authors.initials: G
authors.lastname: Szabó
mesh_terms: D004566:Electrodes; D008855:Microscopy, Electron, Scanning; D011859:Radiography / Q000295:instrumentation*; D013057:Spectrum Analysis; D013499:Surface Properties