title: An adaptive correspondence algorithm for modeling scenes with strong interreflections.
abstract: Modeling real-world scenes, beyond diffuse objects, plays an important role in computer graphics, virtual reality, and other commercial applications. One active approach is projecting binary patterns in order to obtain correspondence and reconstruct a densely sampled 3D model. In such structured-light systems, determining whether a pixel is directly illuminated by the projector is essential to decoding the patterns. When a scene has abundant indirect light, this process is especially difficult. In this paper, we present a robust pixel classification algorithm for this purpose. Our method correctly establishes the lower and upper bounds of the possible intensity values of an illuminated pixel and of a non-illuminated pixel. Based on the two intervals, our method classifies a pixel by determining whether its intensity is within one interval but not in the other. Our method performs better than standard method due to the fact that it avoids gross errors during decoding process caused by strong inter-reflections. For the remaining uncertain pixels, we apply an iterative algorithm to reduce the inter-reflection within the scene. Thus, more points can be decoded and reconstructed after each iteration. Moreover, the iterative algorithm is carried out in an adaptive fashion for fast convergence.
authors.affiliation: Department of Computer Sciences, Purdue University, West Lafayette, IN 47907, USA. xu43@cs.purdue.edu
authors.forename: Yi
authors.initials: Y
authors.lastname: Xu
authors.forename: Daniel G
authors.initials: DG
authors.lastname: Aliaga
mesh_terms: D000465:Algorithms; D003196:Computer Graphics; D003198:Computer Simulation; D007089:Image Enhancement / Q000379:methods; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D021621:Imaging, Three-Dimensional / Q000379:methods*; D008027:Light; D008029:Lighting / Q000379:methods*; D008962:Models, Theoretical; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D014584:User-Computer Interface