Development of a phase-controlled constant-distance scanning electrochemical microscope.
The present shear-force constant-distance scanning electrochemical microscope regulates tip-to-substrate distance using a phase-controlled feedback mechanism that is more sensitive than the amplitude-controlled constant-distance scanning electrochemical microscopes. Phase control responds faster to frequency perturbation and presents enhance sensitivity during distance curves under constant-distance mode.
Cougnon
Charles
C
UCO2M, UMR CNRS 6011, Université du Maine, Avenue O. Messiaen, 72085 Le Mans, France.
Bauer-Espindola
Klaus
K
Fabre
Dimitri S
DS
Mauzeroll
Janine
J