title: Structural investigations of core-shell nanowires using grazing incidence X-ray diffraction.
abstract: The fabrication of core-shell structures is crucial for many nanowire device concepts. For the proper tailoring of their electronic properties, control of structural parameters such as shape, size, diameter of core and shell, their chemical composition, and information on their strain fields is mandatory. Using synchrotron X-ray diffraction studies and finite element simulations, we determined the chemical composition, dimensions, and strain distribution for series of InAs/InAsP core-shell wires grown on Si(111) with systematically varied growth parameters. In particular we detect initiation of plastic relaxation of these structures with increasing shell thickness and/or increasing phosphorus content. We establish a phase diagram, defining the region of parameters leading to pseudomorphic nanowire growth. This is important to avoid extended defects which are detrimental for their electronic properties.
authors.affiliation: Institut für Halbleiter- and Festkörperphysik, Johannes Kepler Universität Linz, Altenbergerstrabetae 69, 4040 Linz, Austria. mario.keplinger@jku.at
authors.forename: Mario
authors.initials: M
authors.lastname: Keplinger
authors.forename: Thomas
authors.initials: T
authors.lastname: Mårtensson
authors.forename: Julian
authors.initials: J
authors.lastname: Stangl
authors.forename: Eugen
authors.initials: E
authors.lastname: Wintersberger
authors.forename: Bernhard
authors.initials: B
authors.lastname: Mandl
authors.forename: Dominik
authors.initials: D
authors.lastname: Kriegner
authors.forename: Václav
authors.initials: V
authors.lastname: Holý
authors.forename: Günther
authors.initials: G
authors.lastname: Bauer
authors.forename: Knut
authors.initials: K
authors.lastname: Deppert
authors.forename: Lars
authors.initials: L
authors.lastname: Samuelson