title: Ion attachment mass spectrometry combined with infrared image furnace for thermal analysis: evolved gas analysis studies.
abstract: A well-established ion attachment mass spectrometer (IAMS) is combined with an in-house single-atom infrared image furnace (IIF) specifically for thermal analysis studies. Besides the detection of many chemical species at atmospheric pressure, including free radical intermediates, the ion attachment mass spectrometer can also be used for the analysis of products emanating from temperature-programmed pyrolysis. The performance and applicability of the IIF-IAMS is illustrated with poly(tetrafluoroethylene) (PTFE) samples. The potential of the system for the analysis of oxidative pyrolysis is also considered. Temperature-programmed decomposition of PTFE gave constant slopes of the plots of temperature versus signal intensity in a defined region and provided an apparent activation energy of 28.8 kcal/mol for the PTFE decomposition product (CF(2))(3). A brief comparison with a conventional pyrolysis gas chromatography/mass spectrometry system is also given.
authors.affiliation: Department of Chemistry, Faculty of Sciences and Engineering, Meisei University, Hodokubo 2-1-1, Hino, Tokyo 191-8506 Japan.
authors.forename: Yuki
authors.initials: Y
authors.lastname: Kitahara
authors.forename: Seiji
authors.initials: S
authors.lastname: Takahashi
authors.forename: Noriyuki
authors.initials: N
authors.lastname: Kuramoto
authors.forename: Martin
authors.initials: M
authors.lastname: Sala
authors.forename: Takahisa
authors.initials: T
authors.lastname: Tsugoshi
authors.forename: Michel
authors.initials: M
authors.lastname: Sablier
authors.forename: Toshihiro
authors.initials: T
authors.lastname: Fujii