title: Development of a phase-controlled constant-distance scanning electrochemical microscope.
abstract: The present shear-force constant-distance scanning electrochemical microscope regulates tip-to-substrate distance using a phase-controlled feedback mechanism that is more sensitive than the amplitude-controlled constant-distance scanning electrochemical microscopes. Phase control responds faster to frequency perturbation and presents enhance sensitivity during distance curves under constant-distance mode.
authors.affiliation: UCO2M, UMR CNRS 6011, Université du Maine, Avenue O. Messiaen, 72085 Le Mans, France.
authors.forename: Charles
authors.initials: C
authors.lastname: Cougnon
authors.forename: Klaus
authors.initials: K
authors.lastname: Bauer-Espindola
authors.forename: Dimitri S
authors.initials: DS
authors.lastname: Fabre
authors.forename: Janine
authors.initials: J
authors.lastname: Mauzeroll