Polarization dependence of Z-scan measurement: theory and experiment.
Here we report on an extension of common Z-scan method to arbitrary polarized incidence light for measurements of anisotropic third-order nonlinear susceptibility in isotropic medium. The normalized transmittance formulas of closed-aperture Z-scan are obtained for linearly, elliptically and circularly polarized incidence beam. The theoretical analysis is examined experimentally by studying third-order nonlinear susceptibility of CS2 liquid. Results show that the elliptically polarized light Z-scan method can be used to measure simultaneously the two third-order nonlinear susceptibility components chi(3)(xyyx) and chi(3)(xxyy). Furthermore, the elliptically polarized light Z-scan measurements of large nonlinear phase shift are also analyzed theoretically and experimentally.
The Key Laboratory of Weak Light Nonlinear Photonics, Ministry of Education, Teda Applied Physics School, Nankai University, Tianjin 300457, China.
Xiao-Qing
XQ
Yan
Zhi-Bo
ZB
Liu
Xiao-Liang
XL
Zhang
Wen-Yuan
WY
Zhou
Jian-Guo
JG
Tian
D003198:Computer Simulation; D008027:Light; D008962:Models, Theoretical; D012031:Refractometry / Q000379:methods*; D012542:Scattering, Radiation