Color moiré pattern simulation and analysis in three-dimensional integral imaging for finding the moiré-reduced tilted angle of a lens array.
We propose a color moiré pattern simulation and analysis method in integral imaging for finding the moiré-reducing tilted angle of a lens array. According to the tilted angle, the color moiré patterns are simulated on the assumption of ray optics. The spatial frequencies of the color moiré patterns are numerically analyzed using a spatial Fourier transform for finding the optimal angle where the moiré is reduced. With the proposed technique the visualization of the color moiré pattern and its analysis are enabled. The moiré-reduced three-dimensional images can be displayed. The principle of the proposed method, simulation results, and their analysis are provided. Experimental results verify the validity of the proposed method.
Kim
Yunhee
Y
School of Electrical Engineering, Seoul National University, Gwanak-Gu Gwanakro 599, Seoul 151-744, Korea.
Park
Gilbae
G
Jung
Jae-Hyun
JH
Kim
Joohwan
J
Lee
Byoungho
B