Polarization dependence of Z-scan measurement: theory and experiment.
Here we report on an extension of common Z-scan method to arbitrary polarized incidence light for measurements of anisotropic third-order nonlinear susceptibility in isotropic medium. The normalized transmittance formulas of closed-aperture Z-scan are obtained for linearly, elliptically and circularly polarized incidence beam. The theoretical analysis is examined experimentally by studying third-order nonlinear susceptibility of CS2 liquid. Results show that the elliptically polarized light Z-scan method can be used to measure simultaneously the two third-order nonlinear susceptibility components chi(3)(xyyx) and chi(3)(xxyy). Furthermore, the elliptically polarized light Z-scan measurements of large nonlinear phase shift are also analyzed theoretically and experimentally.
Yan
Xiao-Qing
XQ
The Key Laboratory of Weak Light Nonlinear Photonics, Ministry of Education, Teda Applied Physics School, Nankai University, Tianjin 300457, China.
Liu
Zhi-Bo
ZB
Zhang
Xiao-Liang
XL
Zhou
Wen-Yuan
WY
Tian
Jian-Guo
JG
D003198:Computer Simulation; D008027:Light; D008962:Models, Theoretical; D012031:Refractometry / Q000379:methods*; D012542:Scattering, Radiation