Submicrometer infrared surface imaging using a scanning-probe microscope and an optical parametric oscillator laser.
Submicrometer IR surface imaging was performed with a resolution better than the diffraction limit. The apparatus was based on an IR optical parametric oscillator laser and a commercial atomic force microscope and used, as the detection mechanism, induced resonant oscillations in an atomic force microscopy (AFM) cantilever. For the first time to our knowledge this was achieved with top-down illumination and a benchtop IR source, thus extending the range of potential applications of this technique. IR absorption and AFM topography images of polystyrene beads were recorded simultaneously with an image resolution of 200 nm.
School of Chemical Science and Pharmacy, University of East Anglia, Norwich NR4 7TJ, UK.
Graeme A
GA
Hill
James H
JH
Rice
Stephen R
SR
Meech
Duncan Q M
DQ
Craig
Paulina
P
Kuo
Konstantin
K
Vodopyanov
Michael
M
Reading
D004867:Equipment Design; D007834:Lasers; D008853:Microscopy / Q000295:instrumentation / Q000379:methods; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods; D055095:Optics and Photonics; D009991:Oscillometry; D011137:Polystyrenes / Q000737:chemistry; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D013055:Spectrophotometry, Infrared / Q000295:instrumentation* / Q000379:methods; D013499:Surface Properties
D011137:Polystyrenes