title: Practical methods for retrace error correction in nonnull aspheric testing.
abstract: Nonnull test is often adopted for aspheric testing. But due to its violation of null condition, the testing rays will follow different paths from the reference and aberrations from the interferometer will not cancel out, leading to widely difference between the obtained surface figure and that of the real, which is called the Retrace-error accordingly. In this paper, retrace error of nonnull aspheric testing is analyzed in detail with conclusions that retrace error has much to do with the aperture, F number and surface shape error of the aspheric under test. Correcting methods are proposed according to the manner of the retrace errors. Both computer simulation and experimental results show that the proposed methods can correct the retrace error effectively. The analysis and proposed correction methods bring much to the application of nonnull aspheric testing.
authors.affiliation: State Key Laboratory of Modern Optical Instrumentation, Department of Optical Engineering, Zhejiang University, Hangzhou, China. nanotesting@gmail.com
authors.forename: Dong
authors.initials: D
authors.lastname: Liu
authors.forename: Yongying
authors.initials: Y
authors.lastname: Yang
authors.forename: Chao
authors.initials: C
authors.lastname: Tian
authors.forename: Yongjie
authors.initials: Y
authors.lastname: Luo
authors.forename: Lin
authors.initials: L
authors.lastname: Wang
mesh_terms: D000465:Algorithms; D016477:Artifacts; D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis / Q000379:methods*; D007909:Lenses; D008027:Light; D008962:Models, Theoretical; D012031:Refractometry / Q000295:instrumentation* / Q000379:methods*; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity