X-ray diffractometry for the structure determination of a submicrometre single powder grain.
A high-precision diffractometer has been developed for the structure analysis of a submicrometre-scale single grain of a powder sample at the SPring-8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of the diffractometer, which allows accurate diffraction intensity data of a submicrometre-scale single powder grain to be measured. The phase zone plate was designed to create a high-flux focused synchrotron radiation beam. A low-eccentric goniometer and high-precision sample positioning stages were adopted to ensure the alignment of a micrometre-scale focused synchrotron radiation beam onto the submicrometre-scale single powder grain. In order to verify the diffractometer performance, the diffraction pattern data of several powder grains of BaTiO(3), of dimensions approximately 600 x 600 x 300 nm, were measured. By identifying the diffraction data set of one single powder grain, the crystal structure was successfully determined with a reliable factor of 5.24%.
Yasuda
Nobuhiro
N
JASRI/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
Murayama
Haruno
H
Fukuyama
Yoshimitsu
Y
Kim
Jungeun
J
Kimura
Shigeru
S
Toriumi
Koshiro
K
Tanaka
Yoshihito
Y
Moritomo
Yutaka
Y
Kuroiwa
Yoshihiro
Y
Kato
Kenichi
K
Tanaka
Hitoshi
H
Takata
Masaki
M
D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D036103:Nanotechnology / Q000295:instrumentation*; D011208:Powders; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D014961:X-Ray Diffraction / Q000295:instrumentation*
D011208:Powders