title: X-ray diffractometry for the structure determination of a submicrometre single powder grain.
abstract: A high-precision diffractometer has been developed for the structure analysis of a submicrometre-scale single grain of a powder sample at the SPring-8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of the diffractometer, which allows accurate diffraction intensity data of a submicrometre-scale single powder grain to be measured. The phase zone plate was designed to create a high-flux focused synchrotron radiation beam. A low-eccentric goniometer and high-precision sample positioning stages were adopted to ensure the alignment of a micrometre-scale focused synchrotron radiation beam onto the submicrometre-scale single powder grain. In order to verify the diffractometer performance, the diffraction pattern data of several powder grains of BaTiO(3), of dimensions approximately 600 x 600 x 300 nm, were measured. By identifying the diffraction data set of one single powder grain, the crystal structure was successfully determined with a reliable factor of 5.24%.
authors.affiliation: JASRI/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
authors.forename: Nobuhiro
authors.initials: N
authors.lastname: Yasuda
authors.forename: Haruno
authors.initials: H
authors.lastname: Murayama
authors.forename: Yoshimitsu
authors.initials: Y
authors.lastname: Fukuyama
authors.forename: Jungeun
authors.initials: J
authors.lastname: Kim
authors.forename: Shigeru
authors.initials: S
authors.lastname: Kimura
authors.forename: Koshiro
authors.initials: K
authors.lastname: Toriumi
authors.forename: Yoshihito
authors.initials: Y
authors.lastname: Tanaka
authors.forename: Yutaka
authors.initials: Y
authors.lastname: Moritomo
authors.forename: Yoshihiro
authors.initials: Y
authors.lastname: Kuroiwa
authors.forename: Kenichi
authors.initials: K
authors.lastname: Kato
authors.forename: Hitoshi
authors.initials: H
authors.lastname: Tanaka
authors.forename: Masaki
authors.initials: M
authors.lastname: Takata
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D036103:Nanotechnology / Q000295:instrumentation*; D011208:Powders; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D014961:X-Ray Diffraction / Q000295:instrumentation*
chemical_list: D011208:Powders