title: Randomized benchmarking and process tomography for gate errors in a solid-state qubit.
abstract: We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.
authors.affiliation: Department of Physics, Yale University, New Haven, Connecticut 06520, USA.
authors.forename: J M
authors.initials: JM
authors.lastname: Chow
authors.forename: J M
authors.initials: JM
authors.lastname: Gambetta
authors.forename: L
authors.initials: L
authors.lastname: Tornberg
authors.forename: Jens
authors.initials: J
authors.lastname: Koch
authors.forename: Lev S
authors.initials: LS
authors.lastname: Bishop
authors.forename: A A
authors.initials: AA
authors.lastname: Houck
authors.forename: B R
authors.initials: BR
authors.lastname: Johnson
authors.forename: L
authors.initials: L
authors.lastname: Frunzio
authors.forename: S M
authors.initials: SM
authors.lastname: Girvin
authors.forename: R J
authors.initials: RJ
authors.lastname: Schoelkopf