title: Resonant activation through effective temperature oscillation in a Josephson tunnel junction.
abstract: We experimentally investigated the thermal escape from a metastable state in a Josephson tunnel junction subjected to an oscillating effective temperature. A minimum of the average escape time is observed at certain oscillation frequency. Our results confirm that the resonant activation can be caused not only by the oscillating barrier but also by the oscillating temperature. The linear dependence of the minimum average escape time on the resonant frequency suggests that the correlation between the oscillation and the escape process leads to the resonant escape.
authors.affiliation: Department of Physics and National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China.
authors.forename: Cheng
authors.initials: C
authors.lastname: Pan
authors.forename: Xinsheng
authors.initials: X
authors.lastname: Tan
authors.forename: Yang
authors.initials: Y
authors.lastname: Yu
authors.forename: Guozhu
authors.initials: G
authors.lastname: Sun
authors.forename: Ling
authors.initials: L
authors.lastname: Kang
authors.forename: Weiwei
authors.initials: W
authors.lastname: Xu
authors.forename: Jian
authors.initials: J
authors.lastname: Chen
authors.forename: Peiheng
authors.initials: P
authors.lastname: Wu