Randomized benchmarking and process tomography for gate errors in a solid-state qubit.
We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.
Chow
J M
JM
Department of Physics, Yale University, New Haven, Connecticut 06520, USA.
Gambetta
J M
JM
Tornberg
L
L
Koch
Jens
J
Bishop
Lev S
LS
Houck
A A
AA
Johnson
B R
BR
Frunzio
L
L
Girvin
S M
SM
Schoelkopf
R J
RJ