title: Electric field alignment of a block copolymer nanopattern: direct observation of the microscopic mechanism.
abstract: Using quasi-in-situ scanning force microscopy we study the details of nanopattern alignment in ABC terblock copolymer thin films in the presence of an in-plane electric field. Because of the surface interactions and electric field the lamellae are oriented both perpendicular to the plane of the film and parallel to the electric field. We identified two distinct defect types which govern the orientation mechanism. Ring-like (tori) and open-end defects dominate at the early stage of the orientation process, while mainly classic topological defects (disclinations and dislocations) are involved in long-range ordering at the late stages. Comparison of the time evolution of the defect density with the evolution of the orientational order parameter suggests that tori-defects are essential for the effective reorientation. Further, the quasi-in-situ SFM imaging allowed us to elucidate the influence of the electric field strength on the propagation velocity of the topological defects.
authors.affiliation: Lehrstuhl für Physikalische Chemie II, Universität Bayreuth, D-95440 Bayreuth, Germany.
authors.forename: Violetta
authors.initials: V
authors.lastname: Olszowka
authors.forename: Markus
authors.initials: M
authors.lastname: Hund
authors.forename: Volker
authors.initials: V
authors.lastname: Kuntermann
authors.forename: Sabine
authors.initials: S
authors.lastname: Scherdel
authors.forename: Larisa
authors.initials: L
authors.lastname: Tsarkova
authors.forename: Alexander
authors.initials: A
authors.lastname: Böker
mesh_terms: D003460:Crystallization / Q000379:methods*; D004574:Electromagnetic Fields; D046911:Macromolecular Substances / Q000737:chemistry; D008422:Materials Testing; D018625:Microscopy, Atomic Force / Q000379:methods*; D008968:Molecular Conformation / Q000528:radiation effects; D049329:Nanostructures / Q000737:chemistry* / Q000528:radiation effects / Q000648:ultrastructure*; D036103:Nanotechnology / Q000379:methods*; D010316:Particle Size; D011108:Polymers / Q000737:chemistry* / Q000528:radiation effects*; D013499:Surface Properties / Q000528:radiation effects
chemical_list: D046911:Macromolecular Substances; D011108:Polymers