Low-frequency noise in solid-state nanopores.
Low-frequency ionic current noise in solid-state nanopores imposes a limitation on the time resolution achieved in translocation experiments. Recently, this 1/f noise was described as obeying Hooge's phenomenological relation, where the noise scales inversely with the number of charge carriers present. Here, we consider an alternative model in which the low-frequency noise originates from surface charge fluctuations. We compare the models and show that Hooge's relation gives the best description for the low-frequency noise in solid-state nanopores over the entire salt regime from 10(-3) to 1.6 M KCl.
Kavli Institute of Nanoscience, Delft University of Technology, Delft, The Netherlands.
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D003198:Computer Simulation; D007473:Ion Channels / Q000737:chemistry*; D008956:Models, Chemical; D015233:Models, Statistical; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D010316:Particle Size; D016062:Porosity; D055672:Static Electricity
D007473:Ion Channels