Self-referenced spectral interferometry for simultaneous measurements of thickness and refractive index.
We present a method for simultaneously measuring the thickness and the group refractive index of a specimen using self-referenced spectral-domain fiber-based interferometry. By removing the scanning part and using the fiber-based configuration, the system complexity and stability could be significantly improved. To minimize the system drift, we utilized the signals originated from the fiber ends of both arms. Implementing in a self-referenced configuration, we could improve the measurement accuracy down to a decimal place. Experimental measurements were made with a 1.555 mm thick fused silica plate. At 814 nm the thickness was measured as 1.5546 +/- 0.0002 mm, and at the same time, the group index was obtained as 1.4627 +/- 0.0002.
Na
Jihoon
J
Department of Information and Communications, Gwangju Institute of Science and Technology, 261 Cheomdan-gwagiro, Buk-gu, Gwangju 500-712, South Korea.
Choi
Hae Young
HY
Choi
Eun Seo
ES
Lee
ChangSu
C
Lee
Byeong Ha
BH
D000465:Algorithms; D004867:Equipment Design; D019544:Equipment Failure Analysis; D005336:Fiber Optic Technology / Q000295:instrumentation* / Q000379:methods; D007368:Interferometry / Q000295:instrumentation* / Q000379:methods; D009391:Nephelometry and Turbidimetry / Q000295:instrumentation*; D012031:Refractometry / Q000295:instrumentation*