Optical and electrical characterization at the nanoscale with a transparent probe of a scanning tunnelling microscope.
A new type of scanning probe microscope, combining features of the scanning tunnelling microscope, the scanning tunnelling luminescence microscope with a transparent probe and the aperture scanning near-field optical microscope, is described. Proof-of-concept experiments were performed under ultrahigh vacuum conditions at varying temperature on GaAs/AlAs heterostructures.
NTT Basic Research Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan.
Ilya
I
Sychugov
Hiroo
H
Omi
Tooru
T
Murashita
Yoshihiro
Y
Kobayashi