Ultra-high resolution nano-characterisation and analysis using advanced S/TEM.
As the frontiers of nanotechnology are expanded ever further, so too we must push back the boundaries of imaging and analysis. The need for tools that can deliver new, ultra-high resolution information is driving the development of electron microscopy and spectroscopy to the extremes of performance. For example, aberration-corrected TEM (transmission electron microscopy) and STEM (scanning transmission electron microscopy) gives us the ability to work at sub-angstrom length-scales. Combine this capability with an unprecedented electron beam energy resolution, and spectroscopy at the atomic level revealing knowledge about inter-atomic bonding becomes a fact. This enables full characterization of chemical composition, electronic structure and mechanical properties. In addition, there is scope for capturing time-resolved structural transformations with sub-nanometer detail, enabling us to directly observe and understand the dynamics of a range of chemical processes in situ.
FEI Company, P.O. Box 80066, 5600 Eindhoven, Netherlands.
Dominique H W
DH
Hubert
Bert
B
Freitag
Debbie J
DJ
Stokes
Dong
D
Tang
Eric
E
Van Cappellen