Exact wavefront recovery with tilt from lateral shear interferograms.
A novel method is presented for one-dimensional wavefront recovery on the basis of difference measurements from two shearing interferograms with varying tilt. The method uses large shears and obtains high lateral resolution. Furthermore, the wavefront under test can be recovered exactly up to an arbitrary constant and straight line at all evaluation points with suitably chosen shears of two shearing interferograms.
Yin
Zi-qiang
ZQ
Laboratory of Precision Engineering, College of Mechatronics Engineering and Automation, National University of Defense Technology, Changsha 410073, China. zqyin@nudt.edu.cn