Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy.
An approach for the analysis of multi-dimensional, spectroscopic-imaging data based on principal component analysis (PCA) is explored. PCA selects and ranks relevant response components based on variance within the data. It is shown that for examples with small relative variations between spectra, the first few PCA components closely coincide with results obtained using model fitting, and this is achieved at rates approximately four orders of magnitude faster. For cases with strong response variations, PCA allows an effective approach to rapidly process, de-noise, and compress data. The prospects for PCA combined with correlation function analysis of component maps as a universal tool for data analysis and representation in microscopy are discussed.
The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA. sjesse@ornl.gov
Stephen
S
Jesse
Sergei V
SV
Kalinin
D000465:Algorithms; D003627:Data Interpretation, Statistical; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D008422:Materials Testing / Q000379:methods*; D020527:Microscopy, Scanning Probe / Q000379:methods*; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D025341:Principal Component Analysis