Low coherence interferometry for central thickness measurement of rigid and soft contact lenses.
In this paper we propose contact lens central thickness measurement with a low coherence interferometry technique using either a SLED source or a broadband continuum generated in air-silica Microstructured Optical Fiber (MOF) pumped with a picosecond microchip laser. Each of these sources associated with the interferometer provides, at the same time, good measurement resolution and quick signal recording without moving any optical elements and without need of a Fourier Transform operation. Signal improvement is performed afterwards by a numerical treatment for optimal correlation peaks detection leading to central thickness value of several contact lenses.
Verrier
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I
CNRS UMR 5516, Laboratoire Hubert Curien, 18, rue Benoît LAURAS 42000 Saint-Etienne, France. isabelle.verrier@univ-st-etienne.fr
Veillas
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C
Lépine
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T
D003261:Contact Lenses; D004867:Equipment Design; D019544:Equipment Failure Analysis / Q000295:instrumentation* / Q000379:methods; D007368:Interferometry / Q000295:instrumentation* / Q000379:methods; D008029:Lighting / Q000295:instrumentation* / Q000379:methods; D012031:Refractometry / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity