title: Spectral interferometry and reflectometry used for characterization of a multilayer mirror.
abstract: A white-light spectral interferometric technique is used to retrieve a relative spectral phase and group delay of a multilayer mirror from the spectral interferograms recorded in a dispersive Michelson interferometer. The phase retrieval is based on the use of a windowed Fourier transform in the wavelength domain, and characterization of the multilayer mirror is completed by a three-step measurement of the reflectance spectrum of the mirror in the same interferometer.
authors.affiliation: Department of Physics, Technical University Ostrava, 17. Listopadu 15, 708 33 Ostrava-Poruba, Czech Republic. petr.hlubina@vsb.cz
authors.forename: Petr
authors.initials: P
authors.lastname: Hlubina
authors.forename: Jirí
authors.initials: J
authors.lastname: Lunácek
authors.forename: Dalibor
authors.initials: D
authors.lastname: Ciprian