Spectral interferometry and reflectometry used for characterization of a multilayer mirror.
A white-light spectral interferometric technique is used to retrieve a relative spectral phase and group delay of a multilayer mirror from the spectral interferograms recorded in a dispersive Michelson interferometer. The phase retrieval is based on the use of a windowed Fourier transform in the wavelength domain, and characterization of the multilayer mirror is completed by a three-step measurement of the reflectance spectrum of the mirror in the same interferometer.
Hlubina
Petr
P
Department of Physics, Technical University Ostrava, 17. Listopadu 15, 708 33 Ostrava-Poruba, Czech Republic. petr.hlubina@vsb.cz
Lunácek
Jirí
J
Ciprian
Dalibor
D