title: High resolution optical frequency domain reflectometry for characterization of components and assemblies.
abstract: We describe a technique for polarization sensitive optical frequency domain reflectometry (OFDR) that achieves 22 micrometer two-point spatial resolution over 35 meters of optical length with -97 dB sensitivity in a single measurement taking only seconds. We demonstrate OFDR's versatility in both time- and frequency-domain metrology by analyzing a fiber Bragg grating (FBG) in both the spectral and impulse response domains. We also demonstrate how a polarization diversity receiver can be used in an OFDR system to track changes in the polarization state of light propagating through a birefringent component.
authors.forename: Brian
authors.initials: B
authors.lastname: Soller
authors.forename: Dawn
authors.initials: D
authors.lastname: Gifford
authors.forename: Matthew
authors.initials: M
authors.lastname: Wolfe
authors.forename: Mark
authors.initials: M
authors.lastname: Froggatt