title: Characterization of surface crystallization in Ge-doped graded-index silica glass.
abstract: Surface crystallization was induced in Ge-doped silica glass samples from a graded-index optical fiber preform by re-heating them at 1100 degrees C for several hours. X-ray diffraction and second-harmonic generation (SHG) microscopy have been utilized to investigate the crystalline phases formed. Experimental results indicate that the predominant crystalline phase is alpha-cristobalite. The cross-sectional distribution of the crystal particles has also been measured with the SHG microscopy and the result is in good agreement with that from traditional bright field light microscopy.
authors.forename: Honglin
authors.initials: H
authors.lastname: An
authors.forename: Ying
authors.initials: Y
authors.lastname: Tang
authors.forename: Pam
authors.initials: P
authors.lastname: McNamara
authors.forename: Simon
authors.initials: S
authors.lastname: Fleming