Numerical modeling of the subwavelength phase-change recording using an apertureless scanning near-field optical microscope.
The electromagnetic field enhancement (FE) at the end of the probe of an Apertureless Scanning Near-field Optical Microscope (ASNOM) is used to write nanometric dots in a phase-change medium. The FE acts as a heat source that allows the transition from amorphous to crystalline phase in a Ge2Sb2Te5 layer. Through the 2D Finite Element Method (FEM) we predict the size of the dot as a function of both the illumination duration and the incoming power density. Numerical results are found to be in good agreement with preliminary experimental data.
Grosges
Thomas
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Petit
Stéphane
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Barchiesi
Dominique
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Hudlet
Sylvain
S