title: Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks.
abstract: Accurate angular phase data are extracted from angle-resolved scattering measurements made with polarized light using a technique developed in the laboratory. This Ellipsometry of Angle-Resolved Scattering (E.A.R.S.) technique makes it possible to distinguish surface scattering from bulk scattering independent of the scattering levels for different types of samples. Phase data are also investigated in the speckle pattern.
authors.forename: Olivier
authors.initials: O
authors.lastname: Gilbert
authors.forename: Carole
authors.initials: C
authors.lastname: Deumié
authors.forename: Claude
authors.initials: C
authors.lastname: Amra