title: Solid-state carrier-envelope-phase noise measurements with intrinsically balanced detection.
abstract: We use interference between single- and two-photon photocurrent generation pathways in a semiconductor to measure the out-of-loop carrier-envelope-phase noise of a stabilized Ti:sapphire modelocked laser. This solid-state measurement technique exhibits no significant amplitude/phase coupling, adds no measurable phase noise compared to the standard self-referencing technique, and requires few optical components. The method features a built-in balanced detection mechanism that is particularly appealing for dc carrier-envelope-phase measurements.
authors.forename: Peter
authors.initials: P
authors.lastname: Roos
authors.forename: Xiaoqin
authors.initials: X
authors.lastname: Li
authors.forename: Jessica
authors.initials: J
authors.lastname: Pipis
authors.forename: Steven
authors.initials: S
authors.lastname: Cundiff