Measurement of edge verticality of optical recording bits on blu-ray discs using scanning probe microscopy.
This work investigates recording bits on recordable and rewritable blu-ray discs using atomic force microscopy and conducting atomic force microscopy with high contrast, respectively. The geometric structure of the recording bits is clearly observed in images, which, when coupled with cross-section analysis, yields precise bit dimensions, and edge horizontal extended length values. The microscopic results are a valuable reference for increasing the recognition rate of digital signals in optical storage media. Furthermore, such a rapid and convenient measuring mode is an indispensable research tool for developing new recording materials and improving formation mechanisms.
Chen
Sy-Hann
SH
Department of Applied Physics, Institute of Optoelectronics and Solid State Electronics, National Chiayi University, Taiwan, Republic of China. shchen@mail.ncyu.edu.tw
Lin
Wen-Siou
WS
Wang
Wen-Ching
WC