title: Exposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM technique.
abstract: This paper presents a technique to expose and characterize nano-structured hole arrays in tapered photonic crystal fibers. Hole array structures are examined with taper outer diameters ranging from 12.9 microm to 1.6 microm. A combined focused ion beam milling and scanning electron microscope system was used to expose and characterize the arrayed air-silica structures. Results from this combined technique are presented which resolve hole-to-hole pitch sizes and hole diameters in the order of 120 nm and 60 nm, respectively.
authors.forename: B
authors.initials: B
authors.lastname: Gibson
authors.forename: S
authors.initials: S
authors.lastname: Huntington
authors.forename: S
authors.initials: S
authors.lastname: Rubanov
authors.forename: P
authors.initials: P
authors.lastname: Olivero
authors.forename: K
authors.initials: K
authors.lastname: Digweed-Lyytikäinen
authors.forename: J
authors.initials: J
authors.lastname: Canning
authors.forename: J
authors.initials: J
authors.lastname: Love