title: Optical vortex metrology for nanometric speckle displacement measurement.
abstract: As an alternative to correlation-based techniques widely used in conventional speckle metrology, we propose a new technique that makes use of phase singularities in the complex analytic signal of a speckle pattern as indicators of local speckle displacements. The complex analytic signal is generated by vortex filtering the speckle pattern. Experimental results are presented that demonstrate the validity and the performance of the proposed optical vortex metrology with nano-scale resolution.
authors.forename: Wei
authors.initials: W
authors.lastname: Wang
authors.forename: Tomoaki
authors.initials: T
authors.lastname: Yokozeki
authors.forename: Reika
authors.initials: R
authors.lastname: Ishijima
authors.forename: Atsushi
authors.initials: A
authors.lastname: Wada
authors.forename: Yoko
authors.initials: Y
authors.lastname: Miyamoto
authors.forename: Mitsuo
authors.initials: M
authors.lastname: Takeda
authors.forename: Steen G
authors.initials: SG
authors.lastname: Hanson