title: High-fidelity transport of trapped-ion qubits through an X-junction trap array.
abstract: We report reliable transport of (9)Be(+) ions through an "X junction" in a 2D trap array that includes a separate loading and reservoir zone. During transport the ion's kinetic energy in its local well increases by only a few motional quanta and internal-state coherences are preserved. We also examine two sources of energy gain during transport: a particular radio-frequency noise heating mechanism and digital sampling noise. Such studies are important to achieve scaling in a trapped-ion quantum information processor.
authors.affiliation: National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
authors.forename: R B
authors.initials: RB
authors.lastname: Blakestad
authors.forename: C
authors.initials: C
authors.lastname: Ospelkaus
authors.forename: A P
authors.initials: AP
authors.lastname: VanDevender
authors.forename: J M
authors.initials: JM
authors.lastname: Amini
authors.forename: J
authors.initials: J
authors.lastname: Britton
authors.forename: D
authors.initials: D
authors.lastname: Leibfried
authors.forename: D J
authors.initials: DJ
authors.lastname: Wineland