title: Impact of structural deformations on polarization conversion in high index contrast waveguides.
abstract: The objective of this paper is the detailed study of polarization conversion in deformed high index contrast (HIC) waveguides. The type of deformation considered here is the slanted sidewalls of buried channel waveguides. Polarization conversion of HIC waveguides are investigated for possible core refractive indices ranging from 2 (SiN(x)) to 3.5 (Si), by using numerical schemes based on the finite-element and beam propagation methods. The numerical results show that polarization conversion can be greatly magnified in HIC channel waveguides. For example, in Si-wire waveguides, complete polarization conversions can occur within just tens of micrometers.
authors.affiliation: Division of Media and Network Technologies, Hokkaido University, Sapporo 060-0814, Japan. kakihara@icp.ist.hokudai.ac.jp
authors.forename: Kuniaki
authors.initials: K
authors.lastname: Kakihara
authors.forename: Naoya
authors.initials: N
authors.lastname: Kono
authors.forename: Kunimasa
authors.initials: K
authors.lastname: Saitoh
authors.forename: Takeshi
authors.initials: T
authors.lastname: Fujisawa
authors.forename: Masanori
authors.initials: M
authors.lastname: Koshiba
mesh_terms: D004867:Equipment Design; D008962:Models, Theoretical; D055095:Optics and Photonics / Q000295:instrumentation*; D012031:Refractometry / Q000295:instrumentation*; D012825:Silicon / Q000737:chemistry*
chemical_list: D012825:Silicon