Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light.
We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe-surface distance or in the refractive index of the surface.
Albella
P
P
Grupo de Optica, Departamento de Física Aplicada, Facultad de Ciencias Universidad de Cantabria, Avda de los Castros s/n, 39005 Santander, Spain. albellap@unican.es
Saiz
J M
JM
Sanz
J M
JM
González
F
F
Moreno
F
F