Enhanced axial confinement of sum-frequency generation in a temporal focusing setup.
We demonstrate enhanced axial confinement in a temporal focusing setup with a shaped spectrum and a narrow emission filter, achieving a reduction of 1 order of magnitude of the out-of-focus background when compared with conventional point-scanning two-photon microscopy. By rejecting the background in the optical domain, our technique circumvents the noise problems common in other background subtraction techniques.
Durst
Michael E
ME
School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA. med43@cornell.edu
Straub
Adam A
AA
Xu
Chris
C
D007091:Image Processing, Computer-Assisted; D036641:Microscopy, Fluorescence, Multiphoton / Q000295:instrumentation* / Q000379:methods