Differential EXAFS analysis using DEXA.
Differential EXAFS is a new XAS technique dedicated to directly measuring the tiny atomic displacements that arise from such strain-inducing phenomena as magnetostriction, piezoelectricity and thermal expansion. These new experiments have presented the need for new analysis tools to extract and quantify the measured atomic strains, a need that has been addressed by the development of the DEXA code.
Ruffoni
M P
MP
European Synchrotron Radiation Facility, 6 Rue Jules Horowitz, 38043 Grenoble Cedex, France. ruffoni@esrf.fr