title: Enhanced axial confinement of sum-frequency generation in a temporal focusing setup.
abstract: We demonstrate enhanced axial confinement in a temporal focusing setup with a shaped spectrum and a narrow emission filter, achieving a reduction of 1 order of magnitude of the out-of-focus background when compared with conventional point-scanning two-photon microscopy. By rejecting the background in the optical domain, our technique circumvents the noise problems common in other background subtraction techniques.
authors.affiliation: School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA. med43@cornell.edu
authors.forename: Michael E
authors.initials: ME
authors.lastname: Durst
authors.forename: Adam A
authors.initials: AA
authors.lastname: Straub
authors.forename: Chris
authors.initials: C
authors.lastname: Xu
mesh_terms: D007091:Image Processing, Computer-Assisted; D036641:Microscopy, Fluorescence, Multiphoton / Q000295:instrumentation* / Q000379:methods