An optical fiber-taper probe for wafer-scale microphotonic device characterization.
A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3 x 10(6)) and a planar microring (Q = 4.8 x 10(6)).
Michael
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Department of Applied Physics, California Institute of Technology, Pasadena, CA 91125, USA. cmichael@caltech.edu
Borselli
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Johnson
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Chrystal
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Painter
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