title: Ray trace visualization of negative refraction of light in two-dimensional air-bridged silicon photonic crystal slabs at 1.55 microm.
abstract: We demonstrate design, fabrication, and ray trace observation of negative refraction of near-infrared light in a two-dimensional square lattice of air holes etched into an air-bridged silicon slab. Special surface morphologies are designed to reduce the impedance mismatch when light refracts from a homogeneous silicon slab into the photonic crystal slab. We clearly observed negative refraction of infrared light for TE-like modes in a broad wavelength range by using scanning near-field optical microscopy technology. The experimental results are in good agreement with finite-difference time-domain simulations. The results indicate the designed photonic crystal structure can serve as polarization beam splitter.
authors.affiliation: Laboratory of Optical Physics, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, China.
authors.forename: Lin
authors.initials: L
authors.lastname: Gan
authors.forename: Ya-Zhao
authors.initials: YZ
authors.lastname: Liu
authors.forename: Jiang-Yan
authors.initials: JY
authors.lastname: Li
authors.forename: Ze-Bo
authors.initials: ZB
authors.lastname: Zhang
authors.forename: Dao-Zhong
authors.initials: DZ
authors.lastname: Zhang
authors.forename: Zhi-Yuan
authors.initials: ZY
authors.lastname: Li
mesh_terms: D000388:Air; D003198:Computer Simulation; D017076:Computer-Aided Design; D003460:Crystallization / Q000379:methods*; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008904:Miniaturization; D008962:Models, Theoretical; D012031:Refractometry / Q000295:instrumentation* / Q000379:methods*; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D012825:Silicon / Q000737:chemistry*
chemical_list: D012825:Silicon