Optical constant determination of an anisotropic thin film via polarization conversion.
This study presents a simple method for determining the optical constants of an anisotropic thin film. The sensitivity of enhanced polarization conversion reflectance to optical constants is also calculated and analyzed. Based on the sensitivity calculation, the principal indices and columnar tilt angle can be derived from the polarization conversion reflectance angular spectrum.
Jen
Yi-Jun
YJ
Department of Electro-Optical Engineering, National Taipei University of Technology No. 1, Sec. 3, Chung-Hsiao E. Rd. Taipei, Taiwan (106). jyjun@ntut.edu.tw
Peng
Cheng-Yu
CY
Chang
Heng-Hao
HH