title: 4f-derived Fermi surfaces of CeRu2(Si1-xGex)2 near the quantum critical point: resonant soft-X-ray ARPES study.
abstract: Angle-resolved photoelectron spectroscopy in the Ce 3d-->4f excitation region was measured for the paramagnetic state of CeRu2Si2, CeRu2(Si0.82Ge0.18)2, and LaRu2Si2 to investigate the changes of the 4f electron Fermi surfaces around the quantum critical point. While the difference of the Fermi surfaces between CeRu2Si2 and LaRu2Si2 was experimentally confirmed, a strong 4f-electron character was observed in the band structures and the Fermi surfaces of CeRu2Si2 and CeRu2(Si0.82Ge0.18)2, consequently indicating a delocalized nature of the 4f electrons in both compounds. The absence of Fermi surface reconstruction across the critical composition suggests that SDW quantum criticality is more appropriate than local quantum criticality in CeRu2(Si1-xGex)2.
authors.affiliation: Synchrotron Radiation Research Center, Japan Atomic Energy Agency, Hyogo 679-5148, Japan. okanet@spring8.or.jp
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authors.lastname: Okane
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authors.lastname: Ohkochi
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authors.lastname: Takeda
authors.forename: S-i
authors.initials: SI
authors.lastname: Fujimori
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authors.lastname: Yasui
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authors.lastname: Saitoh
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authors.initials: H
authors.lastname: Yamagami
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authors.initials: A
authors.lastname: Fujimori
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authors.initials: Y
authors.lastname: Matsumoto
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authors.lastname: Sugi
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authors.lastname: Kimura
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authors.lastname: Komatsubara
authors.forename: H
authors.initials: H
authors.lastname: Aoki