title: M-lines characterization of selenide and telluride thick films for mid-infrared interferometry.
abstract: Nulling interferometry is an astronomical technique that requires to combine extremely flat wavefronts to achieve a deep rejection ratio in order to detect Earth-like planets in the mid-infrared band [5 - 20 microm]. Similarly to what is done in the near-infrared, high spatial filtering of the incoming beams can be achieved using single-mode waveguides operating in the mid-infrared. An appreciable reduction of the instrumental complexity is also possible using integrated optics (IO) devices in this spectral range. The lack of single-mode guided optics in the mid-infrared has motivated the present technological study to demonstrate the feasibility of dielectric waveguides functioning at longer wavelengths. We propose to use selenide and telluride components to pursue the development of more complex IO functions.
authors.forename: Lucas
authors.initials: L
authors.lastname: Labadie
authors.forename: Caroline
authors.initials: C
authors.lastname: Vigreux-Bercovici
authors.forename: Annie
authors.initials: A
authors.lastname: Pradel
authors.forename: Pierre
authors.initials: P
authors.lastname: Kern
authors.forename: Brahim
authors.initials: B
authors.lastname: Arezki
authors.forename: Jean-Emmanuel
authors.initials: JE
authors.lastname: Broquin