title: Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance.
abstract: We show that nano-mechanical interaction using atomic force microscopy (AFM) can be used to map out mode-patterns of an optical micro-resonator with high spatial accuracy. Furthermore we demonstrate how the Q-factor and center wavelength of such resonances can be sensitively modified by both horizontal and vertical displacement of an AFM tip consisting of either Si(3)N(4) or Si material. With a silicon tip we are able to tune the resonance wavelength by 2.3 nm, and to set Q between values of 615 and zero, by expedient positioning of the AFM tip. We find full on/off switching for less than 100 nm vertical, and for 500 nm lateral displacement at the strongest resonance antinode locations.
authors.forename: W C L
authors.initials: WC
authors.lastname: Hopman
authors.forename: K O
authors.initials: KO
authors.lastname: van der Werf
authors.forename: A J F
authors.initials: AJ
authors.lastname: Hollink
authors.forename: W
authors.initials: W
authors.lastname: Bogaerts
authors.forename: V
authors.initials: V
authors.lastname: Subramaniam
authors.forename: R M
authors.initials: RM
authors.lastname: de Ridder