title: The role of tip size and orientation, tip-surface relaxations and surface impurities in simultaneous AFM and STM studies on the TiO2(110) surface.
abstract: In this work we investigate some of the key factors in simultaneously recorded scanning tunneling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) images of the TiO(2)(110) surface, particularly the role of tip size and orientation in the obtained contrast pattern, and the importance of tip-surface relaxations and surface impurities in measured currents. We show that, while using multi-channel scanning modes provides an increase in physical data from a given measurement and greatly aids in interpretation, it also demands much greater rigor in simulations to provide a complete comparison.
authors.affiliation: Laboratory of Physics, Helsinki University of Technology, PO Box 1100, FIN-02015, Finland.
authors.forename: Henry P
authors.initials: HP
authors.lastname: Pinto
authors.forename: Georg H
authors.initials: GH
authors.lastname: Enevoldsen
authors.forename: Flemming
authors.initials: F
authors.lastname: Besenbacher
authors.forename: Jeppe V
authors.initials: JV
authors.lastname: Lauritsen
authors.forename: Adam S
authors.initials: AS
authors.lastname: Foster