title: Feedback-induced voltage change of a Vertical-Cavity Surface-Emitting Laser as an active detection system for miniature optical scanning probe microscopes.
abstract: We propose a novel detection technique for scanning probe microscopy based on the measuring of the feedback-induced voltage change of 780-nm VCSEL operating at constant current in far-field regime when we modulate mechanically the length of a coupled-cavity generating the feedback conditions. The voltage change of the VCSEL is produced by light back reflected from the sample to the laser cavity. Two-dimensional image probing is successfully demonstrated with high temporal resolution, offering a viable solution for miniature parallel scanning probe optical microscopes, such as confocal microscope, where the use of a photodetector is avoided. This approach opens the possibility to perform imaging tasks in a low cost and hand-held miniature device with much improved effective-space.
authors.forename: Dominique
authors.initials: D
authors.lastname: Heinis
authors.forename: Christophe
authors.initials: C
authors.lastname: Gorecki
authors.forename: Sylwester
authors.initials: S
authors.lastname: Bargiel
authors.forename: Bernard
authors.initials: B
authors.lastname: Cretin