title: Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light.
abstract: We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe-surface distance or in the refractive index of the surface.
authors.affiliation: Grupo de Optica, Departamento de Física Aplicada, Facultad de Ciencias Universidad de Cantabria, Avda de los Castros s/n, 39005 Santander, Spain. albellap@unican.es
authors.forename: P
authors.initials: P
authors.lastname: Albella
authors.forename: J M
authors.initials: JM
authors.lastname: Saiz
authors.forename: J M
authors.initials: JM
authors.lastname: Sanz
authors.forename: F
authors.initials: F
authors.lastname: González
authors.forename: F
authors.initials: F
authors.lastname: Moreno