title: Frequency dependent steering with backward leaky waves via photonic crystal interface layer.
abstract: A Photonic Crystal (PC) with a surface defect layer (made of dimers) is studied in the microwave regime. The dispersion diagram is obtained with the Plane Wave Expansion Method. The dispersion diagram reveals that the dimer-layer supports a surface mode with negative slope. Two facts are noted: First, a guided (bounded) wave is present, propagating along the surface of the dimer-layer. Second, above the light line, the fast traveling mode couple to the propagating spectra and as a result a directive (narrow beam) radiation with backward characteristics is observed and measured. In this leaky mode regime, symmetrical radiation patterns with respect to the normal to the PC surface are attained. Beam steering is observed and measured in a 70 degrees angular range when frequency ranges in the 11.88-13.69 GHz interval. Thus, a PC based surface wave structure that acts as a frequency dependent leaky wave antenna is presented. Angular radiation pattern measurements are in agreement with those obtained via numerical simulations that employ the Finite Difference Time Domain Method (FDTD). Finally, the backward radiation characteristics that in turn suggest the existence of a backward leaky mode in the dimer-layer are experimentally verified using a halved dimer-layer structure.
authors.affiliation: Department of Electrical and Electronics Engineering, Nanotechnology Research Center, Bilkent University, Ankara, Turkey. ecolak@ee.bilkent.edu.tr
authors.forename: Evrim
authors.initials: E
authors.lastname: Colak
authors.forename: Humeyra
authors.initials: H
authors.lastname: Caglayan
authors.forename: Atilla O
authors.initials: AO
authors.lastname: Cakmak
authors.forename: Alessandro D
authors.initials: AD
authors.lastname: Villa
authors.forename: Filippo
authors.initials: F
authors.lastname: Capolino
authors.forename: Ekmel
authors.initials: E
authors.lastname: Ozbay
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D003460:Crystallization / Q000379:methods; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008962:Models, Theoretical; D055096:Optical Devices; D017785:Photons; D012031:Refractometry / Q000295:instrumentation*; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity