High-fidelity transport of trapped-ion qubits through an X-junction trap array.
We report reliable transport of (9)Be(+) ions through an "X junction" in a 2D trap array that includes a separate loading and reservoir zone. During transport the ion's kinetic energy in its local well increases by only a few motional quanta and internal-state coherences are preserved. We also examine two sources of energy gain during transport: a particular radio-frequency noise heating mechanism and digital sampling noise. Such studies are important to achieve scaling in a trapped-ion quantum information processor.
Blakestad
R B
RB
National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Ospelkaus
C
C
VanDevender
A P
AP
Amini
J M
JM
Britton
J
J
Leibfried
D
D
Wineland
D J
DJ