title: Scatterometry-based metrology with feature region signatures matching.
abstract: Scatterometry takes advantage of the sensitivity exhibited by optical diffraction from periodic structures, and hence is an efficient technique for lithographic process monitoring. A feature region measurement algorithm has been developed to extract accurately and quickly the relevant constitutive parameters from diffraction data. It is a method for efficiently determining grating structure by seeking the reflectance at some angles contains more information about the structure of the surface relief profile than the reflectance at other angles in a library data match process. The number of measurements and size of signature matching library will be reduced in a great percentage by performing the feature region algorithm.
authors.forename: Yi-Sha
authors.initials: YS
authors.lastname: Ku
authors.forename: Shih-Chun
authors.initials: SC
authors.lastname: Wang
authors.forename: Deh-Ming
authors.initials: DM
authors.lastname: Shyu
authors.forename: Nigel
authors.initials: N
authors.lastname: Smith