title: Critical behavior of the contact process in annealed scale-free networks.
abstract: The critical behavior of the contact process is studied in annealed scale-free networks by mapping it on the random-walk problem. We obtain the analytic results for the critical scaling using the event-driven dynamics approach. These results are confirmed by numerical simulations. The disorder fluctuation induced by the sampling disorder in annealed networks is also explored. Finally, we discuss over a possible discrepancy of the finite-size-scaling theory in annealed and quenched networks in spirit of the droplet size scale and the linking disorder fluctuation.
authors.affiliation: Department of Physics, University of Seoul, Seoul 130-743, Korea.
authors.forename: Jae Dong
authors.initials: JD
authors.lastname: Noh
authors.forename: Hyunggyu
authors.initials: H
authors.lastname: Park