Characterization of roughness parameters of metallic surfaces using terahertz reflection spectra.
This paper reports on the effect of random Gaussian roughness with rms roughness values of 5-20 microm on the terahertz reflection spectra of metallic aluminum surfaces using Fourier transform IR spectroscopy. By comparing experimental data with a theoretical model based on the Kirchhoff approximation, the rms roughness of a surface is accurately determined. The rms roughness determined by this method is in good agreement with the rms roughness measured using a stylus surface profilometer. In addition, we demonstrate that this method can be used to clearly resolve rough surfaces that differ in rms roughness by approximately 1 microm.
Jagannathan
Arunkumar
A
Submillimeter-Wave Technology Laboratory, Department of Physics, University of Massachusetts Lowell, Lowell, MA 01854, USA. arunkumar_jagannathan@student.uml.edu
Gatesman
Andrew J
AJ
Giles
Robert H
RH