Endface reflectivities of optical nanowires.
Endface reflectivities (ERs) of optical nanowires are investigated using three-dimensional finite-difference time-domain simulations. Typical ERs of both free-standing and substrate-supported silica, tellurite, PMMA and semiconductor nanowires or nanofibers are obtained. Unlike in conventional waveguides such as optical fibers, ERs of nanowires are usually considerably lower when operated in single mode. Dependences of ER on the diameter and the refractive index of the nanowire, and the wavelength of the guided light are also investigated. These results are helpful for estimating and understanding ERs in optical nanowires with diameters close to or smaller than the wavelengths of the light, and may offer valuable references for practical applications such as nanowire or nanofiber-based resonators and lasers.
Wang
Shanshan
S
Department of Optical Engineering, Zhejiang University, Hangzhou 310027, China.
Hu
Zhifang
Z
Yu
Huakang
H
Fang
Wei
W
Qiu
Min
M
Tong
Limin
L
D003198:Computer Simulation; D004867:Equipment Design; D005336:Fiber Optic Technology / Q000379:methods; D021621:Imaging, Three-Dimensional / Q000379:methods; D008027:Light; D036103:Nanotechnology / Q000379:methods; D053770:Nanowires; D055100:Optical Fibers; D055095:Optics and Photonics; D012542:Scattering, Radiation; D012666:Semiconductors; D012822:Silicon Dioxide / Q000737:chemistry; D013691:Tellurium / Q000737:chemistry
D012822:Silicon Dioxide; C026660:tellurous acid; D013691:Tellurium