title: Multiple path length dual polarization interferometry.
abstract: An optical sensor for quantitative analysis of ultrathin films and adsorbed layers is described. Quantification of both layer thickness and refractive index (density) can be made for in situ and ex-situ coated films. With the use of two polarizations, in situ measurements are made via one path length in a young's interferometer arrangement while ex-situ measurements use multiple path lengths. The multiple path length young's interferometer arrangement is embodied in a solid state waveguide configuration called the multiple path length dual polarization interferometer (MPL-DPI). The technique is demonstrated with ultrathin layers of poly(methylmethacrylate) and human serum albumin.
authors: School of Physics and Astronomy, The University of Manchester, Manchester, UK.
authors: Paul D
authors: PD
authors: Coffey
authors: Marcus J
authors: MJ
authors: Swann
authors: Thomas A
authors: TA
authors: Waigh
authors: Fred
authors: F
authors: Schedin
authors: Jian R
authors: JR
authors: Lu
mesh_terms: D000327:Adsorption; D015374:Biosensing Techniques / Q000295:instrumentation* / Q000379:methods; D004563:Electrochemistry / Q000379:methods; D004867:Equipment Design / Q000379:methods; D006801:Humans; D007368:Interferometry / Q000379:methods; D055100:Optical Fibers; D055095:Optics and Photonics; D019904:Polymethyl Methacrylate / Q000737:chemistry; D012542:Scattering, Radiation; D012709:Serum Albumin / Q000737:chemistry*; D012825:Silicon / Q000737:chemistry; D020349:Surface Plasmon Resonance / Q000379:methods
chemical_list: D012709:Serum Albumin; D019904:Polymethyl Methacrylate; D012825:Silicon