title: STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun.
abstract: A spherical aberration-corrected electron microscope has been developed recently, which is equipped with a 300-kV cold field emission gun and an objective lens of a small chromatic aberration coefficient. A dumbbell image of 47 pm spacing, corresponding to a pair of atomic columns of germanium aligned along the [114] direction, is resolved in high-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) with a 0.4-eV energy spread of the electron beam. The observed image was compared with a simulated image obtained by dynamical calculation.
authors: Japan Science and Technology Agency, CREST, 5 Sanbancho, Chiyoda-ku, Tokyo, Japan. hsawada@jeol.co.jp
authors: Hidetaka
authors: H
authors: Sawada
authors: Yasumasa
authors: Y
authors: Tanishiro
authors: Nobuhiro
authors: N
authors: Ohashi
authors: Takeshi
authors: T
authors: Tomita
authors: Fumio
authors: F
authors: Hosokawa
authors: Toshikatsu
authors: T
authors: Kaneyama
authors: Yukihito
authors: Y
authors: Kondo
authors: Kunio
authors: K
authors: Takayanagi
mesh_terms: D008855:Microscopy, Electron, Scanning / Q000295:instrumentation* / Q000379:methods*