title: Terahertz pulse reflective focal-plane tomography.
abstract: An effective terahertz (THz) imaging technology is presented for achieving tomographic image. A THz pulse reflective focal-plane imaging system is built up and the tomographic image of a metallic cross hidden by a high resistivity Si wafer is achieved. Using the reflected pulses from each interface, the thickness of each layer can be calculated with calculation error below 2.5%. This work demonstrates that the THz pulse focal-plane tomography can be used to analysis interior configuration of the object.
authors: Xinke
authors: X
authors: Wang
authors: Ye
authors: Y
authors: Cui
authors: Wenfeng
authors: W
authors: Sun
authors: Yan
authors: Y
authors: Zhang
authors: Cunlin
authors: C
authors: Zhang