Multiple path length dual polarization interferometry.
An optical sensor for quantitative analysis of ultrathin films and adsorbed layers is described. Quantification of both layer thickness and refractive index (density) can be made for in situ and ex-situ coated films. With the use of two polarizations, in situ measurements are made via one path length in a young's interferometer arrangement while ex-situ measurements use multiple path lengths. The multiple path length young's interferometer arrangement is embodied in a solid state waveguide configuration called the multiple path length dual polarization interferometer (MPL-DPI). The technique is demonstrated with ultrathin layers of poly(methylmethacrylate) and human serum albumin.
Coffey
Paul D
PD
School of Physics and Astronomy, The University of Manchester, Manchester, UK.
Swann
Marcus J
MJ
Waigh
Thomas A
TA
Schedin
Fred
F
Lu
Jian R
JR
D000327:Adsorption; D015374:Biosensing Techniques / Q000295:instrumentation* / Q000379:methods; D004563:Electrochemistry / Q000379:methods; D004867:Equipment Design / Q000379:methods; D006801:Humans; D007368:Interferometry / Q000379:methods; D055100:Optical Fibers; D055095:Optics and Photonics; D019904:Polymethyl Methacrylate / Q000737:chemistry; D012542:Scattering, Radiation; D012709:Serum Albumin / Q000737:chemistry*; D012825:Silicon / Q000737:chemistry; D020349:Surface Plasmon Resonance / Q000379:methods
D012709:Serum Albumin; D019904:Polymethyl Methacrylate; D012825:Silicon