Micro knife-edge optical measurement device in a silicon-on-insulator substrate.
The knife-edge method is a commonly used technique to characterize the optical profiles of laser beams or focused spots. In this paper, we present a micro knife-edge scanner fabricated in a silicon-on-insulator substrate using the micro-electromechanical-system technology. A photo detector can be fabricated in the device to allow further integration with on-chip signal conditioning circuitry. A novel backside deep reactive ion etching process is proposed to solve the residual stress effect due to the buried oxide layer. Focused optical spot profile measurement is demonstrated.
Chiu
Yi
Y
Department of Electrical and Control Engineering, National Chiao Tung University, Taiwan, Republic of China. yichiu@mail.nctu.edu.tw
Pan
Jiun-Hung
JH