title: Midinfrared absorption measured at a lambda/400 resolution with an atomic force microscope.
abstract: Midinfrared absorption can be locally measured using a detection combining an atomic force microscope and a pulsed excitation. This is illustrated for the midinfrared bulk GaAs phonon absorption and for the midinfrared absorption of thin SiO(2) microdisks. We show that the signal given by the cantilever oscillation amplitude of the atomic force microscope follows the spectral dependence of the bulk material absorption. The absorption spatial resolution achieved with microdisks is around 50 nanometer for an optical excitation around 22 micrometer wavelength.
authors: Institut d'Electronique Fondamentale, CNRS-University Paris-Sud, Orsay, France.
authors: Julien
authors: J
authors: Houel
authors: Estelle
authors: E
authors: Homeyer
authors: Sébastien
authors: S
authors: Sauvage
authors: Philippe
authors: P
authors: Boucaud
authors: Alexandre
authors: A
authors: Dazzi
authors: Rui
authors: R
authors: Prazeres
authors: Jean-Michel
authors: JM
authors: Ortéga
mesh_terms: D000042:Absorption; D000162:Acoustics; D004867:Equipment Design; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D009991:Oscillometry / Q000379:methods; D012666:Semiconductors; D012822:Silicon Dioxide / Q000737:chemistry; D013055:Spectrophotometry, Infrared / Q000379:methods*; D013499:Surface Properties
chemical_list: D012822:Silicon Dioxide