title: Endface reflectivities of optical nanowires.
abstract: Endface reflectivities (ERs) of optical nanowires are investigated using three-dimensional finite-difference time-domain simulations. Typical ERs of both free-standing and substrate-supported silica, tellurite, PMMA and semiconductor nanowires or nanofibers are obtained. Unlike in conventional waveguides such as optical fibers, ERs of nanowires are usually considerably lower when operated in single mode. Dependences of ER on the diameter and the refractive index of the nanowire, and the wavelength of the guided light are also investigated. These results are helpful for estimating and understanding ERs in optical nanowires with diameters close to or smaller than the wavelengths of the light, and may offer valuable references for practical applications such as nanowire or nanofiber-based resonators and lasers.
authors: Department of Optical Engineering, Zhejiang University, Hangzhou 310027, China.
authors: Shanshan
authors: S
authors: Wang
authors: Zhifang
authors: Z
authors: Hu
authors: Huakang
authors: H
authors: Yu
authors: Wei
authors: W
authors: Fang
authors: Min
authors: M
authors: Qiu
authors: Limin
authors: L
authors: Tong
mesh_terms: D003198:Computer Simulation; D004867:Equipment Design; D005336:Fiber Optic Technology / Q000379:methods; D021621:Imaging, Three-Dimensional / Q000379:methods; D008027:Light; D036103:Nanotechnology / Q000379:methods; D053770:Nanowires; D055100:Optical Fibers; D055095:Optics and Photonics; D012542:Scattering, Radiation; D012666:Semiconductors; D012822:Silicon Dioxide / Q000737:chemistry; D013691:Tellurium / Q000737:chemistry
chemical_list: D012822:Silicon Dioxide; C026660:tellurous acid; D013691:Tellurium