title: Atomic alignment effects for the formation of excimers RgX* (B, C) in the reaction of oriented Rg ((3)P2, M(J) = 2) (Rg = Xe, Kr, Ar) + halogen(X)-containing molecules.
abstract: Atomic alignment effects for the formation of excimers, RgX* (B, Omega = 1/2) and RgX* (C, Omega = 3/2), in the reaction of Rg ((3)P(2)) (Rg = Xe, Kr, Ar) with halogen (X)-containing molecules (RX) (CH(3)I, CF(3)I, CF(3)Br, NF(3), CHBr(3), CHCl(3), CCl(3)F, and CCl(4)) have been measured by using an oriented Rg ((3)P(2), M(J) = 2) atomic beam at a collision energy of approximately 0.07 eV. The emission intensities for RgX* (B, C) have been measured as a function of the magnetic orientation field direction in the collision frame. The reactant (RX) dependence of the atomic alignment effect is extremely different between the RgX* (B) and the RgX* (C) channels. For RgX* (C), an analogous atomic alignment effect is commonly observed despite the difference of RX and Rg. In contrast, for RgX* (B), the atomic alignment effect shows a diverse dependence on RX and Rg.
authors: Department of Chemistry, Graduate School of Science, Osaka University Toyonaka, Osaka 560-0043, Japan. ohyama@chem.sci.osaka-u.ac.jp
authors: H
authors: H
authors: Ohoyama
authors: K
authors: K
authors: Yasuda
authors: T
authors: T
authors: Kasai