title: Near- to far-field imaging of phase evolution of light emanating from a metal nanoslit.
abstract: We report near- to far-field measurement of optical wavefronts emanating from a nanoslit formed in a thin (50 nm thick) Ag film. The evolution of optical phases is imaged using a self-interference technique in conjunction with a scanning probe method. The phase relationship of the slit-transmitted waves with respect to the direct transmission through the thin metal film is quantitatively established. The singular-phase points resulting from the interplay of slit diffraction and surface plasmons are identified in the intermediate-field region.
authors: Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA 15261, USA.
authors: Yun Suk
authors: YS
authors: Jung
authors: Yonggang
authors: Y
authors: Xi
authors: Jeff
authors: J
authors: Wuenschell
authors: Hong Koo
authors: HK
authors: Kim
mesh_terms: D003198:Computer Simulation; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008027:Light; D008670:Metals / Q000737:chemistry*; D008962:Models, Theoretical; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D055096:Optical Devices; D012031:Refractometry / Q000379:methods*; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity
chemical_list: D008670:Metals