title: Photon beam dosimetry in the superficial buildup region using radiochromic EBT film stack.
abstract: It has been a challenge to perform accurate 2D or 3D dosimetry in the surface region with steep dose gradient for megavoltage photon beams. We developed a dosimetry method in the superficial buildup region for the 6 and 15 MV photon beams using a radiochromic EBT film stack. Eight radiochromic EBT film strips (3 x 20 x 0.024 cm3) stacked together formed a 3D dosimeter. The film stack was positioned above a polystyrene phantom and surrounded by Solid Water slabs (0.2 cm) with the top film layer at 100 cm SSD. A 10 x 10 cm2 open field was used to irradiate the film stack with 1000 MU. All films were scanned using Epson 4870 flatbed scanner with transmission mode, 48 bit color, and 150 dpi (0.017 cm pixel resolution). The pixel values were converted to doses using an established calibration curve. This method allowed dose measurement for depths from 0.012 to 0.18 cm with fine spatial resolution (0.017 cm horizontally and 0.024 cm vertically). For each energy modality, we obtained both the central axis percent depth doses and the beam profiles along the central line covering the primary field and peripheral region at each depth. The primary field doses varied steeply with depth, while those in the peripheral region were weakly dependent on depth. For the 6 MV and 15 MV photon beams, (1) the central axis percent depth doses in the eight film layers ranged from 22% to 66% and from 15% to 44%, respectively; (2) the extrapolated percent depth doses at d = 0 were 15% and 14%, respectively. Agreement with the previously reported central axis percent depth doses in this region using parallel plate thin window ion chamber and ultrathin TLD was observed. The percent depth doses and beam profiles data can be incorporated in the treatment planning system for more accurate assessment of the doses to skin and shallow tumors to accomplish more accurate calculation results in the clinical usage.
authors.affiliation: Quality MediPhys LLC, 17 Jade Lane, Denville, New Jersey 07834, USA. soutung@optonline.net
authors.forename: Sou-Tung
authors.initials: ST
authors.lastname: Chiu-Tsao
authors.forename: Maria F
authors.initials: MF
authors.lastname: Chan
mesh_terms: D000465:Algorithms; D005373:Film Dosimetry / Q000295:instrumentation* / Q000379:methods*; D017785:Photons; D011829:Radiation Dosage; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity