title: Quantitative X-ray fluorescence analysis of an Egyptian  faience pendant and comparison with PIXE.
abstract: The X-ray fluorescence (XRF) technique is a common choice in the archaeometric field for in situ investigations with portable instruments. This work shows that XRF portable systems can be used for quantitative analyses using appropriate software, obtaining a similar accuracy to that provided with other techniques such as particle-induced X-ray emission (PIXE), as shown for an Egyptian faience pendant and for two glass standards.
authors.affiliation: Centre de Recherche et de Restauration des Musées de France, C2RMF, CNRS UMR 171, Palais du Louvre, Porte des Lions, 14 quai François Mitterrand, 75001 Paris, France.
authors.forename: L
authors.initials: L
authors.lastname: de Viguerie
authors.forename: A
authors.initials: A
authors.lastname: Duran
authors.forename: A
authors.initials: A
authors.lastname: Bouquillon
authors.forename: V A
authors.initials: VA
authors.lastname: Solé
authors.forename: J
authors.initials: J
authors.lastname: Castaing
authors.forename: P
authors.initials: P
authors.lastname: Walter