Quantitative X-ray fluorescence analysis of an Egyptian  faience pendant and comparison with PIXE.
The X-ray fluorescence (XRF) technique is a common choice in the archaeometric field for in situ investigations with portable instruments. This work shows that XRF portable systems can be used for quantitative analyses using appropriate software, obtaining a similar accuracy to that provided with other techniques such as particle-induced X-ray emission (PIXE), as shown for an Egyptian faience pendant and for two glass standards.
de Viguerie
L
L
Centre de Recherche et de Restauration des Musées de France, C2RMF, CNRS UMR 171, Palais du Louvre, Porte des Lions, 14 quai François Mitterrand, 75001 Paris, France.
Duran
A
A
Bouquillon
A
A
Solé
V A
VA
Castaing
J
J
Walter
P
P