title: Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies.
abstract: A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.
authors.affiliation: Department of Chemistry, and Richard E. Smalley Institute for Nanoscale Science and Technology, Rice University, Houston, Texas 77005, USA.
authors.forename: Anton V
authors.initials: AV
authors.lastname: Naumov
authors.forename: Oleg A
authors.initials: OA
authors.lastname: Kuznetsov
authors.forename: Avetik R
authors.initials: AR
authors.lastname: Harutyunyan
authors.forename: Alexander A
authors.initials: AA
authors.lastname: Green
authors.forename: Mark C
authors.initials: MC
authors.lastname: Hersam
authors.forename: Daniel E
authors.initials: DE
authors.lastname: Resasco
authors.forename: Pavel N
authors.initials: PN
authors.lastname: Nikolaev
authors.forename: R Bruce
authors.initials: RB
authors.lastname: Weisman
mesh_terms: D008163:Luminescent Measurements / Q000379:methods*; D008422:Materials Testing; D018625:Microscopy, Atomic Force / Q000379:methods*; D036103:Nanotechnology / Q000379:methods*; D037742:Nanotubes, Carbon / Q000737:chemistry*; D010316:Particle Size; D012666:Semiconductors; D013499:Surface Properties
chemical_list: D037742:Nanotubes, Carbon