title: Carbon nanotube tips for atomic force microscopy.
abstract: The development of atomic force microscopy (AFM) over the past 20 years has had a major impact on materials science, surface science and various areas of biology, and it is now a routine imaging tool for the structural characterization of surfaces. The lateral resolution in AFM is governed by the shape of the tip and the geometry of the apex at the end of the tip. Conventional microfabrication routes result in pyramid-shaped tips, and the radius of curvature at the apex is typically less than 10 nm. As well as producing smaller tips, AFM researchers want to develop tips that last longer, provide faithful representations of complex surface topographies, and are mechanically non-invasive. Carbon nanotubes have demonstrated considerable potential as AFM tips but they are still not widely adopted. This review traces the history of carbon nanotube tips for AFM, the applications of these tips and research to improve their performance.
authors: Department of Physics, University of Warwick, Coventry, UK.
authors: Neil R
authors: NR
authors: Wilson
authors: Julie V
authors: JV
authors: Macpherson
mesh_terms: D000577:Amides; D004574:Electromagnetic Fields; D018625:Microscopy, Atomic Force / Q000295:instrumentation*; D036103:Nanotechnology; D037742:Nanotubes, Carbon / Q000737:chemistry* / Q000648:ultrastructure; D013499:Surface Properties
chemical_list: D000577:Amides; D037742:Nanotubes, Carbon