title: Force microscopy: on the charge.
abstract: The atomic force microscope has recently been the subject of a series of exciting developments. The latest advance shows that this instrument can measure the charge state of an individual atom.
authors: Department of Mechanical Engineering and the Center for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, CT 06520, USA. udo.schwarz@yale.edu
authors: Udo D
authors: UD
authors: Schwarz