Tip-enhanced Raman spectroscopy of graphite irradiated by focused ion beam.
Tip-enhanced Raman spectroscopy with a spatial resolution of 25 nm is conducted on a sample of graphite that has been exposed to a 50 keV focused Ga ion beam with a diameter of 20 nm. The G mode located at 1579 cm(-1) does not exhibit a measurable tip enhancement, while the D mode at 1364 cm(-1) is significantly enhanced. A method is proposed to calculate the enhancement factor of anisotropic materials due to the electromagnetic field using the measured signal enhancement induced by the tip.
Chan
Tsu-Shin
TS
Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan.
Dvoynenko
Mykhaylo M
MM
Liu
Chih-Yi
CY
Wang
Juen-Kai
JK
Wang
Yuh-Lin
YL