title: Spectroscopic ellipsometry applied to phase transitions in solids: possibilities and limitations.
abstract: The possibilities of in situ spectroscopic ellipsometry applied to phase transitions investigation in oxide thin films and crystals are examined in this work, along with the use of various parameters calculated from ellipsometric data (band gap energy Eg, refractive index n and surface roughness) together with the directly measured main ellipsometric angles psi and Delta, for the detection of phase transitions. The efficiency of spectroscopic ellipsometry on "surface" phase transition and its sensitivity to surface defects are also demonstrated.
authors: Institute of Physics, Academy of Science, Na Slovance 2, 182 21 Prague 8, Czech Republic. dejneka@fzu.cz
authors: Alexandr
authors: A
authors: Dejneka
authors: Ilze
authors: I
authors: Aulika
authors: Vladimir
authors: V
authors: Trepakov
authors: Jaromir
authors: J
authors: Krepelka
authors: Lubomir
authors: L
authors: Jastrabik
authors: Zdenek
authors: Z
authors: Hubicka
authors: Anna
authors: A
authors: Lynnyk
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D008956:Models, Chemical; D044367:Phase Transition; D011208:Powders / Q000737:chemistry*; D012031:Refractometry / Q000379:methods*; D013057:Spectrum Analysis / Q000379:methods*
chemical_list: D011208:Powders