title: Tip-enhanced Raman spectroscopy of graphite irradiated by focused ion beam.
abstract: Tip-enhanced Raman spectroscopy with a spatial resolution of 25 nm is conducted on a sample of graphite that has been exposed to a 50 keV focused Ga ion beam with a diameter of 20 nm. The G mode located at 1579 cm(-1) does not exhibit a measurable tip enhancement, while the D mode at 1364 cm(-1) is significantly enhanced. A method is proposed to calculate the enhancement factor of anisotropic materials due to the electromagnetic field using the measured signal enhancement induced by the tip.
authors: Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 106, Taiwan.
authors: Tsu-Shin
authors: TS
authors: Chan
authors: Mykhaylo M
authors: MM
authors: Dvoynenko
authors: Chih-Yi
authors: CY
authors: Liu
authors: Juen-Kai
authors: JK
authors: Wang
authors: Yuh-Lin
authors: YL
authors: Wang