title: An infrared imaging method for high-throughput combinatorial investigation of hydrogenation-dehydrogenation and new phase formation of thin films.
abstract: We have developed an infrared imaging setup enabling in situ infrared images to be acquired, and expanded on capabilities of an infrared imaging as a high-throughput screening technique, determination of a critical thickness of a Pd capping layer which significantly blocks infrared emission from below, enhancement of sensitivity to hydrogenation and dehydrogenation by normalizing raw infrared intensity of a Mg thin film to an inert reference, rapid and systematic screening of hydrogenation and dehydrogenation properties of a Mg-Ni composition spread covered by a thickness gradient Pd capping layer, and detection of formation of a Mg2Si phase in a Mg thin film on a thermally oxidized Si substrate during annealing.
authors: Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA. h.oguchi@imr.tohoku.ac.jp
authors: H
authors: H
authors: Oguchi
authors: J
authors: J
authors: Hattrick-Simpers
authors: I
authors: I
authors: Takeuchi
authors: E J
authors: EJ
authors: Heilweil
authors: L A
authors: LA
authors: Bendersky