title: Standard random walks and trapping on the Koch network with scale-free behavior and small-world effect.
abstract: A vast variety of real-life networks display the ubiquitous presence of scale-free phenomenon and small-world effect, both of which play a significant role in the dynamical processes running on networks. Although various dynamical processes have been investigated in scale-free small-world networks, analytical research about random walks on such networks is much less. In this paper, we will study analytically the scaling of the mean first-passage time (MFPT) for random walks on scale-free small-world networks. To this end, we first map the classical Koch fractal to a network, called Koch network. According to this proposed mapping, we present an iterative algorithm for generating the Koch network; based on which we derive closed-form expressions for the relevant topological features, such as degree distribution, clustering coefficient, average path length, and degree correlations. The obtained solutions show that the Koch network exhibits scale-free behavior and small-world effect. Then, we investigate the standard random walks and trapping issue on the Koch network. Through the recurrence relations derived from the structure of the Koch network, we obtain the exact scaling for the MFPT. We show that in the infinite network order limit, the MFPT grows linearly with the number of all nodes in the network. The obtained analytical results are corroborated by direct extensive numerical calculations. In addition, we also determine the scaling efficiency exponents characterizing random walks on the Koch network.
authors: School of Computer Science, Shanghai Key Laboratory of Intelligent Information Processing, Fudan University, Shanghai 200433, China. zhangzz@fudan.edu.cn
authors: Zhongzhi
authors: Z
authors: Zhang
authors: Shuigeng
authors: S
authors: Zhou
authors: Wenlei
authors: W
authors: Xie
authors: Lichao
authors: L
authors: Chen
authors: Yuan
authors: Y
authors: Lin
authors: Jihong
authors: J
authors: Guan