Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling.
The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both structures are read out simultaneously. The matched structure displaces with the AFM probe as temperature changes, thus the force applied to the sample can be kept constant without the need for a separate feedback loop for thermal drift compensation, and the differential signal can be used to cancel the shift in zero-force level of the AFM.
Torun
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G. W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, USA.
Finkler
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O
Degertekin
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FL
D004867:Equipment Design; D018625:Microscopy, Atomic Force / Q000295:instrumentation* / Q000379:methods*; D055616:Microtechnology / Q000295:instrumentation* / Q000379:methods*; D013057:Spectrum Analysis / Q000379:methods*; D013696:Temperature