title: Coherence resonance in a unijunction transistor relaxation oscillator.
abstract: The phenomenon of coherence resonance is investigated in an unijunction transistor relaxation oscillator and quantified by estimating the normal variance (NV). Depending on the measuring points, two types of NV curves have been obtained. We have observed that the degradations in coherency at higher noise amplitudes in our system is probably the result of direct interference of coherent oscillations and the stochastic perturbation. Degradation of coherency may be minimal if this direct interference of noise and coherent oscillations is eliminated.
authors: Plasma Physics Division, Saha Institute of Nuclear Physics, Bidhannagar, Kolkata 700064, India. jaman_nonlinear@yahoo.co.in
authors: Md
authors: M
authors: Nurujjaman
authors: P S
authors: PS
authors: Bhattacharya
authors: A N Sekar
authors: AN
authors: Iyengar
authors: Sandip
authors: S
authors: Sarkar