title: Negative spherical aberration ultrahigh-resolution imaging in corrected transmission electron microscopy.
abstract: Aberration-corrected transmission electron microscopy allows us to image the structure of matter at genuine atomic resolution. A prominent role for the imaging of crystalline samples is played by the negative spherical aberration imaging (NCSI) technique. The physical background of this technique is reviewed. The especially high contrast observed under these conditions owes its origin to an enhancing combination of amplitude contrast due to electron diffraction channelling and phase contrast. A number of examples of the application of NCSI are reviewed in order to illustrate the applicability and the state-of-the-art of this technique.
authors.affiliation: Institute of Solid State Research and Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons, Research Centre Jülich, 52425 Jülich, Germany. k.urban@fz-juelich.de
authors.forename: Knut W
authors.initials: KW
authors.lastname: Urban
authors.forename: Chun-Lin
authors.initials: CL
authors.lastname: Jia
authors.forename: Lothar
authors.initials: L
authors.lastname: Houben
authors.forename: Markus
authors.initials: M
authors.lastname: Lentzen
authors.forename: Shao-Bo
authors.initials: SB
authors.lastname: Mi
authors.forename: Karsten
authors.initials: K
authors.lastname: Tillmann