Statistical signatures of random media and their correlation to polarization properties.
A single procedure based on speckle statistics is proposed to identify the scattering origins of light (surface or bulk). Successful results are obtained with high-scattering samples, which offers complementary techniques for imaging or characterization in random media. The speckle statistics are shown to be correlated to partial polarization. Angle-resolved ellipsometric data confirm all conclusions.
Sorrentini
Jacques
J
Institut Fresnel CNRS, Universités d'Aix-Marseille, Ecole Centrale Marseille, Domaine Universitaire de Saint-Jérôme,13397 Marseille Cedex 20, France. jacques.sorrentini@fresnel.fr
Zerrad
Myriam
M
Amra
Claude
C
D008027:Light; D012542:Scattering, Radiation; D013499:Surface Properties