title: White-light scanning interferometer for absolute nano-scale gap thickness measurement.
abstract: A special configuration of white-light scanning interferometer is described for measuring the absolute air gap thickness between two planar plates brought into close proximity. The measured gap is not located in any interference arm of the interferometer, but acts as an amplitude-and-phase modulator of the light source. Compared with the common white-light interferometer our approach avoids the influence of the chromatic dispersion of the planar plates on the gap thickness quantification. It covers a large measurement range of from approximate contact to tens of microns with a high resolution of 0.1 nm. Detailed analytical models are presented and signal-processing algorithms based on convolution and correlation techniques are developed. Practical measurements are carried out and the experimental results match well with the analysis and simulation. Short-time and long-time repeatabilities are both tested to prove the high performance of our method.
authors.affiliation: Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA. zgxu@mit.edu
authors.forename: Zhiguang
authors.initials: Z
authors.lastname: Xu
authors.forename: Vijay
authors.initials: V
authors.lastname: Shilpiekandula
authors.forename: Kamal
authors.initials: K
authors.lastname: Youcef-toumi
authors.forename: Soon Fatt
authors.initials: SF
authors.lastname: Yoon
mesh_terms: D000465:Algorithms; D003198:Computer Simulation; D004867:Equipment Design; D007368:Interferometry / Q000379:methods*; D008027:Light; D008962:Models, Theoretical; D036103:Nanotechnology / Q000379:methods*; D055096:Optical Devices; D055095:Optics and Photonics; D012031:Refractometry / Q000379:methods; D012542:Scattering, Radiation