New correction method for dynamic error in on-line gamma ray thickness detection.
In this paper, we present a new method to correct dynamic error (DE) in on-line gamma ray thickness measurement, which significantly improves measurement precision over traditional method, in most cases, by one order of magnitude. Theoretical analysis of DE is presented and the correction method is proposed. In order to further prove our theory, Monte Carlo simulation is taken and the performance improvement is given. The method has been successfully applied to our thickness measurement system and brought dramatic improvement to its dynamic precision.
Liang
Manchun
M
Key Laboratory of Particle and Radiation Imaging (Ministry of Education), Department of Engineering Physics, Tsinghua University, Beiing, China. lmc@tsinghua.edu.cn
Yi
Hongchang
H
Lin
Qian
Q
D000465:Algorithms; D016477:Artifacts; D015902:Gamma Cameras; D005720:Gamma Rays; D008422:Materials Testing / Q000379:methods*; D012542:Scattering, Radiation