title: Characterization method of birefringent films by guided optical waves.
abstract: A method is presented that gives the thickness, both the ordinary and the extraordinary refractive indices, and the angle between the c axis and the surface of a thin dielectric film by measuring the effective index of TE and TM propagating modes.
authors.forename: O
authors.initials: O
authors.lastname: Parriaux
authors.forename: F
authors.initials: F
authors.lastname: Cochet