title: Optical reflectance technique for observations of submonolayer adsorbed films.
abstract: An optical technique is described for detecting and measuring thicknesses of adsorbed films with subangstrom sensitivity. The technique relies on optical interference from an antireflecting thin-film structure that is predeposited on a transparent cell window: the reflectivity of the window depends linearly on the thickness of the molecular layer adsorbed from the gas in the cell.
authors.forename: V
authors.initials: V
authors.lastname: Daneu
authors.forename: R M
authors.initials: RM
authors.lastname: Osgood
authors.forename: D J
authors.initials: DJ
authors.lastname: Ehrlich