title: Experimental demonstration of high quality MeV ultrafast electron diffraction.
abstract: The simulation optimization and an experimental demonstration of improved performances of mega-electron-volt ultrafast electron diffraction (MeV UED) are reported in this paper. Using ultrashort high quality electron pulses from an S-band photocathode rf gun and a polycrystalline aluminum foil as the sample, we experimentally demonstrated an improved spatial resolution of MeV UED, in which the Debye-Scherrer rings of the (111) and (200) planes were clearly resolved. This result showed that MeV UED is capable to achieve an atomic level spatial resolution and a approximately 100 fs temporal resolution simultaneously, and will be a unique tool for ultrafast structural dynamics studies.
authors.affiliation: Department of Engineering Physics, Tsinghua University, Beijing 100084, People's Republic of China. lrk@mails.thu.edu.cn
authors.forename: Renkai
authors.initials: R
authors.lastname: Li
authors.forename: Chuanxiang
authors.initials: C
authors.lastname: Tang
authors.forename: Yingchao
authors.initials: Y
authors.lastname: Du
authors.forename: Wenhui
authors.initials: W
authors.lastname: Huang
authors.forename: Qiang
authors.initials: Q
authors.lastname: Du
authors.forename: Jiaru
authors.initials: J
authors.lastname: Shi
authors.forename: Lixin
authors.initials: L
authors.lastname: Yan
authors.forename: Xijie
authors.initials: X
authors.lastname: Wang
mesh_terms: D017607:Aluminum Compounds / Q000737:chemistry; D003198:Computer Simulation; D004583:Electrons; D007700:Kinetics; D007834:Lasers; D012542:Scattering, Radiation; D013997:Time Factors; D014466:Ultraviolet Rays; D014961:X-Ray Diffraction / Q000295:instrumentation
chemical_list: D017607:Aluminum Compounds