Measurement of wavelength dependence of the far-field pattern of single-mode optical fibers.
A new method of measuring the far-field pattern of single-mode optical fibers is presented. The method involves measuring the total power passed by a linear aperture in the far field and can be used with a white-light source. The measured far fields can then be used to determine the wavelength variance of characteristics such as the rms spot size (near or far field) and Gaussian-overlap spot size. The Gaussian-overlap spot size measured agrees well with results from both the transverse-offset and the direct far-field methods.
Samson
P J
PJ