title: A fast, direct x-ray detection charge-coupled device.
abstract: A charge-coupled device (CCD) capable of 200 Mpixels/s readout has been designed and fabricated on thick, high-resistivity silicon. The CCDs, up to 600 microm thick, are fully depleted, ensuring good infrared to x-ray detection efficiency, together with a small point spread function. High readout speed, with good analog performance, is obtained by the use of a large number of parallel output ports. A set of companion 16-channel custom readout integrated circuits, capable of 15 bits of dynamic range, is used to read out the CCD. A gate array-controlled back end data acquisition system frames and transfers images, as well as provides the CCD clocks.
authors.affiliation: Engineering Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, California 94720, USA.
authors.forename: P
authors.initials: P
authors.lastname: Denes
authors.forename: D
authors.initials: D
authors.lastname: Doering
authors.forename: H A
authors.initials: HA
authors.lastname: Padmore
authors.forename: J-P
authors.initials: JP
authors.lastname: Walder
authors.forename: J
authors.initials: J
authors.lastname: Weizeorick