title: Emittance characterization of a hot-cavity laser ion source at Holifield Radioactive Ion Beam Facility.
abstract: The first investigation of the transverse emittance of a hot-cavity laser ion source based on all-solid-state Ti:sapphire lasers is presented. The emittances of (63)Cu ion beams generated by three-photon resonant ionization are measured and compared with that of the (69)Ga and (39)K ion beams resulting from surface ionization in the same ion source. A self-consistent unbiased elliptical exclusion method is adapted for noise reduction and emittance analysis. Typical values of the rms and 90% fractional emittances of the Cu ion beams at 20 keV energy are found to be about 2 and 8 pi mm mrad, respectively, for the ion currents of 2-40 nA investigated. The emittances of the laser-produced Cu ion beams are smaller than those of the surface-ionized Ga and K ion beams.
authors.affiliation: Physics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA. liuy@ornl.gov
authors.forename: Y
authors.initials: Y
authors.lastname: Liu
authors.forename: C
authors.initials: C
authors.lastname: Baktash
authors.forename: J R
authors.initials: JR
authors.lastname: Beene
authors.forename: Ch
authors.initials: Ch
authors.lastname: Geppert
authors.forename: T
authors.initials: T
authors.lastname: Gottwald
authors.forename: C C
authors.initials: CC
authors.lastname: Havener
authors.forename: T
authors.initials: T
authors.lastname: Kessler
authors.forename: H F
authors.initials: HF
authors.lastname: Krause
authors.forename: D R
authors.initials: DR
authors.lastname: Schultz
authors.forename: D W
authors.initials: DW
authors.lastname: Stracener
authors.forename: C R
authors.initials: CR
authors.lastname: Vane
authors.forename: K
authors.initials: K
authors.lastname: Wies
authors.forename: K
authors.initials: K
authors.lastname: Wendt