An electrical method for the measurement of the thermal and electrical conductivity of reduced graphene oxide nanostructures.
This paper introduces an electrical four-point measurement method enabling thermal and electrical conductivity measurements of nanoscale materials. The method was applied to determine the thermal and electrical conductivity of reduced graphene oxide flakes. The dielectrophoretically deposited samples exhibited thermal conductivities in the range of 0.14-2.87 W m(-1) K(-1) and electrical conductivities in the range of 6.2 x 10(2)-6.2 x 10(3) Omega(-1) m(-1). The measured properties of each flake were found to be dependent on the duration of the thermal reduction and are in this sense controllable.
Schwamb
Timo
T
Laboratory of Thermodynamics in Emerging Technologies, Institute of Energy Technology, Department of Mechanical and Process Engineering, ETH Zurich, CH-8092 Zurich, Switzerland.
Burg
Brian R
BR
Schirmer
Niklas C
NC
Poulikakos
Dimos
D
D004553:Electric Conductivity; D006108:Graphite / Q000737:chemistry*; D049329:Nanostructures / Q000737:chemistry*; D036103:Nanotechnology / Q000379:methods*; D013814:Thermal Conductivity
D006108:Graphite