A uniaxial tension system and its applications in testing of thin films and small components.
The aim of this investigation is to develop a uniaxial tension system for testing very small samples that allows observation of the gauge section by optical or atomic force microscopy. Major parts of the system consist of a pair of identical piezoelectric actuators, two symmetrical double-cantilevered force sensors, and two symmetrical universal coupling joints. It can accomplish both-end loaded uniaxial tension to produce centrosymmetric deformations of the tested objects in the field of view and can apply tensile loads in the range from 7.8 microN to 15 N to the samples. Sample extensions from submicrometers to 100 microm can be measured with displacement resolution of several tens of nanometers. The system's performance is demonstrated by tests of a polycrystalline aluminum alloy thin sheet, a mica thin sheet, and a fibril of bamboo.
Wu
Wenwang
W
Department of Engineering Mechanics, ALM, Tsinghua University, Beijing 100084, China.
Li
Xide
X
Liu
Liang
L