title: Spatial structure of a focused X-ray beam diffracted from crystals.
abstract: The spatial structure of a beam focused by a planar refractive lens and Bragg diffracted from perfect silicon crystals was experimentally studied at the focal plane using a knife-edge scan and a high-resolution CCD camera. The use of refractive lenses allowed for a detailed comparison with theory. It was shown that diffraction leads to broadening of the focused beam owing to the extinction effect and, for a sufficiently thin crystal, to the appearance of a second peak owing to reflection from the back surface. It was found that the spatial structure of the diffracted beam depends on whether the crystal diffracts strongly (dynamically) or weakly (kinematically). The results help to understand the physical origin of the diffracted intensity recorded in a typical microbeam diffraction experiment.
authors.affiliation: Cornell High Energy Synchrotron Source, Cornell University, Ithaca, NY 14853, USA. ayk7@cornell.edu
authors.forename: A
authors.initials: A
authors.lastname: Kazimirov
authors.forename: V G
authors.initials: VG
authors.lastname: Kohn
authors.forename: A
authors.initials: A
authors.lastname: Snigirev
authors.forename: I
authors.initials: I
authors.lastname: Snigireva
mesh_terms: D018360:Crystallography, X-Ray / Q000379:methods*; D008962:Models, Theoretical; D015394:Molecular Structure; D012825:Silicon / Q000737:chemistry
chemical_list: D012825:Silicon