title: Characterization of layered synthetic microstructure by transmission electron microscopy and diffraction.
abstract: Transmission electron diffraction patterns related to the cross section of layered synthetic microstructures (LSM's) are obtained. By depositing the multilayers onto (111) orientation silicon single-crystal substrates, it is possible to obtain on the same plate both the LSM diffraction pattern and a calibrated one and thus to measure the LSM mean period accurately. Results concerning tungsten-carbon LSM's are presented.
authors.forename: Y
authors.initials: Y
authors.lastname: Lepêtre
authors.forename: G
authors.initials: G
authors.lastname: Rasigni