title: Characterization of the interface between the Hf-based high-k thin film and the Si using spatially resolved electron energy-loss spectroscopy.
abstract: The interfacial structures of HfO(2) and HfAlO thin films on Si have been investigated using spatially resolved electron energy-loss spectroscopy. We have found that interfaces are not atomically sharp, and variation in the symmetry of the local atomic coordination lasts for a couple of monolayers for both the as-deposited HfO(2) and the HfAlO samples. Annealing of the HfO(2) film in the oxygen environment leads to the formation of a thick SiO(2)/SiO(x) stack layer in-between the original HfO(2) and the Si substrate. As a comparison, the interfacial stability is significantly improved by Al incorporation into the HfO(2) film (forming HfAlO), which effectively reduced/eliminated the interfacial silicon oxide formation during the oxygen annealing process. The mechanism of the high-k film/substrate stabilization by Al incorporation is discussed based on the experimental results.
authors.affiliation: Department of Physics, The Chinese University of Hong Kong, Shatin, New Territory, Hong Kong.
authors.forename: X F
authors.initials: XF
authors.lastname: Wang
authors.forename: Quan
authors.initials: Q
authors.lastname: Li
authors.forename: P F
authors.initials: PF
authors.lastname: Lee
authors.forename: J Y
authors.initials: JY
authors.lastname: Dai
authors.forename: X G
authors.initials: XG
authors.lastname: Gong