title: Maximum statistical increase of optical absorption in textured semiconductor films.
abstract: Complete statistical randomization of the direction of propagation of light trapped in semiconductor films can result in a large absorption enhancement. We have employed a calorimetric technique, photothermal deflection spectroscopy, to monitor the absorption of alpha-SiH(x) films textured by the natural lithography process. The observed enhancement factors, as high as 11.5, are consistent with full internal phase-space randomization of the incoming light.
authors.forename: H W
authors.initials: HW
authors.lastname: Deckman
authors.forename: C B
authors.initials: CB
authors.lastname: Roxlo
authors.forename: E
authors.initials: E
authors.lastname: Yablonovitch