title: Tuning the graphene work function by electric field effect.
abstract: We report variation of the work function for single and bilayer graphene devices measured by scanning Kelvin probe microscopy (SKPM). By use of the electric field effect, the work function of graphene can be adjusted as the gate voltage tunes the Fermi level across the charge neutrality point. Upon biasing the device, the surface potential map obtained by SKPM provides a reliable way to measure the contact resistance of individual electrodes contacting graphene.
authors.affiliation: Department of Physics, Columbia University, New York, New York 10027, USA.
authors.forename: Young-Jun
authors.initials: YJ
authors.lastname: Yu
authors.forename: Yue
authors.initials: Y
authors.lastname: Zhao
authors.forename: Sunmin
authors.initials: S
authors.lastname: Ryu
authors.forename: Louis E
authors.initials: LE
authors.lastname: Brus
authors.forename: Kwang S
authors.initials: KS
authors.lastname: Kim
authors.forename: Philip
authors.initials: P
authors.lastname: Kim