Optical reflectance technique for observations of submonolayer adsorbed films.
An optical technique is described for detecting and measuring thicknesses of adsorbed films with subangstrom sensitivity. The technique relies on optical interference from an antireflecting thin-film structure that is predeposited on a transparent cell window: the reflectivity of the window depends linearly on the thickness of the molecular layer adsorbed from the gas in the cell.
Daneu
V
V
Osgood
R M
RM
Ehrlich
D J
DJ