title: Optical characterization of arsenic-doped silica-on-silicon waveguides using femtosecond optical-time-domain-reflectometry techniques.
abstract: Femtosecond OTDR diagnostic techniques are used to investigate the optical properties of arsenic-doped silica-onsilicon waveguides. Results demonstrate that these waveguides have a relatively high refractive index (1.51) and a low loss (<0.5 dB/cm). Owing to the tight optical confinement of the guides, they will have important applications in areas in which high packing densities are required or where direct coupling from semiconductor lasers is needed.
authors.forename: E
authors.initials: E
authors.lastname: McGoldrick
authors.forename: P
authors.initials: P
authors.lastname: Beaud
authors.forename: J
authors.initials: J
authors.lastname: Schutz
authors.forename: W
authors.initials: W
authors.lastname: Hodel
authors.forename: C
authors.initials: C
authors.lastname: Deutsch
authors.forename: N
authors.initials: N
authors.lastname: Thomas
authors.forename: S A
authors.initials: SA
authors.lastname: Hubbard