title: Study of the thickness of liquid layers by moiré deflectometry.
abstract: We suggest and demonstrate a novel method for studying the thickness of thin liquid layers. The method is based on ray-deflection analysis of a beam reflected from the edge of the layer and on studying the topography of the layer.
authors.forename: D
authors.initials: D
authors.lastname: Yogev
authors.forename: S
authors.initials: S
authors.lastname: Efrima
authors.forename: O
authors.initials: O
authors.lastname: Kafri