Face photo-sketch synthesis and recognition.
In this paper, we propose a novel face photo-sketch synthesis and recognition method using a multiscale Markov Random Fields (MRF) model. Our system has three components: 1) given a face photo, synthesizing a sketch drawing; 2) given a face sketch drawing, synthesizing a photo; and 3) searching for face photos in the database based on a query sketch drawn by an artist. It has useful applications for both digital entertainment and law enforcement. We assume that faces to be studied are in a frontal pose, with normal lighting and neutral expression, and have no occlusions. To synthesize sketch/photo images, the face region is divided into overlapping patches for learning. The size of the patches decides the scale of local face structures to be learned. From a training set which contains photo-sketch pairs, the joint photo-sketch model is learned at multiple scales using a multiscale MRF model. By transforming a face photo to a sketch (or transforming a sketch to a photo), the difference between photos and sketches is significantly reduced, thus allowing effective matching between the two in face sketch recognition. After the photo-sketch transformation, in principle, most of the proposed face photo recognition approaches can be applied to face sketch recognition in a straightforward way. Extensive experiments are conducted on a face sketch database including 606 faces, which can be downloaded from our Web site (http://mmlab.ie.cuhk.edu.hk/facesketch.html).
Wang
Xiaogang
X
Department of Electronic Engineering, The Chinese University of Hong Kong, Shatin, Hong Kong. xgwang@ee.cuhk.edu.hk
Tang
Xiaoou
X
D000465:Algorithms; D001185:Artificial Intelligence; D001699:Biometry / Q000379:methods*; D005145:Face / Q000033:anatomy & histology*; D006801:Humans; D007089:Image Enhancement / Q000379:methods; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D010151:Paintings; D010363:Pattern Recognition, Automated / Q000379:methods*; D010781:Photography / Q000379:methods*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D013382:Subtraction Technique; D014584:User-Computer Interface