title: Fast atomic line filter/field ionization detector.
abstract: An experimental demonstration of a fast atomic line filter/field ionization detector (FALF/FID) is presented. The FALF/FID detects incoming signal photons by resonant absorption in an atomic vapor cell containing a strong electric field. Excited atoms are electric-field ionized after further excitation to a Stark-shifted Rydberg level by a pump laser tuned to a resonance in the ionization spectrum, providing an observed enhancement in the ionization rate of ten times over the continuum ionization threshold. Preliminary measurements of time response (<10 nsec) and quantum efficiency (>25%) indicate that with optimization the FALF/FID will provide high quantum efficiency, fast time response, and narrow-linewidth detection.
authors.forename: S H
authors.initials: SH
authors.lastname: Bloom
authors.forename: E
authors.initials: E
authors.lastname: Korevaar
authors.forename: M
authors.initials: M
authors.lastname: Rivers
authors.forename: C S
authors.initials: CS
authors.lastname: Liu