title: Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization.
abstract: We have devised a technique for spectral imaging using accurate ab initio electron energy loss near edge structure (ELNES) data and function field visualization. The technique is initially applied to a planar defect model in Si with different ring structures and no broken bonds where experimental probes are severely limited. The same model with B doping is also considered. It is shown that specific deviations in different energy ranges of the ELNES spectra are correlated with different structural components of the models.
authors.affiliation: Department of Physics, University of Missouri-Kansas City, Kansas City, MO 64110, USA. rulisp@umkc.edu
authors.forename: P
authors.initials: P
authors.lastname: Rulis
authors.forename: A R
authors.initials: AR
authors.lastname: Lupini
authors.forename: S J
authors.initials: SJ
authors.lastname: Pennycook
authors.forename: W Y
authors.initials: WY
authors.lastname: Ching