title: Imaging single atoms using secondary electrons with an aberration-corrected electron microscope.
abstract: Aberration correction has embarked on a new frontier in electron microscopy by overcoming the limitations of conventional round lenses, providing sub-angstrom-sized probes. However, improvement of spatial resolution using aberration correction so far has been limited to the use of transmitted electrons both in scanning and stationary mode, with an improvement of 20-40% (refs 3-8). In contrast, advances in the spatial resolution of scanning electron microscopes (SEMs), which are by far the most widely used instrument for surface imaging at the micrometre-nanometre scale, have been stagnant, despite several recent efforts. Here, we report a new SEM, with aberration correction, able to image single atoms by detecting electrons emerging from its surface as a result of interaction with the small probe. The spatial resolution achieved represents a fourfold improvement over the best-reported resolution in any SEM (refs 10-12). Furthermore, we can simultaneously probe the sample through its entire thickness with transmitted electrons. This ability is significant because it permits the selective visualization of bulk atoms and surface ones, beyond a traditional two-dimensional projection in transmission electron microscopy. It has the potential to revolutionize the field of microscopy and imaging, thereby opening the door to a wide range of applications, especially when combined with simultaneous nanoprobe spectroscopy.
authors.affiliation: Brookhaven National Laboratory, Upton, New York 11973, USA. zhu@bnl.gov
authors.forename: Y
authors.initials: Y
authors.lastname: Zhu
authors.forename: H
authors.initials: H
authors.lastname: Inada
authors.forename: K
authors.initials: K
authors.lastname: Nakamura
authors.forename: J
authors.initials: J
authors.lastname: Wall