Spectroscopic imaging of electron energy loss spectra using ab initio data and function field visualization.
We have devised a technique for spectral imaging using accurate ab initio electron energy loss near edge structure (ELNES) data and function field visualization. The technique is initially applied to a planar defect model in Si with different ring structures and no broken bonds where experimental probes are severely limited. The same model with B doping is also considered. It is shown that specific deviations in different energy ranges of the ELNES spectra are correlated with different structural components of the models.
Rulis
P
P
Department of Physics, University of Missouri-Kansas City, Kansas City, MO 64110, USA. rulisp@umkc.edu
Lupini
A R
AR
Pennycook
S J
SJ
Ching
W Y
WY