title: Line-defect calibration for line-scanning projection display.
abstract: A method of line-defect calibration for line-scanning projection display is developed to accomplish acceptable display uniformity. The line scanning display uses a line modulating imaging and scanning device to construct a two-dimensional image. The inherent line-defects in an imaging device and optical lenses are the most fatal performance-degrading factor that should be overcome to reach the basic display uniformity level. Since the human eye recognizes line defects very easily, a method that perfectly removes line defects is required. Most line imaging devices are diffractive optical devices that require a coherent light source. This particular requirement makes the calibration method of sequential single pixel measurement and correction insufficient to take out the line defects distributed on screen due to optical crosstalk. In this report, we present a calibration method using a recursively converging algorithm that successfully transforms the unacceptable line-defected images into a uniform display image.
authors.affiliation: SOM R&D and Biz. Group, OS division, Samsung Electro-Mechanics Co., Ltd., Suwon 442-743, Korea. seungdo.an@samsung.com
authors.forename: Seungdo
authors.initials: S
authors.lastname: An
authors.forename: Jonghyeong
authors.initials: J
authors.lastname: Song
authors.forename: Anatoliy
authors.initials: A
authors.lastname: Lapchuk
authors.forename: Victor
authors.initials: V
authors.lastname: Yurlov
authors.forename: Seung-Won
authors.initials: SW
authors.lastname: Ryu
authors.forename: Eungju
authors.initials: E
authors.lastname: Kim
authors.forename: Sang Kyeong
authors.initials: SK
authors.lastname: Yun