title: Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities.
abstract: Small polaron carrier density in epitaxial, doped CeO(2) thin films under low oxygen partial pressure was determined from electrochemically-measured capacitance after accounting for interfacial effects and shown to agree well with bulk values.
authors.affiliation: Department of Materials Science, California Institute of Technology, Pasadena, CA 91125, USA.
authors.forename: William C
authors.initials: WC
authors.lastname: Chueh
authors.forename: Sossina M
authors.initials: SM
authors.lastname: Haile