title: Simple extension to the Fabry-Perot technique for accurate measurement of losses in semiconductor waveguides.
abstract: A simple modification to the Fabry-Perot technique for the measurement of semiconductor waveguide losses is described. The modification dispenses with the need for knowing implicitly the reflectivities of end faces of the waveguide, which are usually difficult to ascertain experimentally.
authors.forename: D F
authors.initials: DF
authors.lastname: Clark
authors.forename: M S
authors.initials: MS
authors.lastname: Iqbal