Modeling silicon diode energy response factors for use in therapeutic photon beams.
Silicon diodes have good spatial resolution, which makes them advantageous over ionization chambers for dosimetry in fields with high dose gradients. However, silicon diodes overrespond to low-energy photons, that are more abundant in scatter which increase with large fields and larger depths. We present a cavity-theory-based model for a general response function for silicon detectors at arbitrary positions within photon fields. The model uses photon and electron spectra calculated from fluence pencil kernels. The incident photons are treated according to their energy through a bipartition of the primary beam photon spectrum into low- and high-energy components. Primary electrons from the high-energy component are treated according to Spencer-Attix cavity theory. Low-energy primary photons together with all scattered photons are treated according to large cavity theory supplemented with an energy-dependent factor K(E) to compensate for energy variations in the electron equilibrium. The depth variation of the response for an unshielded silicon detector has been calculated for 5 x 5 cm(2), 10 x 10 cm(2) and 20 x 20 cm(2) fields in 6 and 15 MV beams and compared with measurements showing that our model calculates response factors with deviations less than 0.6%. An alternative method is also proposed, where we show that one can use a correlation with the scatter factor to determine the detector response of silicon diodes with an error of less than 3% in 6 MV and 15 MV photon beams.
Department of Oncology, Radiology and Clinical Immunology, Section of Oncology, Uppsala University, Uppsala, Sweden.
Karin
K
Eklund
Anders
A
Ahnesjö
D003198:Computer Simulation; D004583:Electrons; D004867:Equipment Design; D007700:Kinetics; D015233:Models, Statistical; D008962:Models, Theoretical; D009010:Monte Carlo Method; D010315:Particle Accelerators; D017785:Photons / Q000627:therapeutic use*; D011879:Radiotherapy Dosage; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012825:Silicon / Q000737:chemistry*; D012984:Software; D014867:Water / Q000737:chemistry
D014867:Water; D012825:Silicon