X-ray nanointerferometer based on si refractive bilenses.
We report a novel type of x-ray interferometer employing a bilens system consisting of two parallel compound refractive lenses, each of which creates a diffraction limited beam under coherent illumination. By closely overlapping such coherent beams, an interference field with a fringe spacing ranging from tens of nanometers to tens of micrometers is produced. In an experiment performed with 12 keV x rays, submicron fringes were observed by scanning and moiré imaging of the test grid. The far field interference pattern was used to characterize the x-ray coherence. Our technique opens up new opportunities for studying natural and man-made nanoscale materials.
ESRF, B.P. 220, 38043 Grenoble, France.
A
A
Snigirev
I
I
Snigireva
V
V
Kohn
V
V
Yunkin
S
S
Kuznetsov
M B
MB
Grigoriev
T
T
Roth
G
G
Vaughan
C
C
Detlefs
D007368:Interferometry / Q000295:instrumentation* / Q000379:methods*; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods*; D014965:X-Rays