Simple method for measuring the linewidth enhancement factor of semiconductor lasers by optical injection locking.
A simple method for measuring the linewidth enhancement factor alpha of a semiconductor laser by optical injection locking is described. Without knowledge of the absolute values of detuning and the optical injection level, the value of alpha is evaluated from only changes in optical power in the stable optical injection-locking state. The value of alpha of a 0.83-microm channeled substrate planar laser is evaluated to be 2.65 +/- 0.2. The measurement error of this method is also discussed.
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Iiyama
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Hayashi
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Ida