Application of target partial least squares for analysis of Fourier transform infrared-attenuated total reflection hyperspectral images for characterization of the distribution of crop protection products on the leaf surface.
Target partial least squares (PLS) is applied to Fourier transform infrared-attenuated total reflection (FT-IR-ATR) hyperspectral images of plant leaf surface treated with crop protection products. Detection of active ingredient is demonstrated at application rates of 50 g active ingredient per hectare. This sensitivity could not be achieved without the application of multivariate analysis. Quantitative information appears to be easily recovered through analysis of combined images with known and unknown amounts of active ingredient.
DuPont Crop Protection, Stine-Haskell Research Center, 1090 Elkton Road, Newark, Delaware 19711, USA. Boiana.O.Budevska@usa.dupont.com
Boiana O
BO
Budevska