title: Advancing the hexapole Cs-corrector for the scanning transmission electron microscope.
abstract: Aberration correctors using hexapole fields have proven useful to correct for the spherical aberration in electron microscopy. We investigate the limits of the present design for the hexapole corrector with respect to minimum probe size for the scanning transmission electron microscope and discuss several ways in which the design could be improved by rather small and incremental design changes for the next generation of advanced probe-forming systems equipped with a gun monochromator.
authors.affiliation: Corrected Electron Optical Systems GmbH, Englerstr. 28, D-69126 Heidelberg, Germany. mueller@ceos-gmbh.de
authors.forename: Heiko
authors.initials: H
authors.lastname: Müller
authors.forename: Stephan
authors.initials: S
authors.lastname: Uhlemann
authors.forename: Peter
authors.initials: P
authors.lastname: Hartel
authors.forename: Maximilian
authors.initials: M
authors.lastname: Haider