title: Application of Fresnel diffraction from a phase step to the measurement of film thickness.
abstract: When a thin film that is prepared in a step form on a substrate and coated uniformly with a reflective material is illuminated by a parallel coherent beam of monochromatic light, the Fresnel diffraction fringes are formed on a screen perpendicular to the reflected beam. The visibility of the fringes depends on film thickness, angle of incidence, and light wavelength. Measuring visibility versus incident angle provides the film thickness with an accuracy of a few nanometers. The technique is easily applicable and it covers a wide range of thicknesses with highly reliable results.
authors.affiliation: Department of Physics, University of Tehran, Kargar Shomally Avenue, Tehran 14394-547, Iran. tavasoli@iasbs.ac.ir
authors.forename: Mohammad
authors.initials: M
authors.lastname: Taghi Tavassoly
authors.forename: Iman
authors.initials: I
authors.lastname: Moaddel Haghighi
authors.forename: Khosrow
authors.initials: K
authors.lastname: Hassani