SESAM: exploring the frontiers of electron microscopy.
We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or a transmissivity of the energy filter of T1 ev = 11,000 nm2). New opportunities to do unique experiments that may advance the frontiers of microscopy in areas such as energy-filtered TEM, spectroscopy, energy-filtered electron diffraction and spectroscopic profiling are also discussed.
Koch
Christoph T
CT
Max Planck Institut für Metallforschung, Heisenbergstr. 3, D-70569 Stuttgart, Germany. koch@mf.mpg.de
Sigle
Wilfried
W
Höschen
Rainer
R
Rühle
Manfred
M
Essers
Erik
E
Benner
Gerd
G
Matijevic
Marko
M