Reduction and oxidation of oxide ion conductors with conductive atomic force microscopy.
Local accumulation and dissipation of charges on the surface of oxide ion conductors resulting from electric potentials were observed with conductive atomic force microscopy (AFM). After a negative bias was applied at the tip, a sequence of surface potential maps appeared compatible with electron injection onto the electrolyte surface. Applying a positive bias, in contrast, generated a positive surface charge adjacent to the tip contact area. This observation is consistent with the formation of oxide ion vacancies on the oxide surface. In addition, oxide ion conductivity at a low temperature range (100-200 degrees C) was obtained, and the activation energy for diffusion in gadolinia-doped ceria (GDC) was calculated as approximately 0.56 eV, implying that the majority of oxide ion vacancies diffuse on the surface rather than inside the bulk of the electrolyte.
Lee
Wonyoung
W
Department of Mechanical Engineering, Stanford University, Stanford, CA 94305, USA. leewy@stanford.edu
Lee
Minhwan
M
Kim
Young-Beom
YB
Prinz
Fritz B
FB