title: SESAM: exploring the frontiers of electron microscopy.
abstract: We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or a transmissivity of the energy filter of T1 ev = 11,000 nm2). New opportunities to do unique experiments that may advance the frontiers of microscopy in areas such as energy-filtered TEM, spectroscopy, energy-filtered electron diffraction and spectroscopic profiling are also discussed.
authors.affiliation: Max Planck Institut für Metallforschung, Heisenbergstr. 3, D-70569 Stuttgart, Germany. koch@mf.mpg.de
authors.forename: Christoph T
authors.initials: CT
authors.lastname: Koch
authors.forename: Wilfried
authors.initials: W
authors.lastname: Sigle
authors.forename: Rainer
authors.initials: R
authors.lastname: Höschen
authors.forename: Manfred
authors.initials: M
authors.lastname: Rühle
authors.forename: Erik
authors.initials: E
authors.lastname: Essers
authors.forename: Gerd
authors.initials: G
authors.lastname: Benner
authors.forename: Marko
authors.initials: M
authors.lastname: Matijevic