High-resolution surface-emitting spectrometer and deformation sensors with nonlinear waveguides.
We investigate the limits of frequency resolution attainable in a nonlinear waveguide optical spectrometer, including the effects that are due to surface distortions and waveguide inhomogeneities, and demonstrate that the frequency-resolving capability is directly scalable with the radiating aperture length. The resolution of the waveguide is diffraction limited, and therefore the far-field radiation pattern can be used to characterize the phase variations along the waveguide that are due to surface distortions. The use of this device as a highly sensitive deformation sensor is demonstrated by application of a distortion to the waveguide and confirmation of the far-field diffraction pattern generated.
E
E
Frlan
J S
JS
Wight
S
S
Janz
H
H
Dai
F
F
Chatenoud
M
M
Buchanan
R
R
Normandin