Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing.
We propose a picosecond single-beam open Z-scan experiment in which the usual apertured detection scheme is replaced by a two-dimensional single-shot CCD camera. This enables us to extract the two-dimensional transverse modifications of the whole far-f ield pattern that are due to nonlinear refraction as well as to measure the induced nonlinear phase shift with increased sensitivity compared with that of the conventional Z scan.
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Marcano O
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H
Maillotte
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Gindre
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Métin