High-resolution surface-emitting spectrometer and deformation sensors with nonlinear waveguides.
We investigate the limits of frequency resolution attainable in a nonlinear waveguide optical spectrometer, including the effects that are due to surface distortions and waveguide inhomogeneities, and demonstrate that the frequency-resolving capability is directly scalable with the radiating aperture length. The resolution of the waveguide is diffraction limited, and therefore the far-field radiation pattern can be used to characterize the phase variations along the waveguide that are due to surface distortions. The use of this device as a highly sensitive deformation sensor is demonstrated by application of a distortion to the waveguide and confirmation of the far-field diffraction pattern generated.
Frlan
E
E
Wight
J S
JS
Janz
S
S
Dai
H
H
Chatenoud
F
F
Buchanan
M
M
Normandin
R
R