title: A method to reproduce alpha-particle spectra measured with semiconductor detectors.
abstract: A method is proposed to reproduce alpha-particle spectra measured with silicon detectors, combining analytical and computer simulation techniques. The procedure includes the use of the Monte Carlo method to simulate the tracks of alpha-particles within the source and in the detector entrance window. The alpha-particle spectrum is finally obtained by the convolution of this simulated distribution and the theoretical distributions representing the contributions of the alpha-particle spectrometer to the spectrum. Experimental spectra from (233)U and (241)Am sources were compared with the predictions given by the proposed procedure, showing good agreement. The proposed method can be an important aid for the analysis and deconvolution of complex alpha-particle spectra.
authors.affiliation: Universidad Rey Juan Carlos, 28933 Móstoles-Madrid, Spain. alfonso.fernandez@urjc.es
authors.forename: A Fernández
authors.initials: AF
authors.lastname: Timón
authors.forename: M Jurado
authors.initials: MJ
authors.lastname: Vargas
authors.forename: A Martín
authors.initials: AM
authors.lastname: Sánchez
mesh_terms: D000465:Algorithms; D000512:Alpha Particles; D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D009010:Monte Carlo Method; D011874:Radiometry / Q000295:instrumentation*; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity; D013057:Spectrum Analysis / Q000295:instrumentation*