title: Self-trapping of planar optical beams by use of the photorefractive effect in InP:Fe.
abstract: We demonstrate what we believe to be the first experimental observation of self-trapping and self-deflection of a planar optical beam by the photorefractive effect in a semiconductor. The semiconductor material is indium phosphide doped with iron. We show that the observed focusing and defocusing effects follow the component of the two-wave-mixing space charge field that is in phase with the intensity pattern, whereas the spatial beam deflection effects follow the 90 degrees -shifted component.
authors.forename: M
authors.initials: M
authors.lastname: Chauvet
authors.forename: S A
authors.initials: SA
authors.lastname: Hawkins
authors.forename: G J
authors.initials: GJ
authors.lastname: Salamo
authors.forename: M
authors.initials: M
authors.lastname: Segev
authors.forename: D F
authors.initials: DF
authors.lastname: Bliss
authors.forename: G
authors.initials: G
authors.lastname: Bryant