Soft-x-ray interferometer for single-shot laser linewidth measurements.
A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.
Chilla
J L
JL
Rocca
J J
JJ
Martinez
O E
OE
Marconi
M C
MC