title: Soft-x-ray interferometer for single-shot laser linewidth measurements.
abstract: A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.
authors.forename: J L
authors.initials: JL
authors.lastname: Chilla
authors.forename: J J
authors.initials: JJ
authors.lastname: Rocca
authors.forename: O E
authors.initials: OE
authors.lastname: Martinez
authors.forename: M C
authors.initials: MC
authors.lastname: Marconi