title: Measuring the charge state of point defects on MgO/Ag(001).
abstract: A detailed understanding of surface defects is highly desirable, e.g. to clarify their role as active sites in catalysis. Here localized defects on the surface of MgO films deposited on Ag(001) are investigated. Since the electronic structure of color centers depends on their local position, spectroscopic signals are highly convoluted and often difficult to disentangle. In this study we aimed to obtain morphological and spectroscopic information on single color centers at a microscopic level with frequency modulated dynamic force microscopy (FM-DFM) and scanning tunneling microscopy (STM) in an ultrahigh vacuum and at low temperature. Four of the major and in literature mostly discussed defect types on MgO have been characterized by their charge state and finally identified by the complementary application of FM-DFM and STM in combination with density functional theory results.
authors.affiliation: Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-14195 Berlin, Germany.
authors.forename: T
authors.initials: T
authors.lastname: König
authors.forename: G H
authors.initials: GH
authors.lastname: Simon
authors.forename: H-P
authors.initials: HP
authors.lastname: Rust
authors.forename: G
authors.initials: G
authors.lastname: Pacchioni
authors.forename: M
authors.initials: M
authors.lastname: Heyde
authors.forename: H-J
authors.initials: HJ
authors.lastname: Freund