title: Local analysis of the edge dislocation core in BaTiO(3) thin film by STEM-EELS.
abstract: The a <100> edge dislocation core formed in an epitaxial BaTiO(3) (BTO) thin film grown on a substrate was investigated by scanning transmission electron microscopy combined with electron energy-loss spectroscopy. Elemental analysis using core-loss spectrum indicates that the atomic ratios of O/Ti and Ba/Ti are decreased at the dislocation core. The near-edge fine structure of the oxygen K-edge recorded from the dislocation core differs slightly from that of relaxed BTO region, which suggests that Ba-O bonding is decreased at the dislocation core. The structure of the dislocation core is discussed using a high-angle annular dark-field image and the electron energy-loss spectroscopy results.
authors.affiliation: Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011, Japan. kurata@eels.kuicr.kyoto-u.ac.jp
authors.forename: H
authors.initials: H
authors.lastname: Kurata
authors.forename: S
authors.initials: S
authors.lastname: Isojima
authors.forename: M
authors.initials: M
authors.lastname: Kawai
authors.forename: Y
authors.initials: Y
authors.lastname: Shimakawa
authors.forename: S
authors.initials: S
authors.lastname: Isoda