Probing layer number and stacking order of few-layer graphene by Raman spectroscopy.
Hao
Yufeng
Y
Center for Integrated Circuit Failure Analysis and Reliability (CICFAR), Department of Electrical and Computer Engineering, National University of Singapore, Singapore.
Wang
Yingying
Y
Wang
Lei
L
Ni
Zhenhua
Z
Wang
Ziqian
Z
Wang
Rui
R
Koo
Chee Keong
CK
Shen
Zexiang
Z
Thong
John T L
JT
D004583:Electrons; D006108:Graphite / Q000737:chemistry*; D013059:Spectrum Analysis, Raman / Q000379:methods*
D006108:Graphite