title: Edge enhancement for in-phase focal modulation microscope.
abstract: In-phase focal modulation microscopy (IPFMM) with single photon excited fluorescence is presented. Optical transfer functions and images of thin and thick fluorescent edges in IPFMM are investigated. The results show that, compared with confocal microscopy, using IPFMM can result in a sharper image of the edge, and the edge gradient can be increased up to 75.4% and 58.9% for a thick edge and a thin edge, respectively. Signal level is also discussed, and the results show that, to obtain high transverse resolution with IPFMM, the normalized detector pinhole radius should not exceed 2.8.
authors.affiliation: Graduate School for Integrative Sciences and Engineering, National University of Singapore, 10 Medical Drive, Singapore 117597, Singapore.
authors.forename: Ke
authors.initials: K
authors.lastname: Si
authors.forename: Wei
authors.initials: W
authors.lastname: Gong
authors.forename: Nanguang
authors.initials: N
authors.lastname: Chen
authors.forename: Colin J R
authors.initials: CJ
authors.lastname: Sheppard
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D008856:Microscopy, Fluorescence / Q000295:instrumentation*; D008858:Microscopy, Phase-Contrast / Q000295:instrumentation*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity