Transport and magnetotransport studies on Sol-Gel grown nanostructured La0.7Pb0.3MnO3 manganites.
Sol-Gel synthesis offers relatively inexpensive scale processing of mixed oxide materials with a good control over the stoichiometry and morphology which helps to tailor the required materials on atomic scale to suit specific applications. Nanophasic polycrystalline samples of La0.7Pb0.3MnO3 (LPMO) manganites having perovskite type structure synthesized by novel Sol-Gel technique using acetate precursor route were sintered at various temperatures in the range 950-1150 degrees C for studying the effect of grain size modifications on their structural, transport and magnetotransport properties. X-ray diffraction (XRD) studies show that the samples exhibit rhombohedral structure crystallizing in space group R-3C. Microstructural investigations using Scanning Electronic Microscopy (SEM), Atomic Force Microscopy (AFM) and Lateral Force Microscopy (LFM) measurements reveal the observation of secondary grain growth behavior starting in the sample sintered at 1000 degrees C. The d.c. four probe resistivity measurements with and without applied magnetic field in the temperature range of 2-380 K, show the effect of secondary grain growth on the magnetoresistance (MR) behavior of LPMO manganites. The microstructural studies show the atomic scale engineering at nanoscale which is reflected in the improvement of surface to volume ratio (D(-1)) which in turn modifies the physical properties of samples under investigation. All the samples exhibit resistivity minima at approximately 30 K which can be explained in terms of e-e interaction at 0 Tesla field. There is a correlation between the parameters derived from e-e scattering model and the secondary grain growth present in the samples. The results of the microstructural and MR measurements on the nanostructured LPMO manganites have been discussed in detail.
Solanki
P S
PS
Department of Physics, GUJCOST Center of Excellence in Nanomaterials, Saurashtra University, Rajkot 360005, India.
Doshi
R R
RR
Thaker
C M
CM
Pandya
Swati
S
Ganesan
V
V
Kuberkar
D G
DG
D008422:Materials Testing; D018625:Microscopy, Atomic Force; D008855:Microscopy, Electron, Scanning; D049329:Nanostructures / Q000737:chemistry; D019904:Polymethyl Methacrylate; D014961:X-Ray Diffraction
D019904:Polymethyl Methacrylate