title: Probing layer number and stacking order of few-layer graphene by Raman spectroscopy.
authors.affiliation: Center for Integrated Circuit Failure Analysis and Reliability (CICFAR), Department of Electrical and Computer Engineering, National University of Singapore, Singapore.
authors.forename: Yufeng
authors.initials: Y
authors.lastname: Hao
authors.forename: Yingying
authors.initials: Y
authors.lastname: Wang
authors.forename: Lei
authors.initials: L
authors.lastname: Wang
authors.forename: Zhenhua
authors.initials: Z
authors.lastname: Ni
authors.forename: Ziqian
authors.initials: Z
authors.lastname: Wang
authors.forename: Rui
authors.initials: R
authors.lastname: Wang
authors.forename: Chee Keong
authors.initials: CK
authors.lastname: Koo
authors.forename: Zexiang
authors.initials: Z
authors.lastname: Shen
authors.forename: John T L
authors.initials: JT
authors.lastname: Thong
mesh_terms: D004583:Electrons; D006108:Graphite / Q000737:chemistry*; D013059:Spectrum Analysis, Raman / Q000379:methods*
chemical_list: D006108:Graphite