title: Wavelength and intensity dependence of short pulse laser xenon double ionization between 500 and 2300 nm.
abstract: The wavelength and intensity dependence of xenon ionization with 50 fs laser pulses has been studied using time-of-flight mass spectrometry. We compare the ion yield distribution of singly and doubly charged xenon with the Perelomov-Popov-Terent'ev (PPT) theory, Perelomov, Popov, and Terent'ev, Zh. Eksp. Teor. Fiz. 50, 1393 (1966) [Sov. Phys. JETP 23, 924 (1966)], in the regime between 500 and 2300 nm. The intensity dependence for each wavelength is measured in a range between 1 x 10(13) and 1 x 10(15) W/cm2. The Xe+-ion signal is in good agreement with the PPT theory at all used wavelengths. In addition we demonstrate that ionic 5s5p6 2S state is excited by an electron impact excitation process and contributes to the nonsequential double ionization process.
authors.affiliation: Centre d'Optique, Photonique et Laser, Université Laval, Pavillon d'optique-photonique Québec (Québec), Canada, G1V 0A6.
authors.forename: G
authors.initials: G
authors.lastname: Gingras
authors.forename: A
authors.initials: A
authors.lastname: Tripathi
authors.forename: B
authors.initials: B
authors.lastname: Witzel