title: Extending the depth of focus for enhanced three-dimensional imaging and profilometry: an overview.
abstract: We overview the benefits that extended depth of focus technology may provide for three-dimensional imaging and profilometry. The approaches for which the extended depth of focus benefits are being examined include stereoscopy, light coherence, pattern projection, scanning line, speckles projection, and projection of axially varied shapes.
authors: School of Engineering, Bar-Ilan University, Ramat-Gan, 52900 Israel.
authors: Alex
authors: A
authors: Zlotnik
authors: Shai
authors: S
authors: Ben-Yaish
authors: Zeev
authors: Z
authors: Zalevsky