title: Thickness-induced resonance-based complex permittivity measurement technique for barium strontium titanate ceramics at microwave frequency.
abstract: Thickness-induced resonance would be the major factor of uncertainty for complex permittivity measurement by using transmission/reflection method when the thickness of sample is several integer multiples of the half wavelength. A new technique for complex permittivity measurement was presented in this paper using the thickness-induced resonance for barium strontium titanate (BST) ceramics at microwave frequency. Simulated and experimental results show that there are some resonance peaks on the transmittance versus frequency curve and the complex permittivity can be calculated from the resonance.
authors: Electronic Materials Research Laboratory, Xi'an Jiaotong University, Xi'an 710049, People's Republic of China.
authors: Song
authors: S
authors: Xia
authors: Zhuo
authors: Z
authors: Xu
authors: Xiaoyong
authors: X
authors: Wei