title: Improving a high-resolution fiber-optic interferometer through deposition of a TiO2 reflective coating by simple dip-coating.
abstract: Fiber-optic based interferometers are used to detect small displacements, down to the subnanometer range. Coating the end of the optical fiber with a partially reflecting thin film greatly improves the resolution of interferometers by increasing the multiple reflections between the fiber end and the measured object. In this work, we present a quick and easy thin film deposition technique to coat the end of a single optical fiber by dip-coating a metal-organic precursor, which is then decomposed in a propane flame. The coated fiber was tested for morphology and usefulness for interferometric application. We found that this coating technique is much faster and easier than conventional thin coating techniques, and yields results that are comparable or better than can be achieved with sputtering or thermal evaporation.
authors: Department of Physics and Astronomy, Wayne State University, Detroit, Michigan 48201, USA.
authors: Venkatesh
authors: V
authors: Subba-Rao
authors: Chandran
authors: C
authors: Sudakar
authors: Jason
authors: J
authors: Esmacher
authors: Mircea
authors: M
authors: Pantea
authors: Ratna
authors: R
authors: Naik
authors: Peter M
authors: PM
authors: Hoffmann