Rapid Mueller matrix polarimetry based on parallelized polarization state generation and detection.
We present rapid Mueller matrix polarimetry that can extract twelve Muller matrix elements from a single intensity image in real time and with high spatial resolution. This is achieved by parallelizing the respective polarization state generation and polarization state detection processes, which in existing polarimeters is performed sequentially. Parallelization of the polarization state generation process is accomplished through the use of vector beams, for which this work represents a new application domain. Polarization state detection is parallelized by uniquely combining a microscope/array detector setup with a specialized algorithm that simultaneously utilizes information from multiple spatial regions of the array detector. Simulated results applying this technique to two anisotropic samples including metamaterial yield material parameters that are consistent with those reported in the literature.
Tripathi
Santosh
S
Department of Electrical and Computer Engineering, University of Illinois Urbana-Champaign, Urbana, IL 61801, USA.
Toussaint
Kimani C
KC
D000465:Algorithms; D016880:Anisotropy; D003198:Computer Simulation; D004867:Equipment Design; D008027:Light; D008422:Materials Testing; D008853:Microscopy / Q000379:methods; D008859:Microscopy, Polarization / Q000379:methods*; D008962:Models, Theoretical; D049329:Nanostructures; D036103:Nanotechnology / Q000379:methods*; D055095:Optics and Photonics