title: Molecular depth profiling with cluster secondary ion mass spectrometry and wedges.
abstract: Secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by 40 keV C(60)(+) bombardment of a 395 nm thin film of Irganox 1010 doped with four delta layers of Irganox 3114. The wedge structure creates a laterally magnified cross section of the film. From an examination of the resulting surface, information about depth resolution, topography, and erosion rate can be obtained as a function of crater depth in a single experiment. This protocol provides a straightforward way to determine the parameters necessary to characterize molecular depth profiles and to obtain an accurate depth scale for erosion experiments.
authors.forename: Dan
authors.initials: D
authors.lastname: Mao
authors.forename: Andreas
authors.initials: A
authors.lastname: Wucher
authors.forename: Nicholas
authors.initials: N
authors.lastname: Winograd
mesh_terms: D002084:Butylated Hydroxytoluene / Q000031:analogs & derivatives; D013058:Mass Spectrometry / Q000379:methods*; D008567:Membranes, Artificial; D018625:Microscopy, Atomic Force / Q000379:methods*
chemical_list: D008567:Membranes, Artificial; D002084:Butylated Hydroxytoluene