title: The effect of nitric acid (HNO3) on growth, spectral, thermal and dielectric properties of triglycine sulphate (TGS) crystal.
abstract: The effect of nitric acid (HNO(3)) addition on the growth of triglycine sulphate (TGS) crystal has been studied from the aqueous solution for various concentrations of nitric acid. Significant changes in the crystal size and morphology have been observed in all the grown samples. Single crystal and powder X-ray diffraction analyses confirm the structure and cell parameter values of pure and HNO(3) doped TGS crystals. FT-Raman and FTIR spectra confirm the characteristics absorption bands of pure and HNO(3) doped TGS crystals. The composition of TGS crystals have been confirmed by CHNS analysis. Physical properties such as thermal, dielectric and mechanical studies have been performed for the pure and HNO(3) doped TGS crystals. The dielectric constants of the crystals have been studied as a function of frequency. The results suggest that the HNO(3) is doped into TGS crystal and that the doping increases its dielectric constant.
authors.affiliation: Department of Physics, Periyar University, Salem 636011, India.
authors.forename: R
authors.initials: R
authors.lastname: Parimaladevi
authors.forename: C
authors.initials: C
authors.lastname: Sekar
authors.forename: V
authors.initials: V
authors.lastname: Krishnakumar
mesh_terms: D003460:Crystallization; D018360:Crystallography, X-Ray; D017942:Nitric Acid / Q000494:pharmacology*; D009842:Oligopeptides / Q000138:chemical synthesis* / Q000737:chemistry*; D017550:Spectroscopy, Fourier Transform Infrared; D013059:Spectrum Analysis, Raman; D013457:Sulfur Compounds / Q000138:chemical synthesis* / Q000737:chemistry*; D013818:Thermogravimetry; D014961:X-Ray Diffraction
chemical_list: D009842:Oligopeptides; D013457:Sulfur Compounds; D017942:Nitric Acid; C035647:glycyl-glycyl-glycine