Concept of a spectrometer for resonant inelastic X-ray scattering with parallel detection in incoming and outgoing photon energies.
A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver a full two-dimensional map of RIXS intensity in one shot with parallel detection at incoming hv(in) and outgoing hv(out) photon energies. Preliminary ray-tracing simulations with a typical undulator beamline demonstrate a resolving power well above 11000 with both hv(in) and hv(out) near 930 eV, with a vast potential for improvement. Combining this instrument - nicknamed hv(2) spectrometer - with an X-ray free-electron laser source simplifies its technical implementation and enables efficient time-resolved RIXS experiments.
Strocov
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VN
Swiss Light Source, Paul Scherrer Institute, 5232 Villigen-PSI, Switzerland. vladimir.strocov@psi.ch
D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D017785:Photons; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity; D017356:Synchrotrons / Q000295:instrumentation*; D014159:Transducers; D056928:X-Ray Absorption Spectroscopy / Q000295:instrumentation*; D014965:X-Rays