title: Calculation of femtosecond pulse laser induced damage threshold for broadband antireflective microstructure arrays.
abstract: In order to more exactly predict femtosecond pulse laser induced damage threshold, an accurate theoretical model taking into account photoionization, avalanche ionization and decay of electrons is proposed by comparing respectively several combined ionization models with the published experimental measurements. In addition, the transmittance property and the near-field distribution of the 'moth eye' broadband antireflective microstructure directly patterned into the substrate material as a function of the surface structure period and groove depth are performed by a rigorous Fourier model method. It is found that the near-field distribution is strongly dependent on the periodicity of surface structure for TE polarization, but for TM wave it is insensitive to the period. What's more, the femtosecond pulse laser damage threshold of the surface microstructure on the pulse duration taking into account the local maximum electric field enhancement was calculated using the proposed relatively accurate theoretical ionization model. For the longer incident wavelength of 1064 nm, the weak linear damage threshold on the pulse duration is shown, but there is a surprising oscillation peak of breakdown threshold as a function of the pulse duration for the shorter incident wavelength of 532 nm.
authors.affiliation: Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, PR China. jingxufeng_1984@yahoo.com.cn
authors.forename: Xufeng
authors.initials: X
authors.lastname: Jing
authors.forename: Jianda
authors.initials: J
authors.lastname: Shao
authors.forename: Junchao
authors.initials: J
authors.lastname: Zhang
authors.forename: Yunxia
authors.initials: Y
authors.lastname: Jin
authors.forename: Hongbo
authors.initials: H
authors.lastname: He
authors.forename: Zhengxiu
authors.initials: Z
authors.lastname: Fan
mesh_terms: D003198:Computer Simulation; D004307:Dose-Response Relationship, Radiation; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007834:Lasers; D008420:Manufactured Materials / Q000528:radiation effects*; D008962:Models, Theoretical; D011829:Radiation Dosage