title: Application of surface chemical analysis tools for characterization of nanoparticles.
abstract: The important role that surface chemical analysis methods can and should play in the characterization of nanoparticles is described. The types of information that can be obtained from analysis of nanoparticles using Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (TOF-SIMS), low-energy ion scattering (LEIS), and scanning-probe microscopy (SPM), including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), are briefly summarized. Examples describing the characterization of engineered nanoparticles are provided. Specific analysis considerations and issues associated with using surface-analysis methods for the characterization of nanoparticles are discussed and summarized, with the impact that shape instability, environmentally induced changes, deliberate and accidental coating, etc., have on nanoparticle properties.
authors.affiliation: Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA 99352, USA. don.baer@pnl.gov
authors.forename: D R
authors.initials: DR
authors.lastname: Baer
authors.forename: D J
authors.initials: DJ
authors.lastname: Gaspar
authors.forename: P
authors.initials: P
authors.lastname: Nachimuthu
authors.forename: S D
authors.initials: SD
authors.lastname: Techane
authors.forename: D G
authors.initials: DG
authors.lastname: Castner
mesh_terms: D018625:Microscopy, Atomic Force / Q000379:methods; D020527:Microscopy, Scanning Probe / Q000379:methods; D016252:Microscopy, Scanning Tunneling / Q000379:methods; D053758:Nanoparticles / Q000032:analysis* / Q000737:chemistry / Q000648:ultrastructure; D036103:Nanotechnology / Q000379:methods*; D056951:Photoelectron Spectroscopy / Q000379:methods; D018629:Spectrometry, Mass, Secondary Ion / Q000379:methods; D013499:Surface Properties