Investigation of electrooptic modulator disruption by microwave-induced transients.
This paper presents a detailed investigation of the physical mechanisms underlying the disruption of a lithium niobate electrooptic modulator by RF pulses. It is shown that short-term modulator disruption is a direct consequence of resistive heating within the metal conductor of the coplanar waveguide electrode, which leads to a thermo-optic optical phase shift in the waveguides of the modulator. Resistive heating is also shown to contribute to permanent modulator damage at higher RF power. These results indicate that short-term RF disruption, and possibly RF damage, can be mitigated through improved thermal management. They also predict that short-term photonic link disruption can be reduced, if not eliminated, by use of a phase modulated photonic link.
Schermer
Ross T
RT
U.S. Naval Research Laboratory, 4555 Overlook Avenue, SW, Washington, D.C. 20375, USA.
Bucholtz
Frank
F
Villarruel
Carl A
CA
Gil Gil
Jesus
J
Andreadis
Tim D
TD
Williams
Keith J
KJ
D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D008872:Microwaves; D009556:Niobium / Q000737:chemistry* / Q000528:radiation effects*; D055096:Optical Devices; D010087:Oxides / Q000737:chemistry* / Q000528:radiation effects*; D012031:Refractometry / Q000295:instrumentation*; D013685:Telecommunications / Q000295:instrumentation*
D010087:Oxides; D009556:Niobium; C091692:lithium niobate