New developments in interferometry.
This article is based on a series of talks presented by personnel of The Perkin-Elmer Corporation at a symposium held in September 1967 and thereafter brought up to date for inclusion in the APPLIED OPTICS feature discussing Interferometry vs Spectroscopy.
Polster
H D
HD
Pastor
J
J
Scott
R M
RM
Crane
R
R
Langenbeck
P H
PH
Pilston
R
R
Steinberg
G
G