title: Axial twist and planar inversion interferometers.
abstract: The theoretical background for a type of common path interferometer, the so-called axial twist interferometer, is discussed. Two devices capable of producing axially twisted bundles of rays are illustrated. Applications of the system are suggested with particular reference to interference microscopy. A simpler, related device, the planar inversion interferometer, is also described, and the characteristics and applicability of the two instruments are compared.
authors.affiliation: Eidgenassiches Institut für Reaktorforschung,CH-5303 Würenlingen, Switzerland.
authors.forename: R
authors.initials: R
authors.lastname: Alpiar