title: New developments in interferometry.
abstract: This article is based on a series of talks presented by personnel of The Perkin-Elmer Corporation at a symposium held in September 1967 and thereafter brought up to date for inclusion in the APPLIED OPTICS feature discussing Interferometry vs Spectroscopy.
authors.forename: H D
authors.initials: HD
authors.lastname: Polster
authors.forename: J
authors.initials: J
authors.lastname: Pastor
authors.forename: R M
authors.initials: RM
authors.lastname: Scott
authors.forename: R
authors.initials: R
authors.lastname: Crane
authors.forename: P H
authors.initials: PH
authors.lastname: Langenbeck
authors.forename: R
authors.initials: R
authors.lastname: Pilston
authors.forename: G
authors.initials: G
authors.lastname: Steinberg