title: Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope.
abstract: We present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions.
authors.affiliation: Centro de Investigaciones en Optica, A.C., Loma del Bosque 115, Lomas del Campestre, León, Guanajuato, México 37150.
authors.forename: J Mauricio
authors.initials: JM
authors.lastname: Flores
authors.forename: Moisés
authors.initials: M
authors.lastname: Cywiak
authors.forename: Fernando
authors.initials: F
authors.lastname: Mendoza