title: Determination of the optical properties of thin films from single-angle reflectance measurements.
abstract: A method is described for determining the refractive index and thickness of thin films using data from single-angle measurements of the intensity of linearly polarized light reflected from a growing film.
authors.forename: D L
authors.initials: DL
authors.lastname: Pulfrey
authors.forename: J J
authors.initials: JJ
authors.lastname: Reche