title: Measuring near-field nanoparticle concentration profiles by correlating surface plasmon resonance reflectance with effective refractive index of nanofluids.
abstract: Time-dependent and near-field nanoparticle concentrations are determined by correlating the surface plasmon resonance (SPR) reflectance intensities with the effective refractive index (ERI) of the nanofluid under evaporation. A critical angle measurement for total internal reflection identifies the ERI of the nanofluid at different nanoparticle concentrations. The corresponding SPR reflectance intensities correlate the nanofluidic ERI with the nanoparticle concentrations. Example applications for evaporating nanofluidic droplets containing 47 nmAl(2)O(3) particles demonstrate the feasibility of this new imaging tool for measuring time-resolved and full-field nanoparticle concentration profiles.
authors.affiliation: Department of Mechanical, Aerospace, and Biomedical Engineering, University of Tennessee,Knoxville, Tennessee 37996, USA.
authors.forename: Iltai
authors.initials: I
authors.lastname: Kim
authors.forename: Kenneth D
authors.initials: KD
authors.lastname: Kihm
mesh_terms: D000537:Aluminum Oxide / Q000737:chemistry; D003460:Crystallization; D004867:Equipment Design; D008422:Materials Testing; D053758:Nanoparticles / Q000737:chemistry; D049329:Nanostructures; D036103:Nanotechnology / Q000379:methods*; D055095:Optics and Photonics; D010316:Particle Size; D012031:Refractometry; D020349:Surface Plasmon Resonance / Q000379:methods*; D013499:Surface Properties; D013997:Time Factors
chemical_list: D000537:Aluminum Oxide