Diffractographic dimensional measurement. Part 1: displacement measurement.
This is the first of a two-part paper on measurement of displacement and profile using changes in the farfield diffraction patterns of a slit aperture formed between a test and reference object. When applied to displacement measurement the method is very accurate over a considerable range, noncontacting, linear, and easy to use. In addition to the measurement considerations involved in this diffractographic technique, three unique applications are discussed. These are: simultaneous deflection measurement along a line, deflection measurement of a surface relative to an edge, and vibration amplitude measurement using time-averaged fringes.
Pryor
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Hageniers
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North
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