Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics.
A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics.
Kewish
Cameron M
CM
Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland. Cameron.Kewish@psi.ch
Thibault
Pierre
P
Dierolf
Martin
M
Bunk
Oliver
O
Menzel
Andreas
A
Vila-Comamala
Joan
J
Jefimovs
Konstantins
K
Pfeiffer
Franz
F