title: Influence of multiple scattering on subwavelength imaging: transverse electric case.
abstract: This paper uses the Cramér-Rao bound (CRB) to investigate the role of multiple scattering in the framework of transverse electric (TE) electromagnetic inverse scattering. The surface mode in the TE scattering case enables a strong multiple scattering effect even if the scatterers are widely separated. We show that multiple scattering does not always improve the accuracy of the estimation, compared with that expected with a fictitious single scattering model. The reason for the aforementioned conclusion is discussed. Two scenarios that favor the multiple scattering effect are discussed, and the differences between these scenarios and the CRB analysis are highlighted.
authors.affiliation: Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576. elechenx@nus.edu.sg
authors.forename: Xudong
authors.initials: X
authors.lastname: Chen
authors.forename: Yu
authors.initials: Y
authors.lastname: Zhong
mesh_terms: D000465:Algorithms; D007090:Image Interpretation, Computer-Assisted / Q000379:methods; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D015233:Models, Statistical; D008962:Models, Theoretical; D055095:Optics and Photonics; D011827:Radiation; D012031:Refractometry / Q000379:methods; D015203:Reproducibility of Results; D012542:Scattering, Radiation