title: Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics.
abstract: A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics.
authors.affiliation: Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland. Cameron.Kewish@psi.ch
authors.forename: Cameron M
authors.initials: CM
authors.lastname: Kewish
authors.forename: Pierre
authors.initials: P
authors.lastname: Thibault
authors.forename: Martin
authors.initials: M
authors.lastname: Dierolf
authors.forename: Oliver
authors.initials: O
authors.lastname: Bunk
authors.forename: Andreas
authors.initials: A
authors.lastname: Menzel
authors.forename: Joan
authors.initials: J
authors.lastname: Vila-Comamala
authors.forename: Konstantins
authors.initials: K
authors.lastname: Jefimovs
authors.forename: Franz
authors.initials: F
authors.lastname: Pfeiffer