title: Reduction of hysteresis for carbon nanotube mobility measurements using pulsed characterization.
abstract: We describe a pulsed measurement technique for suppressing hysteresis for carbon nanotube (CNT) device measurements in air, vacuum, and over a wide temperature range (80-453 K). Varying the gate pulse width and duty cycle probes the relaxation times associated with charge trapping near the CNT, found to be up to the 0.1-10 s range. Longer off times between voltage pulses enable consistent, hysteresis-free measurements of CNT mobility. A tunneling front model for charge trapping and relaxation is also described, suggesting trap depths up to 4-8 nm for CNTs on SiO2. Pulsed measurements will also be applicable for other nanoscale devices such as graphene, nanowires, or molecular electronics, and could enable probing trap relaxation times in a variety of material system interfaces.
authors.affiliation: Department of Electrical and Computer Engineering, Micro and Nanotechnology Laboratory, University of Illinois, Urbana-Champaign, IL 61801, USA.
authors.forename: David
authors.initials: D
authors.lastname: Estrada
authors.forename: Sumit
authors.initials: S
authors.lastname: Dutta
authors.forename: Albert
authors.initials: A
authors.lastname: Liao
authors.forename: Eric
authors.initials: E
authors.lastname: Pop