Electron spectra line shape analysis of highly oriented pyrolytic graphite and nanocrystalline diamond.
The X-ray excited Auger electron spectroscopy (XAES), X-ray photoelectron spectroscopy (XPS) and elastic peak electron spectroscopy (EPES) methods were applied in investigating samples of nanocrystalline diamond and highly oriented pyrolytic graphite of various C sp(2)/sp(3) ratios, crystallinity conditions and grain sizes. The composition at the surface was estimated from the XPS. The C sp(2)/sp(3) ratio was evaluated from the width of the XAES first derivative C KLL spectra and from fitting of XPS C 1s spectra into components. The pattern recognition (PR) method applied for analyzing the spectra line shapes exhibited high accuracy in distinguishing different carbon materials. The PR method was found to be a potentially useful approach for identification, especially important for technological applications in fields of materials engineering and for controlling the chemical reaction products during synthesis.
Lesiak
Beata
B
Institute of Physical Chemistry, Polish Academy of Sciences, Warsaw, Poland. blo@ichf.edu.pl
Zemek
Josef
J
Houdkova
Jana
J
Kromka
Alexander
A
Józwik
Adam
A
D002244:Carbon / Q000737:chemistry*; D018130:Diamond / Q000737:chemistry*; D004583:Electrons; D006108:Graphite / Q000737:chemistry*; D053758:Nanoparticles / Q000737:chemistry*; D010363:Pattern Recognition, Automated; D013057:Spectrum Analysis; D013499:Surface Properties
C009139:pyrolytic carbon; D002244:Carbon; D018130:Diamond; D006108:Graphite