X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe.
Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 microm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied with single-crystal-like signal-to-noise. Scattering was measured with an X-ray-sensitive area detector, which measures intensity over a surface in reciprocal space. By scanning the X-ray energy, the intensity was measured over reciprocal-space volumes. Since the sample is not rotated, the real-space scattering volume does not change. Methods to minimize experimental artifacts arising from the use of an area detector are described.
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6118, USA. spechted@ornl.gov
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Specht
F J
FJ
Walker
Wenjun
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Liu