Atomic resolution imaging and topography of boron nitride sheets produced by chemical exfoliation.
Here, we present a simple method for preparing thin few-layer sheets of hexagonal BN with micrometer-sized dimensions using chemical exfoliation in the solvent 1,2-dichloroethane. The atomic structure of both few-layer and monolayer BN sheets is directly imaged using aberration-corrected high-resolution transmission electron microscopy. Electron beam induced sputtering effects are examined in real time. The removal of layers of BN by electron beam irradiation leads to the exposure of a step edge between a monolayer and bilayer region. We use HRTEM imaging combined with image simulations to show that BN bilayers can have AB stacking and are not limited to just AA stacking.
Warner
Jamie H
JH
Department of Materials, University of Oxford, Parks Rd, Oxford OX13PH, United Kingdom. jamie.warner@materials.ox.ac.uk
Rümmeli
Mark H
MH
Bachmatiuk
Alicja
A
Büchner
Bernd
B