title: Reply to comment by Maurice et al. in response to "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction Analysis".
abstract: A reply to Maurice et al.'s comment on "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction" is presented. A new method for microscope geometry calibration is briefly presented. Also, evidence that simple diffraction simulations can be profitable tools for absolute elastic strain measurements in crystalline materials is reiterated.
authors.affiliation: Brigham Young University, 2520B Leeper Dr, Champaign, IL 61822, USA. jkacherbyu@gmail.com
authors.forename: Josh
authors.initials: J
authors.lastname: Kacher
authors.forename: Jay
authors.initials: J
authors.lastname: Basinger
authors.forename: Brent L
authors.initials: BL
authors.lastname: Adams
authors.forename: David T
authors.initials: DT
authors.lastname: Fullwood