title: Microbubbles as x-ray scattering contrast agents using analyzer-based imaging.
abstract: Conventional contrast agents utilized in diagnostic radiology are based on x-ray absorption properties; alternative physical principles capable of providing a contrast enhancement in radiographs have never been applied. This study exploits the possibility of using a novel type of contrast media based on x-ray scattering. The contrast agents consist of microbubble echo-enhancing agents, usually applied in ultrasound examinations, which are invisible with conventional x-ray absorption techniques. The experiment was carried out at the medical beamline of the synchrotron radiation laboratory ELETTRA in Trieste, Italy. A flat silicon analyzer crystal typically used for diffraction-enhanced imaging was utilized as a tool for detecting the scattering properties of the contrast agents. In analyzer-based imaging, it is possible to detect the scattering properties of the sample by shifting the analyzer crystal to selected positions of its reflectivity curve. In particular, when the sample consists of a large number of micro-particles an overall effect can be observed. Phantoms containing contrast agents based on microbubbles were imaged at different angular positions of the analyzer crystal. High visibility of the details was demonstrated, and a strong contrast enhancement was measured compared to normal x-ray absorption techniques.
authors.affiliation: Department of Physics, University of Trieste, Via Valerio 2, 34127 Trieste, Italy.
authors.forename: F
authors.initials: F
authors.lastname: Arfelli
authors.forename: L
authors.initials: L
authors.lastname: Rigon
authors.forename: R H
authors.initials: RH
authors.lastname: Menk
mesh_terms: D000042:Absorption; D003287:Contrast Media; D003952:Diagnostic Imaging / Q000295:instrumentation* / Q000379:methods; D006801:Humans; D045423:Microbubbles; D019047:Phantoms, Imaging; D012680:Sensitivity and Specificity; D012825:Silicon / Q000737:chemistry*; D013057:Spectrum Analysis / Q000379:methods; D017356:Synchrotrons; D014961:X-Ray Diffraction / Q000295:instrumentation* / Q000379:methods; D014965:X-Rays
chemical_list: D003287:Contrast Media; D012825:Silicon