Refractive indices of ir materials: 10.6-microm ellipsometer measurements.
10.6-microm ellipsometric measurements, using a modulated light ellipsometer, are reported for the refractive imdies of KCL, CdTe, and ZnSe crystals and for ZnSe and ThF(4) films.
Pedinoff
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Braunstein
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Stafsudd
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