title: Design of compact freeform lens for application specific Light-Emitting Diode packaging.
abstract: Application specific LED packaging (ASLP) is an emerging technology for high performance LED lighting. We introduced a practical design method of compact freeform lens for extended sources used in ASLP. A new ASLP for road lighting was successfully obtained by integrating a polycarbonate compact freeform lens of small form factor with traditional LED packaging. Optical performance of the ASLP was investigated by both numerical simulation based on Monte Carlo ray tracing method and experiments. Results demonstrated that, comparing with traditional LED module integrated with secondary optics, the ASLP had advantages of much smaller size in volume (approximately 1/8), higher system lumen efficiency (approximately 8.1%), lower cost and more convenience for customers to design and assembly, enabling possible much wider applications of LED for general road lighting. Tolerance analyses were also conducted. Installation errors of horizontal and vertical deviations had more effects on the shape and uniformity of radiation pattern compared with rotational deviation. The tolerances of horizontal, vertical and rotational deviations of this lens were 0.11 mm, 0.14 mm and 2.4 degrees respectively, which were acceptable in engineering.
authors.affiliation: Division of MOEMS, Wuhan National Laboratory for Optoelectronics, Wuhan, China.
authors.forename: Kai
authors.initials: K
authors.lastname: Wang
authors.forename: Fei
authors.initials: F
authors.lastname: Chen
authors.forename: Zongyuan
authors.initials: Z
authors.lastname: Liu
authors.forename: Xiaobing
authors.initials: X
authors.lastname: Luo
authors.forename: Sheng
authors.initials: S
authors.lastname: Liu
mesh_terms: D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007909:Lenses; D008029:Lighting / Q000295:instrumentation*; D008904:Miniaturization; D019064:Product Packaging / Q000295:instrumentation* / Q000379:methods; D015203:Reproducibility of Results; D012666:Semiconductors; D012680:Sensitivity and Specificity