title: Refractive indices of ir materials: 10.6-microm ellipsometer measurements.
abstract: 10.6-microm ellipsometric measurements, using a modulated light ellipsometer, are reported for the refractive imdies of KCL, CdTe, and ZnSe crystals and for ZnSe and ThF(4) films.
authors.forename: M E
authors.initials: ME
authors.lastname: Pedinoff
authors.forename: M
authors.initials: M
authors.lastname: Braunstein
authors.forename: O M
authors.initials: OM
authors.lastname: Stafsudd