title: [About the possibility of direct measurement of phases in X-ray diffraction analysis].
abstract: A method for direct experimental measurement of phases in X-ray diffraction analysis has been developed. The phases can be determined using a peculiar holographic filming (called here autoholography) in which the rays scattered on an object completely identical to the object under study but displaced, in a definite way, and turned in space relative to it serve as a reference beam. In principle, autoholography does not require any particularly good coherence of radiation since the reference bundle enables one to compensate to some extent for its absence. Therefore, X-rays used in X-ray diffraction analysis are well suited to autoholography.
authors.forename: V A
authors.initials: VA
authors.lastname: Namiot
mesh_terms: D006696:Holography; D008962:Models, Theoretical; D014961:X-Ray Diffraction