title: Dark-field scattering microscopy for spectral characterization of polystyrene aggregates.
abstract: Light scattering measurements of particle aggregates contain complex information which is difficult to decrypt. Dark-field scattering microscopy in the visible range is used to characterize multi-arranged polystyrene beads. First, measured light scattering spectra of single spheres are compared with the Mie theory. Then, additional spectral measurements of three different sample sets of sphere aggregates are carried out. The aggregates consist of homogeneous spheres and differ in number of spheres, arrangement and contact area. Principal component analysis is used to reduce the number of variables and achieve an accurate classification regarding the aggregate characteristics.
authors.affiliation: Department of Process Analytics, Reutlingen Research Institute, Alteburgstr. 150, D-72762 Reutlingen, Germany.
authors.forename: Karsten
authors.initials: K
authors.lastname: Rebner
authors.forename: Michael
authors.initials: M
authors.lastname: Schmitz
authors.forename: Barbara
authors.initials: B
authors.lastname: Boldrini
authors.forename: Alwin
authors.initials: A
authors.lastname: Kienle
authors.forename: Dieter
authors.initials: D
authors.lastname: Oelkrug
authors.forename: R W
authors.initials: RW
authors.lastname: Kessler