Infrared optical properties of silicon monoxide films.
The dielectric function epsilon identical with epsilon(1) + iepsilon(2) of evaporated SiO films is reported for the wavelength region from 8 to 33 microm. The data are based on spectrophotometric measurements of reflectance and transmittance for films evaporated onto KRS-5 and crystalline Si and on reflectance measurements on films evaporated onto opaque Al layers. The consistency in the results for epsilon(1) and epsilon(2) is verified by the Kramers-Kronig analysis.
Hjortsberg
A
A
Granqvist
C G
CG