Multifrequency high-speed phase-modulation atomic force microscopy in liquids.
We have developed a new technique, called multifrequency high-speed phase-modulation atomic force microscopy (PM-AFM) in constant-amplitude (CA) mode based on the simultaneous excitation of the first two flexural modes of a cantilever. By performing a theoretical investigation, we have found that this technique enables the simultaneous imaging of the surface topography, energy dissipation and elasticity (nonlinear mapping) of materials. We experimentally demonstrated high-speed imaging at a scan speed of 5 frames/s for a polystyrene (PS) and polyisobutylene (PIB) polymer-blend thin-film surface in water.
Li
Yan Jun
YJ
Department of Applied Physics, Graduate School of Engineering, Osaka University, Suita, Osaka, Japan. liyanjun@ap.eng.osaka-u.ac.jp
Takahashi
Kouhei
K
Kobayashi
Naritaka
N
Naitoh
Yoshitaka
Y
Kageshima
Masami
M
Sugawara
Yasuhiro
Y