title: Infrared optical properties of silicon monoxide films.
abstract: The dielectric function epsilon identical with epsilon(1) + iepsilon(2) of evaporated SiO films is reported for the wavelength region from 8 to 33 microm. The data are based on spectrophotometric measurements of reflectance and transmittance for films evaporated onto KRS-5 and crystalline Si and on reflectance measurements on films evaporated onto opaque Al layers. The consistency in the results for epsilon(1) and epsilon(2) is verified by the Kramers-Kronig analysis.
authors.forename: A
authors.initials: A
authors.lastname: Hjortsberg
authors.forename: C G
authors.initials: CG
authors.lastname: Granqvist