title: Knocking down highly-ordered large-scale nanowire arrays.
abstract: The large-scale assembly of nanowire elements with controlled and uniform orientation and density at spatially well-defined locations on solid substrates presents one of the most significant challenges facing their integration in real-world electronic applications. Here, we present the universal "knocking-down" approach, based on the controlled in-place planarization of nanowire elements, for the formation of large-scale ordered nanowire arrays. The controlled planarization of the nanowires is achieved by the use of an appropriate elastomer-covered rigid-roller device. After being knocked down, each nanowire in the array can be easily addressed electrically, by a simple single photolithographic step, to yield a large number of nanoelectrical devices with an unprecedented high-fidelity rate. The approach allows controlling, in only two simple steps, all possible array parameters, that is, nanowire dimensions, chemical composition, orientation, and density. The resulting knocked-down arrays can be further used for the creation of massive nanoelectronic-device arrays. More than million devices were already fabricated with yields over 98% on substrate areas of up, but not limited to, to 10 cm(2).
authors.affiliation: School of Chemistry, Tel-Aviv University, Tel Aviv, Israel.
authors.forename: Alexander
authors.initials: A
authors.lastname: Pevzner
authors.forename: Yoni
authors.initials: Y
authors.lastname: Engel
authors.forename: Roey
authors.initials: R
authors.lastname: Elnathan
authors.forename: Tamir
authors.initials: T
authors.lastname: Ducobni
authors.forename: Moshit
authors.initials: M
authors.lastname: Ben-Ishai
authors.forename: Koteeswara
authors.initials: K
authors.lastname: Reddy
authors.forename: Nava
authors.initials: N
authors.lastname: Shpaisman
authors.forename: Alexander
authors.initials: A
authors.lastname: Tsukernik
authors.forename: Mark
authors.initials: M
authors.lastname: Oksman
authors.forename: Fernando
authors.initials: F
authors.lastname: Patolsky
mesh_terms: D004129:Dimethylpolysiloxanes / Q000737:chemistry; D008422:Materials Testing; D036103:Nanotechnology / Q000295:instrumentation* / Q000379:methods; D053770:Nanowires / Q000737:chemistry*; D009757:Nylons / Q000737:chemistry; D013499:Surface Properties
chemical_list: D004129:Dimethylpolysiloxanes; D009757:Nylons; C085707:poly(dimethylsiloxane)-polyamide copolymer