title: Emittance estimation by an ion optical element with variable focusing strength and a viewing target.
abstract: The emittance of an extracted ion beam can be estimated to first order by a series of three linear independent profile measurements. This estimation is restricted to the evaluation of an upper limit of the emittance value for a homogeneous, nonfilamented beam. The beam is assumed to be round, respectively elliptical, without any structure of the intensity distribution, no space charge has been assumed for the drifting beam, and the optics is assumed to be linear. Instead of using three different drift sections, a linear focusing element with three different focusing strengths can be used. Plotting the beam radius as function of focusing strength, three independent solutions can be used to calculate the Twiss parameters alpha, beta, and gamma and furthermore the emittance epsilon. Here we describe the measurements which have been performed with the SECRAL ion source at Institute of Modern Physics Lanzhou.
authors.affiliation: GSI GmbH, Planckstrasse 1, D-64291 Darmstadt, Germany. j.maeder@gsi.de
authors.forename: J
authors.initials: J
authors.lastname: Mäder
authors.forename: J
authors.initials: J
authors.lastname: Rossbach
authors.forename: F
authors.initials: F
authors.lastname: Maimone
authors.forename: P
authors.initials: P
authors.lastname: Spädtke
authors.forename: K
authors.initials: K
authors.lastname: Tinschert
authors.forename: R
authors.initials: R
authors.lastname: Lang
authors.forename: L
authors.initials: L
authors.lastname: Sun
authors.forename: Y
authors.initials: Y
authors.lastname: Cao
authors.forename: H
authors.initials: H
authors.lastname: Zhao