title: Evaporation and condensation of SiO and SiO2 studied by infrared spectroscopy.
abstract: Physical evaporation of SiO and SiO(2) under ultra-high vacuum conditions was monitored in situ with infrared spectroscopy at frequencies between 450 cm(-1) and 5000 cm(-1). The measured vibrational spectra of the condensed films are identical in both cases, for SiO and SiO(2) evaporation, and can be described with four Brendel oscillators located at 380 cm(-1), 713 cm(-1), 982 cm(-1), and 1101 cm(-1), corresponding to typical vibration modes in SiO.
authors.affiliation: Kirchhoff Institute for Physics, Im Neuenheimer Feld 227, 69120 Heidelberg, Germany.
authors.forename: M
authors.initials: M
authors.lastname: Klevenz
authors.forename: S
authors.initials: S
authors.lastname: Wetzel
authors.forename: M
authors.initials: M
authors.lastname: Möller
authors.forename: A
authors.initials: A
authors.lastname: Pucci