title: Electron beam ion source and electron beam ion trap (invited).
abstract: The electron beam ion source (EBIS) and its trap variant [electron beam ion trap (EBIT)] celebrated their 40th and 20th anniversary, respectively, at the EBIS/T Symposium 2007 in Heidelberg. These technologically challenging sources of highly charged ions have seen a broad development in many countries over the last decades. In contrast to most other ion sources the recipe of improvement was not "sorcery" but a clear understanding of the physical laws and obeying the technological constraints. This review will report important achievements of the past as well as promising developments in the future.
authors.affiliation: Scientific Software Service, Kapellenweg 2a, D-63571 Gelnhausen, Germany. rbecker@egun-igun.com
authors.forename: Reinard
authors.initials: R
authors.lastname: Becker
authors.forename: Oliver
authors.initials: O
authors.lastname: Kester