Schlieren method for the determination of electric field distributions in dielectrics.
On the principle that the spatial distribution of the refractive index produced by a small applied temperature difference is changed due to an electromechanical force created by the field resulting from the spatial variation of the dielectric constant, the electric field distributions in a dielectric system can be determined using the schlieren method. Some experimental results for benzene and n-hexane between two spherical electrodes obtained with this method show the essential features predicted from the space charge effects. This method can be used to study electric field and space charge distributions under both steady and transient conditions.
Sueda
H
H
Kao
K C
KC