Determination of the refractive index of a dielectric film continuously by the generalized S-transform.
The generalized S-transform was improved as a method to determine the refractive index of a dielectric film continuously by using the transmittance spectrum, and the applicability of the method was demonstrated on mica. The result determined from the generalized S-transform method was compared with the results determined from the S-transform and the fringe counting methods and published values. The advantage of the proposed method was explained, and the absolute error of the presented method was also calculated.
Department of Physics, Canakkale Onsekiz Mart University, 17100 Canakkale, Turkey. ecoskun@comu.edu.tr
Emre
E
Coşkun
Kivanç
K
Sel
Serhat
S
Ozder