Determination of the refractive index of a dielectric film continuously by the generalized S-transform.
The generalized S-transform was improved as a method to determine the refractive index of a dielectric film continuously by using the transmittance spectrum, and the applicability of the method was demonstrated on mica. The result determined from the generalized S-transform method was compared with the results determined from the S-transform and the fringe counting methods and published values. The advantage of the proposed method was explained, and the absolute error of the presented method was also calculated.
Coşkun
Emre
E
Department of Physics, Canakkale Onsekiz Mart University, 17100 Canakkale, Turkey. ecoskun@comu.edu.tr
Sel
Kivanç
K
Ozder
Serhat
S