title: Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy.
authors.affiliation: CIC nanoGUNE Consolider, 20018 Donostia-San Sebastian Spain.
authors.forename: J M
authors.initials: JM
authors.lastname: Stiegler
authors.forename: A J
authors.initials: AJ
authors.lastname: Huber
authors.forename: S L
authors.initials: SL
authors.lastname: Diedenhofen
authors.forename: J Gómez
authors.initials: JG
authors.lastname: Rivas
authors.forename: R E
authors.initials: RE
authors.lastname: Algra
authors.forename: E P A M
authors.initials: EP
authors.lastname: Bakkers
authors.forename: R
authors.initials: R
authors.lastname: Hillenbrand
mesh_terms: D036103:Nanotechnology / Q000295:instrumentation / Q000379:methods*; D053770:Nanowires / Q000737:chemistry*; D012666:Semiconductors; D019265:Spectroscopy, Near-Infrared