title: Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy.
authors.affiliation: Nion Co., 1102 8th Street, Kirkland, Washington 98033, USA. krivanek@nion.com
authors.forename: Ondrej L
authors.initials: OL
authors.lastname: Krivanek
authors.forename: Matthew F
authors.initials: MF
authors.lastname: Chisholm
authors.forename: Valeria
authors.initials: V
authors.lastname: Nicolosi
authors.forename: Timothy J
authors.initials: TJ
authors.lastname: Pennycook
authors.forename: George J
authors.initials: GJ
authors.lastname: Corbin
authors.forename: Niklas
authors.initials: N
authors.lastname: Dellby
authors.forename: Matthew F
authors.initials: MF
authors.lastname: Murfitt
authors.forename: Christopher S
authors.initials: CS
authors.lastname: Own
authors.forename: Zoltan S
authors.initials: ZS
authors.lastname: Szilagyi
authors.forename: Mark P
authors.initials: MP
authors.lastname: Oxley
authors.forename: Sokrates T
authors.initials: ST
authors.lastname: Pantelides
authors.forename: Stephen J
authors.initials: SJ
authors.lastname: Pennycook