title: Mechanical characteristics of silicon nanostructures using force distance spectroscopy.
abstract: Experimental studies were undertaken to determine mechanical stiffness of Si chevron nanostructures grown by glancing angle deposition. Atomic force microscope based force-distance spectroscopy was performed on two types of chevron structures. The average stiffness of four-armed chevrons was found to be 381 +/- 16 Nm(-1), while that of five-armed chevrons was determined to be 375 +/- 23 Nm(-1). Simulations using finite element modeling were carried out to understand the mechanical characteristics of chevrons. For the nanostructures investigated in the present study, the simulation results indicate that while five-armed chevrons behave as springs, the four-armed chevrons act as cantilevers. It is shown that the position of loading point, physical dimensions and the geometry of the chevron control the overall mechanical response of chevron structures when subjected to an external load. It is proposed that by controlling the deposition parameters in glancing angle deposition, the topography of the structures and hence the position of loading points can be manipulated to generate a desirable mechanical response.
authors.affiliation: Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India.
authors.forename: Rupali
authors.initials: R
authors.lastname: Nagar
authors.forename: C
authors.initials: C
authors.lastname: Patzig
authors.forename: B
authors.initials: B
authors.lastname: Rauschenbach
authors.forename: B R
authors.initials: BR
authors.lastname: Mehta
authors.forename: J P
authors.initials: JP
authors.lastname: Singh