title: Microstructural properties at the interfaces of ZnO nanorods and ZnO homo-buffer layers.
abstract: Uniformly and vertically well-aligned ZnO nanorods were fabricated in-situ and ex-situ on ZnO films using a catalyst-free metal-organic chemical vapor process. Microstructural properties of the initial growth of ZnO nanorods on ZnO films with different surface roughnesses were investigated. We observed that the ZnO nanorods grown on ZnO films with surface roughness of less than 1.0 nm were well-aligned along the c-axis and in the ab-plane. When the nanorods grew on ZnO films with a large surface roughness, they had three different growth directions of 28 degrees, 62 degrees, and 90 degrees to the film surface. The slant angle of 62 degrees corresponds to the angle between the ZnO(001) and (101) planes. The initial growth direction difference caused structural disorder at the interface of the ZnO nanorod and film, and prevented epitaxial growth and the alignment of the nanorods.
authors.affiliation: Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang 790-784, Korea.
authors.forename: Changha
authors.initials: C
authors.lastname: Kwak
authors.forename: Byung-Hyuk
authors.initials: BH
authors.lastname: Kim
authors.forename: Chang-In
authors.initials: CI
authors.lastname: Park
authors.forename: Sun-Hong
authors.initials: SH
authors.lastname: Park
authors.forename: Soo-Young
authors.initials: SY
authors.lastname: Seo
authors.forename: Seon-Hyo
authors.initials: SH
authors.lastname: Kim
authors.forename: Sang-Wook
authors.initials: SW
authors.lastname: Han