title: Calibration of optically trapped nanotools.
abstract: Holographically trapped nanotools can be used in a novel form of force microscopy. By measuring the displacement of the tool in the optical traps, the contact force experienced by the probe can be inferred. In the following paper we experimentally demonstrate the calibration of such a device and show that its behaviour is independent of small changes in the relative position of the optical traps. Furthermore, we explore more general aspects of the thermal motion of the tool.
authors.affiliation: H H Wills Physics Laboratory, University of Bristol, Bristol, UK.
authors.forename: D M
authors.initials: DM
authors.lastname: Carberry
authors.forename: S H
authors.initials: SH
authors.lastname: Simpson
authors.forename: J A
authors.initials: JA
authors.lastname: Grieve
authors.forename: Y
authors.initials: Y
authors.lastname: Wang
authors.forename: H
authors.initials: H
authors.lastname: Schäfer
authors.forename: M
authors.initials: M
authors.lastname: Steinhart
authors.forename: R
authors.initials: R
authors.lastname: Bowman
authors.forename: G M
authors.initials: GM
authors.lastname: Gibson
authors.forename: M J
authors.initials: MJ
authors.lastname: Padgett
authors.forename: S
authors.initials: S
authors.lastname: Hanna
authors.forename: M J
authors.initials: MJ
authors.lastname: Miles