title: Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy.
abstract: Judiciously matched experiments, calculations, and theory demonstrate that a higher sensitivity to short-range interactions and, consequently, improved resolution on the atomic scale can be achieved by bimodal noncontact dynamic force microscopy. The combination of sub-Angström tip oscillation at the second flexural resonance of a commercially available silicon cantilever with the commonly used large amplitude oscillation at the fundamental resonance frequency enables this performance improvement while avoiding potentially damaging jump-to-contact instabilities.
authors.affiliation: Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland. shigeki.kawai@unibas.ch
authors.forename: Shigeki
authors.initials: S
authors.lastname: Kawai
authors.forename: Thilo
authors.initials: T
authors.lastname: Glatzel
authors.forename: Sascha
authors.initials: S
authors.lastname: Koch
authors.forename: Bartosz
authors.initials: B
authors.lastname: Such
authors.forename: Alexis
authors.initials: A
authors.lastname: Baratoff
authors.forename: Ernst
authors.initials: E
authors.lastname: Meyer