A sensitive near-field microscope for thermal radiation.
A scattering-type scanning near-field optical microscope in long-wavelength infrared (LWIR) region is developed by using an extremely sensitive detector, called the charge-sensitive infrared phototransistor. A tungsten probe attached to a quartz tuning fork is controlled in shear-force mode. Evanescent wave at a sample surface is periodically scattered by slowly (2 Hz) modulating the probe in the direction normal to the sample surface. Near-field microscopy of thermal LWIR radiation from room-temperature Au/GaAs gratings is demonstrated without using any external illumination or excitation. Achieved spatial resolution is better than 300 nm.
Kajihara
Yusuke
Y
Department of Basic Science, The University of Tokyo, Komaba 3-8-1, Meguro-ku, Tokyo 153-8902, Japan.
Kosaka
Keishi
K
Komiyama
Susumu
S