title: Three-dimensional atomic force microscopy - taking surface imaging to the next level.
abstract: Materials properties are ultimately determined by the nature of the interactions between the atoms that form the material. On surfaces, the site-specific spatial distribution of force and energy fields governs the phenomena encountered. This article reviews recent progress in the development of a measurement mode called three-dimensional atomic force microscopy (3D-AFM) that allows the dense, three-dimensional mapping of these surface fields with atomic resolution. Based on noncontact atomic force microscopy, 3D-AFM is able to provide more detailed information on surface properties than ever before, thanks to the simultaneous multi-channel acquisition of complementary spatial data such as local energy dissipation and tunneling currents. By illustrating the results of experiments performed on graphite and pentacene, we explain how 3D-AFM data acquisition works, what challenges have to be addressed in its realization, and what type of data can be extracted from the experiments. Finally, a multitude of potential applications are discussed, with special emphasis on chemical imaging, heterogeneous catalysis, and nanotribology.
authors.affiliation: Department of Mechanical Engineering, Center for Research on Interface Structures and Phenomena, Yale University, New Haven, CT 06520-8284, USA.
authors.forename: Mehmet Z
authors.initials: MZ
authors.lastname: Baykara
authors.forename: Todd C
authors.initials: TC
authors.lastname: Schwendemann
authors.forename: Eric I
authors.initials: EI
authors.lastname: Altman
authors.forename: Udo D
authors.initials: UD
authors.lastname: Schwarz
mesh_terms: D002384:Catalysis; D004735:Energy Transfer; D006108:Graphite / Q000737:chemistry; D018625:Microscopy, Atomic Force; D009279:Naphthacenes / Q000737:chemistry; D013499:Surface Properties
chemical_list: D009279:Naphthacenes; D006108:Graphite; C523499:pentacene