Large-area and high-resolution distortion measurement based on Moiré fringe method for hot embossing process.
A Moiré fringe approach is developed to identify simultaneously the global and local distortions in hot-embossed polymeric samples. A square grid pattern with a pitch of 63.5 microm is hot-embossed on the polymer substrate. When a reference grid, a polymeric film with the same pattern, is placed on top of the sample, a Moiré fringe pattern is observed and recorded by a document scanner. The deviation of the intersections of the fringes from their ideal positions presents the residual distortion in the sample. With different sample-reference rotation angles eight images are acquired for the same sample to achieve the optimal result by a data fitting technique. The validity of this method is proved by the self-consistency of the results from the eight images. To the best of our knowledge, this is the first time distortion quantification has been achieved both in a large area up to that of a scanner and with a high resolution at the level of 1 microm. Furthermore, we do not use any expensive instrument, nor need to measure the sample-reference rotation angle or position the sample precisely, and the process is run automatically by a computer instead of manual operation.
Xu
Zhiguang
Z
Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USA.
Taylor
Hayden K
HK
Boning
Duane S
DS
Yoon
Soon Fatt
SF
Youcef-Toumi
Kamal
K