Comparison of raised-microdisk whispering-gallery-mode characterization techniques.
We compare the two prevailing raised-microdisk whispering-gallery-mode (WGM) characterization techniques, one based on coupling emission to a tapered fiber and the other based on collecting emission in the far field. We applied both techniques to study WGMs in Si nanocrystal raised microdisks and observed dramatically different behavior. We explain this difference in terms of the radiative bending loss on which the far-field collection technique relies and discuss the regimes of operation in which each technique is appropriate.
Redding
Brandon
B
Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, USA. redding@udel.edu
Marchena
Elton
E
Creazzo
Tim
T
Shi
Shouyuan
S
Prather
Dennis W
DW