Fluorescence tomographic microscopy by wavefront detection.
A new method, to our knowledge, for real-time direct access to depth information in scanning fluorescence microscopy is reported. It is based on axially exciting the sample and detecting the phase and intensity of the emitted light. Results obtained using an axicon lens to generate a Bessel beam for excitation and a microlens array as phase detector are presented.
Iglesias
Ignacio
I
Departamento de Física, Universidad de Murcia, Campus de Espinardo (CIOyN bldg.), E-30100 Murcia, Spain. iic@um.es
D017076:Computer-Aided Design; D004867:Equipment Design; D019544:Equipment Failure Analysis; D007089:Image Enhancement / Q000295:instrumentation*; D018613:Microscopy, Confocal / Q000295:instrumentation*; D015203:Reproducibility of Results; D012680:Sensitivity and Specificity; D041622:Tomography, Optical / Q000295:instrumentation*