Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy.
Judiciously matched experiments, calculations, and theory demonstrate that a higher sensitivity to short-range interactions and, consequently, improved resolution on the atomic scale can be achieved by bimodal noncontact dynamic force microscopy. The combination of sub-Angström tip oscillation at the second flexural resonance of a commercially available silicon cantilever with the commonly used large amplitude oscillation at the fundamental resonance frequency enables this performance improvement while avoiding potentially damaging jump-to-contact instabilities.
Kawai
Shigeki
S
Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland. shigeki.kawai@unibas.ch
Glatzel
Thilo
T
Koch
Sascha
S
Such
Bartosz
B
Baratoff
Alexis
A
Meyer
Ernst
E