title: Characterization of a direct detection device imaging camera for transmission electron microscopy.
abstract: The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The DDD transfers signal up to 65 lines/mm providing the basis for a high-performance platform for a new generation of wide field-of-view high-resolution cameras. An image of a thin section of virus particles is presented to illustrate the substantially improved performance of this sensor over current indirectly coupled CCD cameras.
authors.affiliation: University of California at San Diego, 9500 Gilman Dr., La Jolla, CA 92093, USA. amilazzo@ncmir.ucsd.edu
authors.forename: Anna-Clare
authors.initials: AC
authors.lastname: Milazzo
authors.forename: Grigore
authors.initials: G
authors.lastname: Moldovan
authors.forename: Jason
authors.initials: J
authors.lastname: Lanman
authors.forename: Liang
authors.initials: L
authors.lastname: Jin
authors.forename: James C
authors.initials: JC
authors.lastname: Bouwer
authors.forename: Stuart
authors.initials: S
authors.lastname: Klienfelder
authors.forename: Steven T
authors.initials: ST
authors.lastname: Peltier
authors.forename: Mark H
authors.initials: MH
authors.lastname: Ellisman
authors.forename: Angus I
authors.initials: AI
authors.lastname: Kirkland
authors.forename: Nguyen-Huu
authors.initials: NH
authors.lastname: Xuong
mesh_terms: D000818:Animals; D004330:Drosophila / Q000821:virology; D004867:Equipment Design; D046529:Microscopy, Electron, Transmission / Q000295:instrumentation* / Q000706:statistics & numerical data; D014771:Virion / Q000648:ultrastructure
references.citation: Microsc Res Tech. 2000 May 1;49(3):269-80
references.pmid: 10816267
references.citation: Rev Sci Instrum. 2008 Apr;79(4):043702
references.pmid: 18447528
references.citation: J Struct Biol. 2008 Mar;161(3):439-46
references.pmid: 17998167
references.citation: Ultramicroscopy. 2009 Aug;109(9):1144-7
references.pmid: 19541421
references.citation: J Electron Microsc (Tokyo). 1968;17(2):158-9
references.pmid: 4177281
references.citation: J Struct Biol. 2008 Mar;161(3):359-71
references.pmid: 17962040
references.citation: Ultramicroscopy. 2000 Sep;85(1):9-13
references.pmid: 10981735
references.citation: Microsc Res Tech. 2000 May 1;49(3):245-68
references.pmid: 10816266
references.citation: Ultramicroscopy. 2005 Sep;104(2):152-9
references.pmid: 15890445
references.citation: Ultramicroscopy. 2007 Aug;107(8):674-84
references.pmid: 17346890
references.citation: J Struct Biol. 2008 Mar;161(3):352-8
references.pmid: 18054249
references.citation: Ultramicroscopy. 2009 Aug;109(9):1126-43
references.pmid: 19497671