Index profiling of distributed-index lenses by a shearing interference method.
It is demonstrated that the transverse differential interference method is used as a reliable profiling technique for distributed-index rod lenses, and its accuracy and spatial resolution have been made clear. By the use of this technique the index profile of a distributed-index planar microlens which has 3-D index distribution has been measured.
Kokubun
Y
Y
Tokyo Institute of Technology, Research Laboratory of Precision Machinery & Electronics, 4259, Nagatsuta, Midoriku, Yokohama, 227, Japan.
Iga
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K