title: Interference effects in luminescence studies of thin films.
abstract: Interference effects, including multiple-beam and wide-angle, associated with luminescence from within a thin film are described. A simple geometrical model is used to calculate the s- and p-polarized luminescent light assuming electric-dipole radiation. The luminescence exhibits fringes when measured both as a function of the film thickness and as a function of the wavelength of the light. In the latter case the fringes can also show a beating effect. The model is applied to several experimental examples of cathodoluminescence in SiO(2) and an example of photoluminescence in a-Si.
authors.forename: R T
authors.initials: RT
authors.lastname: Holm
authors.forename: S W
authors.initials: SW
authors.lastname: McKnight
authors.forename: E D
authors.initials: ED
authors.lastname: Palik
authors.forename: W
authors.initials: W
authors.lastname: Lukosz