title: Absorption, refraction and scattering in analyzer-based imaging: comparison of different algorithms.
abstract: Many mathematical methods have been so far proposed in order to separate absorption, refraction and ultra-small angle scattering information in phase-contrast analyzer-based images. These algorithms all combine a given number of images acquired at different positions of the crystal analyzer along its rocking curve. In this paper a comprehensive quantitative comparison between five of the most widely used phase extraction algorithms based on the geometrical optics approximation is presented: the diffraction-enhanced imaging (DEI), the extended diffraction-enhanced imaging (E-DEI), the generalized diffraction-enhanced (G-DEI), the multiple-image radiography (MIR) and the Gaussian curve fitting (GCF). The algorithms are theoretically analyzed in terms of their validity conditions and experimentally compared by using geometrical phantoms providing various amounts of absorption, refraction and scattering. The presented work shows that, due to their specific validity conditions, the considered algorithms produce results that may greatly differ, especially in the case of highly refracting and/or highly scattering materials. The various extraction algorithms are also applied to images of a human bone-cartilage sample. The aim is to validate the results obtained on geometrical phantoms and prove the efficiency of the different algorithms for applications on biological samples.
authors.affiliation: Biomedical Beamline (ID17), European Synchrotron Radiation Facility (ESRF), 6 rue Horowitz, 38043 Grenoble, France.
authors.forename: Paul Claude
authors.initials: PC
authors.lastname: Diemoz
authors.forename: Paola
authors.initials: P
authors.lastname: Coan
authors.forename: Christian
authors.initials: C
authors.lastname: Glaser
authors.forename: Alberto
authors.initials: A
authors.lastname: Bravin
mesh_terms: D000465:Algorithms; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D008027:Light; D012031:Refractometry / Q000379:methods*; D015203:Reproducibility of Results; D012542:Scattering, Radiation; D012680:Sensitivity and Specificity