Digital holographic reflectometry.
Digital holographic microscopy (DHM) is an interferometric technique that allows real-time imaging of the entire complex optical wavefront (amplitude and phase) reflected by or transmitted through a sample. To our knowledge, only the quantitative phase is exploited to measure topography, assuming homogeneous material sample and a single reflection on the surface of the sample. In this paper, dual-wavelength DHM measurements are interpreted using a model of reflected wave propagation through a three-interfaces specimen (2 layers deposited on a semi-infinite layer), to measure simultaneously topography, layer thicknesses and refractive indices of micro-structures. We demonstrate this DHM reflectometry technique by comparing DHM and profilometer measurement of home-made SiO(2)/Si targets and Secondary Ion Mass Spectrometry (SIMS) sputter craters on specimen including different multiple layers.
Colomb
Tristan
T
Lyncée Tec SA, PSE-A, CH-1015 Lausanne, Switzerland.
Krivec
Stefan
S
Hutter
Herbert
H
Akatay
Ahmet Ata
AA
Pavillon
Nicolas
N
Montfort
Frédéric
F
Cuche
Etienne
E
Kühn
Jonas
J
Depeursinge
Christian
C
Emery
Yves
Y
D000465:Algorithms; D006696:Holography / Q000379:methods*; D007090:Image Interpretation, Computer-Assisted / Q000379:methods*; D007368:Interferometry / Q000379:methods*; D010783:Photometry / Q000379:methods*; D012815:Signal Processing, Computer-Assisted