Far-field polarization-based sensitivity to sub-resolution displacements of a sub-resolution scatterer in tightly focused fields.
We present a system built to perform measurements of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture collector lens. These distributions contain information about the three-dimensional electromagnetic field that results from the interaction of a tightly focused field and a sub-resolution scatterer. Experimental evidence proving that the system allows for high polarization-dependent sensitivity to sub-resolution displacements of a sub-resolution scatterer is provided together with the corresponding numerical results.
Rodríguez-Herrera
Oscar G
OG
Applied Optics, School of Physics, National University of Ireland, Galway, University Road, Galway, Ireland. oscar.rodriguez@nuigalway.ie
Lara
David
D
Dainty
Chris
C
D019544:Equipment Failure Analysis / Q000295:instrumentation*; D007909:Lenses; D008027:Light; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation