Ultrafast imaging and the phase problem for inelastic X-ray scattering.
A new method for imaging ultrafast dynamics in condensed matter using inelastic X-ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or "phase problem") for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of approximately 1 attosecond (10(-18) s) in time and <1 A in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided.
Abbamonte
Peter
P
Frederick Seitz Materials Research Laboratory University of Illinois Urbana, IL 61801, USA. abbamonte@mrl.uiuc.edu
Wong
Gerard C L
GC
Cahill
David G
DG
Reed
James P
JP
Coridan
Robert H
RH
Schmidt
Nathan W
NW
Lai
Ghee Hwee
GH
Joe
Young Il
YI
Casa
Diego
D
D000465:Algorithms; D004548:Elasticity; D004583:Electrons; D005583:Fourier Analysis; D009502:Neutrons; D012542:Scattering, Radiation; D014965:X-Rays