title: Index profiling of distributed-index lenses by a shearing interference method.
abstract: It is demonstrated that the transverse differential interference method is used as a reliable profiling technique for distributed-index rod lenses, and its accuracy and spatial resolution have been made clear. By the use of this technique the index profile of a distributed-index planar microlens which has 3-D index distribution has been measured.
authors.affiliation: Tokyo Institute of Technology, Research Laboratory of Precision Machinery & Electronics, 4259, Nagatsuta, Midoriku, Yokohama, 227, Japan.
authors.forename: Y
authors.initials: Y
authors.lastname: Kokubun
authors.forename: K
authors.initials: K
authors.lastname: Iga