Three-dimensional electron density mapping of shape-controlled nanoparticle by focused hard X-ray diffraction microscopy.
Coherent diffraction microscopy using highly focused hard X-ray beams allows us to three-dimensionally observe thick objects with a high spatial resolution, also providing us with unique structural information, i.e., electron density distribution, not obtained by X-ray tomography with lenses, atom probe microscopy, or electron tomography. We measured high-contrast coherent X-ray diffraction patterns of a shape-controlled Au/Ag nanoparticle and successfully reconstructed a projection and a three-dimensional image of the nanoparticle with a single pixel (or a voxel) size of 4.2 nm in each dimension. The small pits on the surface and a hollow interior were clearly visible. The Au-rich regions were identified based on the electron density distribution, which provided insight into the formation of Au/Ag nanoboxes.
Takahashi
Yukio
Y
Frontier Research Base for Global Young Researchers, Frontier Research Center, Graduate School of Engineering, Osaka University, Suita, Osaka, Japan. takahashi@wakate.frc.eng.osaka-u.ac.jp
Zettsu
Nobuyuki
N
Nishino
Yoshinori
Y
Tsutsumi
Ryosuke
R
Matsubara
Eiichiro
E
Ishikawa
Tetsuya
T
Yamauchi
Kazuto
K
D021621:Imaging, Three-Dimensional / Q000379:methods*; D046911:Macromolecular Substances / Q000737:chemistry; D008422:Materials Testing; D008854:Microscopy, Electron / Q000379:methods*; D008968:Molecular Conformation; D049329:Nanostructures / Q000648:ultrastructure*; D010316:Particle Size; D013499:Surface Properties; D014961:X-Ray Diffraction / Q000379:methods*
D046911:Macromolecular Substances