title: Far-field polarization-based sensitivity to sub-resolution displacements of a sub-resolution scatterer in tightly focused fields.
abstract: We present a system built to perform measurements of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture collector lens. These distributions contain information about the three-dimensional electromagnetic field that results from the interaction of a tightly focused field and a sub-resolution scatterer. Experimental evidence proving that the system allows for high polarization-dependent sensitivity to sub-resolution displacements of a sub-resolution scatterer is provided together with the corresponding numerical results.
authors.affiliation: Applied Optics, School of Physics, National University of Ireland, Galway, University Road, Galway, Ireland. oscar.rodriguez@nuigalway.ie
authors.forename: Oscar G
authors.initials: OG
authors.lastname: Rodríguez-Herrera
authors.forename: David
authors.initials: D
authors.lastname: Lara
authors.forename: Chris
authors.initials: C
authors.lastname: Dainty
mesh_terms: D019544:Equipment Failure Analysis / Q000295:instrumentation*; D007909:Lenses; D008027:Light; D012031:Refractometry / Q000295:instrumentation*; D012542:Scattering, Radiation