title: Simultaneous multi-impairment monitoring of 640 Gb/s signals using photonic chip based RF spectrum analyzer.
abstract: We report the first demonstration of simultaneous multi-impairment monitoring at ultrahigh bitrates using a THz bandwidth photonic-chip-based radio-frequency (RF) spectrum analyzer. Our approach employs a 7 cm long, highly nonlinear (gamma approximately 9900 /W/km), dispersion engineered chalcogenide planar waveguide to capture the RF spectrum of an ultrafast 640 Gb/s signal, based on cross-phase modulation, from which we numerically retrieve the autocorrelation waveform. The relationship between the retrieved autocorrelation trace and signal impairments is exploited to simultaneously monitor dispersion, in-band optical signal to noise ratio (OSNR) and timing jitter from a single measurement. This novel approach also offers very high OSNR measurement dynamic range (> 30 dB) and is scalable to terabit data rates.
authors.affiliation: ARC Centre for Ultrahigh bandwidth Devices for Optical Systems (CUDOS), Institute of Photonics and Optical Science (IPOS), School of Physics, University of Sydney, New South Wales 2006, Australia.
authors.forename: T D
authors.initials: TD
authors.lastname: Vo
authors.forename: M D
authors.initials: MD
authors.lastname: Pelusi
authors.forename: J
authors.initials: J
authors.lastname: Schröder
authors.forename: F
authors.initials: F
authors.lastname: Luan
authors.forename: S J
authors.initials: SJ
authors.lastname: Madden
authors.forename: D-Y
authors.initials: DY
authors.lastname: Choi
authors.forename: D A P
authors.initials: DA
authors.lastname: Bulla
authors.forename: B
authors.initials: B
authors.lastname: Luther-Davies
authors.forename: B J
authors.initials: BJ
authors.lastname: Eggleton
mesh_terms: D004867:Equipment Design; D019544:Equipment Failure Analysis; D008872:Microwaves; D055096:Optical Devices; D010783:Photometry / Q000295:instrumentation*; D017785:Photons; D012815:Signal Processing, Computer-Assisted / Q000295:instrumentation*; D013057:Spectrum Analysis / Q000295:instrumentation*; D013685:Telecommunications / Q000295:instrumentation*