New area detector for atomic-resolution scanning transmission electron microscopy.
A new area detector for atomic-resolution scanning transmission electron microscopy (STEM) is developed and tested. The circular detector is divided into 16 segments which are individually optically coupled with photomultiplier tubes. Thus, 16 atomic-resolution STEM images which are sensitive to the spatial distribution of scattered electrons on the detector plane can be simultaneously obtained. This new detector can be potentially used not only for the simultaneous formation of common bright-field, low-angle annular dark-field and high-angle annular dark-field images, but also for the quantification of images by detecting the full range of scattered electrons and even for exploring novel atomic-resolution imaging modes by post-processing combination of the individual images.
Shibata
Naoya
N
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan. shibata@sigma.t.u-tokyo.ac.jp
Kohno
Yuji
Y
Findlay
Scott D
SD
Sawada
Hidetaka
H
Kondo
Yukihito
Y
Ikuhara
Yuichi
Y