title: Optimization of EFTEM image acquisition by using elastically filtered images for drift correction.
abstract: Because of its high spatial resolution, energy-filtering transmission electron microscopy (EFTEM) has become widely used for the analysis of the chemical composition of nanostructures. To obtain the best spatial resolution, the precise correction of instrumental influences and the optimization of the data acquisition procedure are very important. In this publication, we discuss a modified image acquisition procedure that optimizes the acquisition process of the EFTEM images, especially for long exposure times and measurements that are affected by large spatial drift. To alleviate the blurring of the image caused by the spatial drift, we propose to take several EFTEM images with a shorter exposure time (sub-images) and merge these sub-images afterwards. To correct for the drift between these sub-images, elastically filtered images are acquired between two subsequent sub-images. These elastically filtered images are highly suitable for spatial drift correction based on the cross-correlation method. The use of the drift information between two elastically filtered images permits to merge the drift-corrected sub-images automatically and with high accuracy, resulting in sharper edges and an improved signal intensity in the final EFTEM image. Artefacts that are caused by prominent noise-peaks in the dark reference image have been suppressed by calculating the dark reference image from three images. Furthermore, using the information given by the elastically filtered images, it is possible to drift-correct a set of EFTEM images already during the acquisition. This simplifies the post-processing for elemental mapping and offers the possibility for active drift correction using the image shift function of the microscope, leading to an increased field of view.
authors.affiliation: Physikalisches Institut and Interdisziplinäres Centrum für Elektronenmikroskopie und Mikroanalyse (ICEM), Universität Münster, Wilhelm-Klemm-Str. 10, 48149 Münster, Germany. tobiheil@uni-muenster.de
authors.forename: Tobias
authors.initials: T
authors.lastname: Heil
authors.forename: Helmut
authors.initials: H
authors.lastname: Kohl