title: Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy.
abstract: We present a titanium-silicon oxide film structure that permits polarization modulated infrared reflection absorption spectroscopy on silicon oxide surfaces. The structure consists of a ~6 nm sputtered silicon oxide film on a ~200 nm sputtered titanium film. Characterization using conventional and scanning transmission electron microscopy, electron energy loss spectroscopy, X-ray photoelectron spectroscopy and X-ray reflectometry is presented. We demonstrate the use of this structure to investigate a selectively protein-resistant self-assembled monolayer (SAM) consisting of silane-anchored, biotin-terminated poly(ethylene glycol) (PEG). PEG-associated IR bands were observed. Measurements of protein-characteristic band intensities showed that this SAM adsorbed streptavidin whereas it repelled bovine serum albumin, as had been expected from its structure.
authors.affiliation: Department of New Materials and Biosystems, Max Planck Institute for Metals Research, Heisenbergstrasse 3, 70569 Stuttgart, Germany.
authors.forename: Iain E
authors.initials: IE
authors.lastname: Dunlop
authors.forename: Stefan
authors.initials: S
authors.lastname: Zorn
authors.forename: Gunther
authors.initials: G
authors.lastname: Richter
authors.forename: Vesna
authors.initials: V
authors.lastname: Srot
authors.forename: Marion
authors.initials: M
authors.lastname: Kelsch
authors.forename: Peter A
authors.initials: PA
authors.lastname: van Aken
authors.forename: Maximilian
authors.initials: M
authors.lastname: Skoda
authors.forename: Alexander
authors.initials: A
authors.lastname: Gerlach
authors.forename: Joachim P
authors.initials: JP
authors.lastname: Spatz
authors.forename: Frank
authors.initials: F
authors.lastname: Schreiber