title: Esaki diodes live and learn.
abstract: We report, as the result of shelf-life tests for Esaki diodes, the observation of minute but tangible reductions in the tunnel current after the lapse of half a century. The reduction could be attributed to 0.25% widening in the tunnel path.
authors.affiliation: Science and Technology Promotion Foundation of Ibaraki, Tsukuba, Ibaraki, Japan. leoesaki@epochal.or.jp
authors.forename: Leo
authors.initials: L
authors.lastname: Esaki
authors.forename: Masatoshi
authors.initials: M
authors.lastname: Kitamura
authors.forename: Satoshi
authors.initials: S
authors.lastname: Iwamoto
authors.forename: Yasuhiko
authors.initials: Y
authors.lastname: Arakawa
mesh_terms: D004553:Electric Conductivity; D004566:Electrodes