Optimization of layered synthetic microstructures for broadband reflectivity at soft x-ray and EUV wavelengths.
A technique is described which allows the thickness of each layer in a layered synthetic microstructure to yield a useful constant efficiency over a broad band of wavelengths, several hundred angstroms wide, in the soft x-ray and EUV wave bands.
Meekins
J F
JF
Cruddace
R G
RG
Gursky
H
H