title: Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy.
abstract: Strong confinement of charges in few-electron systems such as in atoms, molecules, and quantum dots leads to a spectrum of discrete energy levels often shared by several degenerate states. Because the electronic structure is key to understanding their chemical properties, methods that probe these energy levels in situ are important. We show how electrostatic force detection using atomic force microscopy reveals the electronic structure of individual and coupled self-assembled quantum dots. An electron addition spectrum results from a change in cantilever resonance frequency and dissipation when an electron tunnels on/off a dot. The spectra show clear level degeneracies in isolated quantum dots, supported by the quantitative measurement of predicted temperature-dependent shifts of Coulomb blockade peaks. Scanning the surface shows that several quantum dots may reside on what topographically appears to be just one. Relative coupling strengths can be estimated from these images of grouped coupled dots.
authors.affiliation: Department of Physics, McGill University, Montreal, Quebec, Canada.
authors.forename: Lynda
authors.initials: L
authors.lastname: Cockins
authors.forename: Yoichi
authors.initials: Y
authors.lastname: Miyahara
authors.forename: Steven D
authors.initials: SD
authors.lastname: Bennett
authors.forename: Aashish A
authors.initials: AA
authors.lastname: Clerk
authors.forename: Sergei
authors.initials: S
authors.lastname: Studenikin
authors.forename: Philip
authors.initials: P
authors.lastname: Poole
authors.forename: Andrew
authors.initials: A
authors.lastname: Sachrajda
authors.forename: Peter
authors.initials: P
authors.lastname: Grutter
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