Multilayer theory of x-ray reflection.
A new basis is presented for the calculation of reflection coefficients of x rays by multilayer artifacts. Thin film interference is treated at an atomic plane level using an iterative 2 x 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarizations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.
Harper
P G
PG
Ramchurn
S K
SK