title: Polarized light scattering matrix elements for micron-sized rectangular aluminum lines on reflecting optical surfaces.
abstract: The entire sixteen-element Mueller scattering matrix has been experimentally determined for several small rectangular cross-sectioned aluminum lines whose known dimensions are of the order of the incident light (wavelength lambda = 4416 A). Each line was fabricated on top of a smooth reflecting aluminum surface using electron beam lithography techniques. The Mueller matrix of the surface plus the line was measured as a function of the increasing size (height and width) of the line for various angles of illumination alpha. The results are compared to scattering and diffraction data from a single slit and opaque circular cylinder of equal dimensions.
authors.forename: V J
authors.initials: VJ
authors.lastname: Lafelice
authors.forename: W S
authors.initials: WS
authors.lastname: Bickel