title: Multilayer theory of x-ray reflection.
abstract: A new basis is presented for the calculation of reflection coefficients of x rays by multilayer artifacts. Thin film interference is treated at an atomic plane level using an iterative 2 x 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarizations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.
authors.forename: P G
authors.initials: PG
authors.lastname: Harper
authors.forename: S K
authors.initials: SK
authors.lastname: Ramchurn