title: Study of atomic resolved plasmon-loss image by spherical aberration-corrected STEM-EELS method.
abstract: To gain an understanding of a plasmon-loss image obtained with an atomic resolution scanning transmission electron microscope (STEM)-electron energy loss spectroscopy (EELS) method, the detailed analysis is experimentally and theoretically performed. In order to theoretically explain a plasmon-loss image, a dynamical simulation method of the plasmon-loss image combined with a first-principle calculation is firstly proposed. By making comparisons between simulated and experimental plasmon-loss images, we find that the experimental plasmon-loss images closely resemble the high-angle bright-field STEM images, which show the reverse contrast of the corresponding high-angle annular dark-field STEM image.
authors.affiliation: Device & Materials Laboratories, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan. yamazakit@jp.fujitsu.com
authors.forename: Takashi
authors.initials: T
authors.lastname: Yamazaki
authors.forename: Yasutoshi
authors.initials: Y
authors.lastname: Kotaka
authors.forename: Mineharu
authors.initials: M
authors.lastname: Tsukada
authors.forename: Yuji
authors.initials: Y
authors.lastname: Kataoka