title: Optimization of layered synthetic microstructures for broadband reflectivity at soft x-ray and EUV wavelengths.
abstract: A technique is described which allows the thickness of each layer in a layered synthetic microstructure to yield a useful constant efficiency over a broad band of wavelengths, several hundred angstroms wide, in the soft x-ray and EUV wave bands.
authors.forename: J F
authors.initials: JF
authors.lastname: Meekins
authors.forename: R G
authors.initials: RG
authors.lastname: Cruddace
authors.forename: H
authors.initials: H
authors.lastname: Gursky