title: Growth, structural, spectral, mechanical and optical properties of pure and metal ions doped sulphamic acid single crystals.
abstract: Bulk single crystals of pure and metal ions (Mn(2+), Cu(2+) and Ni(2+)) doped sulphamic acid (SA) have been grown by conventional and unidirectional solution growth methods. Intensities of powder X-ray diffraction peaks of metal ions doped SA reveal that these dopants enhanced the crystallanity. The peak broadening and intensity variation in some frequency regions in FT-IR spectra show the incorporation of dopants in the SA lattice. Mn(2+) and Cu(2+) doped SA single crystals show high crystalline perfection (FWHM 5.5arcs) compared to pure and Ni(2+) metal ions doped SA crystals. The grown pure and Mn(2+), Cu(2+) and Ni(2+) ions doped SA crystals have transparency in the order SA>Mn:SA>Cu:SA>Ni:SA. The hardness value of Ni(2+) doped crystal is relatively less than that of the pure and other metal ions doped SA crystals. Pure and Ni(2+) ions doped SA crystals possess high dielectric constants than that of Cu(2+) and Mn(2+) ions doped crystals. From the SEM micrograph analyses, it is observed that the doping of these metal ions modify the surface morphology of the grown crystals.
authors.affiliation: Crystal Growth and Thin Film Laboratory, School of Physics, Bharathidasan University, Tiruchirappalli 620 024, India. rampap2k@yahoo.co.in
authors.forename: R
authors.initials: R
authors.lastname: Ramesh Babu
authors.forename: R
authors.initials: R
authors.lastname: Ramesh
authors.forename: R
authors.initials: R
authors.lastname: Gopalakrishnan
authors.forename: K
authors.initials: K
authors.lastname: Ramamurthi
authors.forename: G
authors.initials: G
authors.lastname: Bhagavannarayana
mesh_terms: D003460:Crystallization; D055664:Electrochemical Techniques; D007202:Indicators and Reagents / Q000737:chemistry*; D007477:Ions / Q000737:chemistry*; D008670:Metals / Q000737:chemistry*; D013057:Spectrum Analysis / Q000379:methods; D013451:Sulfonic Acids / Q000737:chemistry*; D014961:X-Ray Diffraction
chemical_list: D007202:Indicators and Reagents; D007477:Ions; D008670:Metals; D013451:Sulfonic Acids; C005741:sulfamic acid