title: Interplay between static and dynamic properties of semifluxons in YBa2Cu3O(7-delta) 0-pi Josephson junctions.
abstract: We have investigated the static and dynamic properties of long YBa2Cu3O(7-delta) 0-pi Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0-pi Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0-pi Josephson junctions.
authors.affiliation: Quantum Device Physics Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-412 96 Göteborg, Sweden.
authors.forename: K
authors.initials: K
authors.lastname: Cedergren
authors.forename: J R
authors.initials: JR
authors.lastname: Kirtley
authors.forename: T
authors.initials: T
authors.lastname: Bauch
authors.forename: G
authors.initials: G
authors.lastname: Rotoli
authors.forename: A
authors.initials: A
authors.lastname: Troeman
authors.forename: H
authors.initials: H
authors.lastname: Hilgenkamp
authors.forename: F
authors.initials: F
authors.lastname: Tafuri
authors.forename: F
authors.initials: F
authors.lastname: Lombardi