title: Patterning microfluidic device wettability using flow confinement.
abstract: We present a simple method to spatially pattern the surface properties of microfluidic devices using flow confinement. Our technique allows surface patterning with micron-scale resolution. To demonstrate its effectiveness, we use it to pattern wettability to form W/O/W and O/W/O double emulsions.
authors.affiliation: School of Engineering and Applied Sciences/Department of Physics, Harvard University, Cambridge, Massachusetts, USA.
authors.forename: Adam R
authors.initials: AR
authors.lastname: Abate
authors.forename: Julian
authors.initials: J
authors.lastname: Thiele
authors.forename: Marie
authors.initials: M
authors.lastname: Weinhart
authors.forename: David A
authors.initials: DA
authors.lastname: Weitz