title: Electrical transport and field-effect transistors using inkjet-printed SWCNT films having different functional side groups.
abstract: The electrical properties of random networks of single-wall carbon nanotubes (SWNTs) obtained by inkjet printing are studied. Water-based stable inks of functionalized SWNTs (carboxylic acid, amide, poly(ethylene glycol), and polyaminobenzene sulfonic acid) were prepared and applied to inkjet deposit microscopic patterns of nanotube films on lithographically defined silicon chips with a back-side gate arrangement. Source-drain transfer characteristics and gate-effect measurements confirm the important role of the chemical functional groups in the electrical behavior of carbon nanotube networks. Considerable nonlinear transport in conjunction with a high channel current on/off ratio of approximately 70 was observed with poly(ethylene glycol)-functionalized nanotubes. The positive temperature coefficient of channel resistance shows the nonmetallic behavior of the inkjet-printed films. Other inkjet-printed field-effect transistors using carboxyl-functionalized nanotubes as source, drain, and gate electrodes, poly(ethylene glycol)-functionalized nanotubes as the channel, and poly(ethylene glycol) as the gate dielectric were also tested and characterized.
authors.affiliation: Advanced Materials Department, Instituto Potosino de Investigacion Cientifica y Tecnologica, camino a la presa San Jose 2055, Col. Lomas 4. Seccion, 78216 San Luis Potosi, Mexico.
authors.forename: Eduardo
authors.initials: E
authors.lastname: Gracia-Espino
authors.forename: Giovanni
authors.initials: G
authors.lastname: Sala
authors.forename: Flavio
authors.initials: F
authors.lastname: Pino
authors.forename: Niina
authors.initials: N
authors.lastname: Halonen
authors.forename: Juho
authors.initials: J
authors.lastname: Luomahaara
authors.forename: Jani
authors.initials: J
authors.lastname: Mäklin
authors.forename: Géza
authors.initials: G
authors.lastname: Tóth
authors.forename: Krisztián
authors.initials: K
authors.lastname: Kordás
authors.forename: Heli
authors.initials: H
authors.lastname: Jantunen
authors.forename: Mauricio
authors.initials: M
authors.lastname: Terrones
authors.forename: Panu
authors.initials: P
authors.lastname: Helistö
authors.forename: Heikki
authors.initials: H
authors.lastname: Seppä
authors.forename: Pulickel M
authors.initials: PM
authors.lastname: Ajayan
authors.forename: Robert
authors.initials: R
authors.lastname: Vajtai
mesh_terms: D016287:Computer Peripherals; D003460:Crystallization / Q000379:methods*; D004553:Electric Conductivity; D004579:Electron Transport; D004867:Equipment Design; D019544:Equipment Failure Analysis; D046911:Macromolecular Substances / Q000737:chemistry; D008422:Materials Testing; D008968:Molecular Conformation; D049329:Nanostructures / Q000737:chemistry* / Q000648:ultrastructure*; D036103:Nanotechnology / Q000295:instrumentation*; D010316:Particle Size; D013499:Surface Properties; D014173:Transistors, Electronic
chemical_list: D046911:Macromolecular Substances