Directional x-ray dark-field imaging.
We introduce a novel x-ray imaging approach that yields information about the local texture of structures smaller than the image pixel resolution inside an object. The approach is based on a recently developed x-ray dark-field imaging technique, using scattering from sub-micron structures in the sample. We show that the method can be used to determine the local angle and degree of orientation of bone, and fibers in a leaf. As the method is based on the use of a conventional x-ray tube we believe that it can have a great impact on medical diagnostics and non-destructive testing applications.
Jensen
Torben H
TH
Niels Bohr Institute, University of Copenhagen, DK-2100 Copenhagen, Denmark. torbenj@fys.ku.dk
Bech
Martin
M
Bunk
Oliver
O
Donath
Tilman
T
David
Christian
C
Feidenhans'l
Robert
R
Pfeiffer
Franz
F
D000818:Animals; D001842:Bone and Bones / Q000000981:diagnostic imaging; D031985:Fragaria / Q000033:anatomy & histology; D007221:Industry; D007368:Interferometry; D057054:Molecular Imaging / Q000379:methods*; D018515:Plant Leaves / Q000033:anatomy & histology; D011859:Radiography / Q000379:methods*; D014921:Wings, Animal / Q000033:anatomy & histology; D014965:X-Rays