Interference-enhanced Raman scattering from Ti0(2)/Si0(2) multilayers: measurement and theory.
Raman-band intensities for sputter-deposited TiO(2)/SiO(2) multilayer coatings are found to exhibit a strong dependence on excitation wavelength of the probe laser. A model based on standing waves within the stack correctly predicts the magnitude and wavelength dependence of the observed enhancements.
Craig
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Exarhos
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GJ
Pawlewicz
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Williford
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