title: High sensitivity deflection detection of nanowires.
abstract: A critical limitation of nanoelectromechanical systems (NEMS) is the lack of a high-sensitivity position detection mechanism. We introduce a noninterferometric optical approach to determine the position of nanowires with a high sensitivity and bandwidth. Its physical origins and limitations are determined by Mie scattering analysis. This enables a dramatic miniaturization of detectable cantilevers, with attendant reductions to the fundamental minimum force noise in highly damping environments. We measure the force noise of an 81+/-9 nm radius Ag(2)Ga nanowire cantilever in water at 6+/-3 fN/square root(Hz).
authors.affiliation: Molecular Foundry, LBNL, Berkeley, California 94618, USA.
authors.forename: Babak
authors.initials: B
authors.lastname: Sanii
authors.forename: Paul D
authors.initials: PD
authors.lastname: Ashby