title: Spectroscopic measurement of interlayer screening in multilayer epitaxial graphene.
abstract: The substrate-induced charge-density profile in carbon face epitaxial graphene is determined using nondegenerate ultrafast midinfrared pump-probe spectroscopy. Distinct zero crossings in the differential transmission spectra are used to identify the Fermi levels of layers within the multilayer stack. Probing within the transmission window of the SiC substrate, we find the Fermi levels of the first four heavily doped layers to be, respectively, 360, 215, 140, and 93 meV above the Dirac point. The charge screening length is determined to be one graphene layer, in good agreement with theoretical predictions.
authors.affiliation: Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, Michigan 48109-2099, USA.
authors.forename: Dong
authors.initials: D
authors.lastname: Sun
authors.forename: Charles
authors.initials: C
authors.lastname: Divin
authors.forename: Claire
authors.initials: C
authors.lastname: Berger
authors.forename: Walt A
authors.initials: WA
authors.lastname: de Heer
authors.forename: Phillip N
authors.initials: PN
authors.lastname: First
authors.forename: Theodore B
authors.initials: TB
authors.lastname: Norris