title: TEM characterization of MBE grown CdTe/ZnTe axial nanowires.
abstract: CdTe/ZnTe axial nanowires were successfully fabricated by molecular beam epitaxy with the use of Au nano-catalysts and vapour-liquid-solid growth mechanism. Nanowires had zinc-blende structure with numerous stacking faults in the bottom ZnTe part and near perfect crystalline structure in the top CdTe part. Energy dispersive X-ray spectroscopy (EDXS) and lattice fringe spacing analysis revealed nonabrupt nature of hetero-interface, whose width was estimated to be 50-70 nm for the nanowires having a diameter in the range from 40 to 50 nm.
authors.affiliation: Institute of Physics, PAS, Al. Lotników 32/46, 02-668, Warsaw, Poland. dluzew@ifpan.edu.pl
authors.forename: P
authors.initials: P
authors.lastname: Dłuzewski
authors.forename: E
authors.initials: E
authors.lastname: Janik
authors.forename: S
authors.initials: S
authors.lastname: Kret
authors.forename: W
authors.initials: W
authors.lastname: Zaleszczyk
authors.forename: D
authors.initials: D
authors.lastname: Tang
authors.forename: G
authors.initials: G
authors.lastname: Karczewski
authors.forename: T
authors.initials: T
authors.lastname: Wojtowicz