TEM characterization of MBE grown CdTe/ZnTe axial nanowires.
CdTe/ZnTe axial nanowires were successfully fabricated by molecular beam epitaxy with the use of Au nano-catalysts and vapour-liquid-solid growth mechanism. Nanowires had zinc-blende structure with numerous stacking faults in the bottom ZnTe part and near perfect crystalline structure in the top CdTe part. Energy dispersive X-ray spectroscopy (EDXS) and lattice fringe spacing analysis revealed nonabrupt nature of hetero-interface, whose width was estimated to be 50-70 nm for the nanowires having a diameter in the range from 40 to 50 nm.
Dłuzewski
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P
Institute of Physics, PAS, Al. Lotników 32/46, 02-668, Warsaw, Poland. dluzew@ifpan.edu.pl
Janik
E
E
Kret
S
S
Zaleszczyk
W
W
Tang
D
D
Karczewski
G
G
Wojtowicz
T
T