Interplay between static and dynamic properties of semifluxons in YBa2Cu3O(7-delta) 0-pi Josephson junctions.
We have investigated the static and dynamic properties of long YBa2Cu3O(7-delta) 0-pi Josephson junctions and compared them with those of conventional 0 junctions. Scanning SQUID microscope imaging has revealed the presence of a semifluxon at the phase discontinuity point in 0-pi Josephson junctions. Zero field steps have been detected in the current-voltage characteristics of all junctions. Comparison with simulation allows us to attribute these steps to fluxons traveling in the junction for conventional 0 junctions and to fluxon-semifluxon interactions in the case of 0-pi Josephson junctions.
Cedergren
K
K
Quantum Device Physics Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-412 96 Göteborg, Sweden.
Kirtley
J R
JR
Bauch
T
T
Rotoli
G
G
Troeman
A
A
Hilgenkamp
H
H
Tafuri
F
F
Lombardi
F
F