title: Directional x-ray dark-field imaging.
abstract: We introduce a novel x-ray imaging approach that yields information about the local texture of structures smaller than the image pixel resolution inside an object. The approach is based on a recently developed x-ray dark-field imaging technique, using scattering from sub-micron structures in the sample. We show that the method can be used to determine the local angle and degree of orientation of bone, and fibers in a leaf. As the method is based on the use of a conventional x-ray tube we believe that it can have a great impact on medical diagnostics and non-destructive testing applications.
authors.affiliation: Niels Bohr Institute, University of Copenhagen, DK-2100 Copenhagen, Denmark. torbenj@fys.ku.dk
authors.forename: Torben H
authors.initials: TH
authors.lastname: Jensen
authors.forename: Martin
authors.initials: M
authors.lastname: Bech
authors.forename: Oliver
authors.initials: O
authors.lastname: Bunk
authors.forename: Tilman
authors.initials: T
authors.lastname: Donath
authors.forename: Christian
authors.initials: C
authors.lastname: David
authors.forename: Robert
authors.initials: R
authors.lastname: Feidenhans'l
authors.forename: Franz
authors.initials: F
authors.lastname: Pfeiffer
mesh_terms: D000818:Animals; D001842:Bone and Bones / Q000000981:diagnostic imaging; D031985:Fragaria / Q000033:anatomy & histology; D007221:Industry; D007368:Interferometry; D057054:Molecular Imaging / Q000379:methods*; D018515:Plant Leaves / Q000033:anatomy & histology; D011859:Radiography / Q000379:methods*; D014921:Wings, Animal / Q000033:anatomy & histology; D014965:X-Rays